Patent classifications
G01L1/25
Device having a measuring apparatus for measuring forces and/or loads
A component of a machine. The component has a measuring fixture for measuring forces and at least one metallic, magnetic portion. The measuring fixture includes at least one field-generating member for producing an electromagnetic alternating field and at least one detection member for detecting changes of the magnetic field produced. The field-generating member and the detection members are arranged on the metallic, magnetic portion and are designed to interact with the metallic, magnetic portion in such manner that by way of the measuring fixture, as a function of measurement signals from the detection member, forces acting on and/or deformations of the component can be detected.
Tactile sensor
A visuo-haptic sensor is presented which uses a deformable, passive material that is mounted in view of a camera. When objects interact with the sensor the deformable material is compressed, causing a change in the shape thereof. The change of shape is detected and evaluated by an image processor that is operatively connected to the camera. The camera may also observe the vicinity of the manipulator to measure ego-motion and motion of close-by objects. The visuo-haptic sensor may be attached to a mobile platform, a robotic manipulator or to any other machine which needs to acquire haptic information about the environment.
Tactile sensor
A visuo-haptic sensor is presented which uses a deformable, passive material that is mounted in view of a camera. When objects interact with the sensor the deformable material is compressed, causing a change in the shape thereof. The change of shape is detected and evaluated by an image processor that is operatively connected to the camera. The camera may also observe the vicinity of the manipulator to measure ego-motion and motion of close-by objects. The visuo-haptic sensor may be attached to a mobile platform, a robotic manipulator or to any other machine which needs to acquire haptic information about the environment.
Interface ultrasonic reflectivity-pressure relation curve establishment method and loading testbed
The present invention discloses an interface ultrasonic reflectivity-pressure relation curve establishment method and a loading testbed. The loading testbed comprises a force displayer, a control terminal, an oscilloscope, an immersion ultrasonic transducer, a large cylinder, a small cylinder, an upper panel, a movable plate, a force sensor, a lower panel, an ultrasonic transceiver and a small cylinder connecting plate. Compared with the existing schemes, the interface ultrasonic reflectivity-pressure relation curve establishment method and the loading testbed provided by the present invention can construct a more accurate ultrasonic reflectivity-pressure relation curve, and are high in detection precision.
ULTRASONIC TEST DEVICE AND TEST METHOD FOR SERVICE STRESS OF A MOVING MECHANICAL COMPONENT
An ultrasonic test device and test method for service stress of a moving mechanical component, where the device comprises an ultrasonic probe, a coupling fluid, a pressure-maintaining cover and universal wheels. The cover is vertically arranged above an inspected position of an inspected component, an interior of the pressure-maintaining cover is filled with coupling fluid, a bottom of the cover is provided with a structure permeable to the coupling fluid to form a coupling fluid film between the inspected position and the bottom of the cover, and a top of the cover is equipped with the ultrasonic probe. A detection part at a lower part of the ultrasonic probe extends into the coupling fluid of the cover and is vertical to the bottom of the cover without contact. The distance between the ultrasonic probe and the inspected component is kept unchanged through the universal wheels.
Method for determining plane stresses on in-service steel structure member based on phase spectrum of ultrasonic transverse wave
A method for determining plane stresses on an in-service steel structure member based on phase spectrum of ultrasonic transverse wave, including: calibrating stress-spectrum parameters k and c of a replica of the in-service steel structure member; determining a first response frequency of a phase difference and a maximum value of a derivative function of the phase difference of an ultrasonic transverse wave echo of the in-service steel structure member, and obtaining a polarization angle of ultrasonic transverse wave components generated by a birefringence effect; solving a plane normal stress difference and a plane shear stress inside the in-service steel structure member; and separating normal stresses by a shear difference method to obtain three independent plane stress components.
METHOD OF ANALYZING STRAIN OF THIN FILM BY USING STC METHOD
The present invention relates to a method of analyzing strain of a thin film by using a Strain Tensor Using Computational Fourier Transform Moiré (STC) method, and the method includes: receiving two Bragg peaks selected from a reciprocal lattice image obtained by Fourier transforming a two-dimensional (2D) lattice image of a thin film; shifting the two received Bragg peaks to an origin point of the reciprocal lattice image; calculating a moiré fringe pattern by Fourier-inverse-transforming the two Bragg peaks shifted to the origin point; calculating a strain tensor by differentiating the calculated moiré fringe pattern; and analyzing strain of the thin film by using the calculated strain tensor. The present invention, it is possible to obtain a considerably accurate strain analysis result with minimal errors even in the case where strain of a thin film is complex, and measure shear strain, as well as axial strain, of a thin film.
METHOD OF ANALYZING STRAIN OF THIN FILM BY USING STC METHOD
The present invention relates to a method of analyzing strain of a thin film by using a Strain Tensor Using Computational Fourier Transform Moiré (STC) method, and the method includes: receiving two Bragg peaks selected from a reciprocal lattice image obtained by Fourier transforming a two-dimensional (2D) lattice image of a thin film; shifting the two received Bragg peaks to an origin point of the reciprocal lattice image; calculating a moiré fringe pattern by Fourier-inverse-transforming the two Bragg peaks shifted to the origin point; calculating a strain tensor by differentiating the calculated moiré fringe pattern; and analyzing strain of the thin film by using the calculated strain tensor. The present invention, it is possible to obtain a considerably accurate strain analysis result with minimal errors even in the case where strain of a thin film is complex, and measure shear strain, as well as axial strain, of a thin film.
Waveguide for guiding an electro-magnetic wave comprising plural waveguide parts with different widths extend in parallel planes
A waveguide for guiding an electro-magnetic wave comprises: a first waveguide part; and a second waveguide part; wherein the first waveguide part has a first width in a first direction (Y) perpendicular to the direction of propagation of the electro-magnetic wave and the second waveguide part has a second width in the first direction (Y), wherein the second width is larger than the first width; and wherein the first and the second waveguide parts are spaced apart by a gap in a second direction (Z) perpendicular to the first and second planes in which the waveguide parts are formed, wherein the gap has a size which is sufficiently small such that the first and second waveguide parts unitely form a single waveguide for guiding the electro-magnetic wave. The waveguide may be used in numerous applications, such as in a photonic integrated circuit, in a sensor or in an actuator.
LIGHT EMITTING APPARATUS
A light emitting apparatus has a visible light emitter, an invisible light emitter, invisible light receiver for receiving invisible light emitted from the invisible light emitter, cover member covering these components, and controller for controlling operation of the visible light emitter. The cover member has flexibility so as to deform when receiving external force, and at least partially reflects invisible light and passes and diffuses visible light. The invisible light emitter emits invisible light toward an inside surface of the cover member, and the invisible light receiver receives invisible light and reflected by the cover member. The controller controls an emission mode of visible light emitted from the visible light emitter in accordance with a reception state of invisible light at the invisible light receiver, which changes in accordance with deformation of the cover member.