A system includes a magnetostrictive sensor. The magnetostrictive sensor includes a driving coil configured to receive a first driving current and to emit a first magnetic flux portion through a target and a second magnetic flux portion. The magnetostrictive sensor also includes a first sensing coil configured to receive the first magnetic flux portion and to transmit a signal based at least in part on the received first magnetic flux portion. The received first magnetic flux portion is based at least in part on a force on the target. The magnetostrictive sensor includes a magnetic shield disposed between the driving coil and the first sensing coil. The magnetic shield is configured to reduce the second magnetic flux portion received by the first sensing coil. The magnetic shield includes a composite with a conductive material and an insulating material, a metamaterial, or a mesh structure, or any combination thereof.

According to one embodiment, a strain sensing element is provided on a film unit configured to be deformed. The strain sensing element includes a functional layer, a first magnetic layer, a second magnetic layer, and a spacer layer. The functional layer includes at least one of an oxide and a nitride. The second magnetic layer is provided between the functional layer and the first magnetic layer. A magnetization of the second magnetic layer is variable in accordance with a deformation of the film unit. The spacer layer is provided between the first magnetic layer and the second magnetic layer. At least a part of the second magnetic layer is amorphous and includes boron.

According to one embodiment, a strain sensing element is provided on a film unit configured to be deformed. The strain sensing element includes a functional layer, a first magnetic layer, a second magnetic layer, and a spacer layer. The functional layer includes at least one of an oxide and a nitride. The second magnetic layer is provided between the functional layer and the first magnetic layer. A magnetization of the second magnetic layer is variable in accordance with a deformation of the film unit. The spacer layer is provided between the first magnetic layer and the second magnetic layer. At least a part of the second magnetic layer is amorphous and includes boron.

According to one embodiment, a strain sensing element provided on a deformable substrate includes: a first magnetic layer; a second magnetic layer; a spacer layer; and a bias layer. Magnetization of the second magnetic layer changes according to deformation of the substrate. The spacer layer is provided between the first magnetic layer and the second magnetic layer. The second magnetic layer is provided between the spacer layer and the bias layer. The bias layer is configured to apply a bias to the second magnetic layer.

According to one embodiment, a strain sensing element provided on a deformable substrate includes: a first magnetic layer; a second magnetic layer; a spacer layer; and a bias layer. Magnetization of the second magnetic layer changes according to deformation of the substrate. The spacer layer is provided between the first magnetic layer and the second magnetic layer. The second magnetic layer is provided between the spacer layer and the bias layer. The bias layer is configured to apply a bias to the second magnetic layer.

According to one embodiment, a sensor includes a first sensor unit, a first stacked body, and a film unit. The first sensor unit includes a first magnetic layer, a second magnetic layer, and a first intermediate layer, the first intermediate layer being provided between the first magnetic layer and the second magnetic layer. The first stacked body includes a third magnetic layer, a fourth magnetic layer, and a second intermediate layer, the second intermediate layer being provided between the third magnetic layer and the fourth magnetic layer. The film unit is deformable. A portion of the film unit is disposed between the first sensor unit and the first stacked body.

The disclosure relates to a strain sensing element provided on a deformable substrate. The strain sensing element includes: a first magnetic layer; a second magnetic layer; and an intermediate layer. The second magnetic layer includes Fe.sub.1-yB.sub.y (0<y0.3). Magnetization of the second magnetic layer changes according to deformation of the substrate. The intermediate layer is provided between the first magnetic layer and the second magnetic layer.

The disclosure relates to a strain sensing element provided on a deformable substrate. The strain sensing element includes: a first magnetic layer; a second magnetic layer; and an intermediate layer. The second magnetic layer includes Fe.sub.1-yB.sub.y (0<y0.3). Magnetization of the second magnetic layer changes according to deformation of the substrate. The intermediate layer is provided between the first magnetic layer and the second magnetic layer.

A sensor arrangement for determining a process variable of a medium in a containment comprises a sensor apparatus, a magnetic field apparatus, and a detection apparatus. The magnetic field apparat produces a magnetic field that penetrates the sensor apparatus, the detection apparatus and partially the medium. The sensor apparatus is embodied such that a magnetic property of a component of the sensor apparatus depends on the process variable, and the magnetic field of the magnetic field apparatus is influenceable by the sensor apparatus as a function of process variable. The detection apparatus is embodied to register a variable related with the magnetic field, especially the magnetic flux density, the magnetic susceptibility or the magnetic permeability, and, based on that variable, to determine the process variable. The sensor apparatus is arranged within an internal volume of the containment and the detection apparatus is arranged outside of the containment.

A sensor arrangement for determining a process variable of a medium in a containment comprises a sensor apparatus, a magnetic field apparatus, and a detection apparatus. The magnetic field apparat produces a magnetic field that penetrates the sensor apparatus, the detection apparatus and partially the medium. The sensor apparatus is embodied such that a magnetic property of a component of the sensor apparatus depends on the process variable, and the magnetic field of the magnetic field apparatus is influenceable by the sensor apparatus as a function of process variable. The detection apparatus is embodied to register a variable related with the magnetic field, especially the magnetic flux density, the magnetic susceptibility or the magnetic permeability, and, based on that variable, to determine the process variable. The sensor apparatus is arranged within an internal volume of the containment and the detection apparatus is arranged outside of the containment.