A device may use a camera to capture an image of an end face of an optical fiber in a field of view of the camera. The device may monitor a focus metric associated with the image while the image is manually focused using an opto-mechanical assembly. The device may automatically initiate a test to inspect the image of the end face of the optical fiber for compliance with a set of criteria related to cleanliness and damage based on the focus metric satisfying a condition. The device may output a result from the test indicating whether the end face of the optical fiber satisfies the set of criteria related to cleanliness and damage.

A deformometer includes: a cavity body; entry and exit optical cavity optics, such that the optical cavity produces filtered combined light from combined light; a first laser that provides first light; a second laser that provides second light; an optical combiner that: receives the first light; receives the second light; combines the first light and the second light; produces combined light from the first light and the second light; and communicates the combined light to the entry optical cavity optic; a beam splitter that: receives the filtered combined light; splits the filtered combined light; a first light detector in optical communication with the beam splitter and that: receives the first filtered light from the beam splitter; and produces a first cavity signal from the first filtered light; and a second light detector that: receives the second filtered light; and produces a second cavity signal from the second filtered light.

An optical transceiver has a first optical waveguide connected to an input/output port for signal light, a second optical waveguide configured to input and output test light, an optical circuit configured to perform optical-to-electrical conversion or electrical-to-optical conversion, and an optical switch provided between the optical circuit and the first and the second optical waveguides and configured to switch between a first path connecting the optical circuit to the first optical waveguide and a second path connecting the optical circuit to the second optical waveguide, wherein the optical switch is configured to select the second path in an ON state with an electrical voltage being applied to the optical switch, and select the first path in an OFF state without the electrical voltage being applied to the optical switch.

Methods and apparatuses for quantitatively measuring strain in an optical fiber. An optical source comprising an optical beam generator and a pulse generator receives instructions from a controller and generates a pulsed optical beam in response to those instructions. The pulsed optical beam is directed into an optical fiber to generate a reflected beam from scattering centers within the optical fiber. A detector records a plurality of frames of data generated by the reflected beam, and the controller tracks an evolution of a speckle pattern carried by the reflected beam from the plurality of frames and calculates a strain induced in a section of the optical fiber from the evolution of the speckle pattern.

A test system includes a semiconductor die and an integrated optical/electrical probe card. Electrical, optical, and optoelectronic devices reside in the semiconductor die. Electrical pads in the semiconductor die connect to the electrical and optoelectronic devices. Grating couplers in the semiconductor die connect to the optical device and optoelectronic devices. The electrical pads and grating couplers are interspersed in substantially a single line in the semiconductor die. The integrated optical/electrical probe card interfaces with the electrical pads by electrical needles, and concurrently interfaces with the grating couplers by optical fibers.

This method includes a reference optical fiber transmission loss measurement step for measuring a reference optical fiber transmission loss measurement value, a difference value calculation step for subtracting the transmission loss reference value from the reference optical fiber transmission loss measurement value and calculating a transmission loss difference value, and a measured-optical-fiber measurement step for measuring the transmission loss of an optical fiber to be measured, the reference optical fiber transmission loss measurement step being repeatedly performed, a transmission loss difference value being calculated by performing the difference value calculation step each time a reference optical fiber transmission loss measurement value is obtained, a correction value being calculated on the basis of a plurality of transmission loss difference values, the measurement value obtained in the measured-optical-fiber measurement step being corrected using the correction value, and the transmission loss value of the optical fiber to be measured being determined.

The present invention discloses a method for fast judging and optimizing light emitting quality of a light guide plate based on an image processing technology. According to the method, an illuminance diagram of the light guide plate is regarded as a single-color image, illuminance information is converted into a gray level, gray levels of all pixel points are calculated through a gray level histogram, the light outgoing quality of the light guide plate is analyzed according to a discrete degree of the gray levels, positions of the gray levels discrete in distribution in the gray level histogram on the illuminance diagram are found out through programming, a net point filling rate in a corresponding area is directly optimized and is eliminated, and a uniformity degree evaluation formula with a precision P judgment criterion is given. The present invention effectively improves the optimizing efficiency of the light guide plate, and an optimized result is closer to an actual visual effect.

There is provided an optical-fiber connector endface inspection microscope system comprising optical power measurement capability, wherein optical power measurement is provided via an optical power meter device implemented within an extension unit positioned along an optical path between the inspected optical-fiber connector endface and the optical-fiber connector endface inspection microscope, i.e. between the inspected optical-fiber connector endface and objective optics of the optical-fiber connector endface inspection microscope.

A system for measuring linear and non-linear transmission perturbations in optical transmission systems is disclosed. The system may include a processor to help facilitate measurement of non-linear noise at an optical transceiver. The system, for example, may receive a reference correlation of a transmission of a channel of a fiber link, record an optical power spectrum of the channel, and determine a baud rate of the channel. The system may also apply a spectral correlation technique to the channel with a multiple baud rate distance in frequency domain. The system may also calculate a generalized optical signal-to-noise ratio (gOSNR) value based on the spectral correlation technique and the reference correlation. The system may also compare the gOSNR with wavelength division multiplexed (WDM) OSNR measurements to evaluate an amount of non-linear noise contributions.

The invention relates to a contacting module (1) by means of which the individual electrical and optical inputs and outputs (A.sub.oC) of optoelectronic chips (2) are connected to the device-specific electrical and optical inputs and outputs of a test apparatus. It is characterized by a comparatively high adjustment insensitivity of the optical contacts between the chips (2) and the contacting module (1), which is achieved, for example, by technical measures which result in the optical inputs (E.sub.oK) of the chip (2) or on the contacting module (1) being irradiated in every possible adjustment position by the optical signal (S.sub.o) to be coupled in.