A structure for, and method of, forming a first optoelectronic circuitry that generates an optical signal, a second optoelectronic circuitry that receives an optical signal, and a loopback waveguide that connects the output from the first optoelectronic circuitry to the second optoelectronic circuitry on an interposer substrate are described. The connected circuits, together comprising a photonic integrated circuit, are electrically tested using electrical signals that are provided via probing contact pads on the PIC die. Electrical activation of the optoelectrical sending devices and the subsequent detection and measurement of the optical signals in the receiving devices, in embodiments, provides information on the operability or functionality of the PIC on the die at the wafer level, prior to die separation or singulation, using the electrical and optical components of the PIC circuit.

A structure for, and method of, forming a first optoelectronic circuitry that generates an optical signal, a second optoelectronic circuitry that receives an optical signal, and a loopback waveguide that connects the output from the first optoelectronic circuitry to the second optoelectronic circuitry on an interposer substrate are described. The connected circuits, together comprising a photonic integrated circuit, are electrically tested using electrical signals that are provided via probing contact pads on the PIC die. Electrical activation of the optoelectrical sending devices and the subsequent detection and measurement of the optical signals in the receiving devices, in embodiments, provides information on the operability or functionality of the PIC on the die at the wafer level, prior to die separation or singulation, using the electrical and optical components of the PIC circuit.

Methods, systems, and apparatus for a stray-light testing apparatus. In one aspect, the apparatus includes an optical assembly including a spatially extended light source and one or more optical elements arranged to direct light from the spatially extended light source along an optical path, a moveable frame supporting the optical assembly including one or more adjustable alignment features for guiding positioning of the stray-light testing apparatus relative to an onboard camera on a vehicle, and a shrouding mechanism attached to the frame and positioned on the frame such that, when the stray-light testing apparatus is aligned relative to the onboard camera on the vehicle and the optical path of the optical assembly is within the field of view of the onboard camera, ambient light exposure for the onboard camera is below a threshold.

A method for determining the refractive index profile of a preform when the RIP is not substantially step-index like. (a) The preform deflection function is measured and transformed into a measured RIP. (b) A RI level and radius are assumed for the preform layer being evaluated and a compensation level RIP is calculated. (c) A theoretical deflection function is generated corresponding to the assumed RI level and radius and the generated data are transformed into a fitting RIP. (d) The fitting RIP is compared to the measured RIP and the comparison is evaluated against a predetermined accuracy level for the preform layer being evaluated. (e) Steps (b) and (c) are repeated iteratively until the predetermined accuracy level has been achieved. Steps (b) through (e) are repeated for each preform layer that needs to be compensated. Finally, a measurement artifact compensated refractive index profile is calculated for the preform.

An integrated circuit comprises: at least one photonic layer that includes one or more optical waveguides; a first optical coupler that couples at least a first optical mode outside of the photonic layer to a first waveguide in the photonic layer; a photonic device that includes one or more ports in the photonic layer; a first multi-port optical coupler that includes three or more ports in the photonic layer, including a first port optically coupled to the first optical coupler, a second port optically coupled to a first port of the photonic device, and a third port optically coupled to a first optical reflector configured to send substantially all optical power emitted from the third port of the first multi-port optical coupler back to the third port of the first multi-port optical coupler.

A method for manufacturing an optical modulator is disclosed. The method includes a step of preparing a Mach-Zehnder modulator, a step of acquiring, based on a light transmittance in an arm waveguide, a relationship between a voltage applied to an electrode and a phase change amount of light propagating through the arm waveguide, a step of acquiring, based on the relationship, a voltage in which the phase change amount of the light propagating through the arm waveguide has a predetermined when the light is modulated, and a step of storing the voltage in a storage unit.

A module housing case is described. The modular housing case includes a fiber optic component housing defined as a cavity that is sized to receive a fiber optic connector. Within the cavity is a ferrule guide. The module housing case also has an internal cavity that is at least partially enclosed. Components to assist in magnification may be disposed at least partially within the internal cavity. Finally, the module housing case employs a camera lens alignment feature.

A system and method for scanning of coherent LIDAR. The system includes a motor, a laser source configured to generate an optical beam, and a deflector. A first facet of the plurality of facets has a facet normal direction. The deflector is coupled to the motor and is configured to rotate about a rotation axis to deflect the optical beam from the laser source. The laser source is configured to direct the optical beam such that the optical beam is incident on the deflector at a first incident angle in a first plane, wherein the first plane includes the rotation axis, wherein the first incident angle is spaced apart from the facet normal direction for the first facet. A second facet of the plurality of facets includes an optical element configured to deflect the optical beam at the first incident angle into a deflected angle.

It is an object of the present invention to provide an aerial optical fiber cable inspection method, an aerial optical fiber cable inspection device, and a program which can identify a cable sagging section from vibration sensing results. In the aerial optical fiber cable inspection method according to the present invention, a vibration distribution waveform along the longitudinal direction of an aerial optical fiber cable measured using an optical fiber vibration sensing device is received as an input, a standard deviation of the amplitude of vibration at each position in the vibration distribution waveform is calculated, and a section with a standard deviation larger than that of other sections is identified as a cable sagging section.

A system for measuring linear and non-linear transmission perturbations in optical transmission systems is disclosed. The system may include a processor to help facilitate measurement of non-linear noise at an optical transceiver. The system, for example, may receive a reference correlation of a transmission of a channel of a fiber link, record an optical power spectrum of the channel, and determine a baud rate of the channel. The system may also apply a spectral correlation technique to the channel with a multiple baud rate distance in frequency domain. The system may also calculate a generalized optical signal-to-noise ratio (gOSNR) value based on the spectral correlation technique and the reference correlation. The system may also compare the gOSNR with wavelength division multiplexed (WDM) OSNR measurements to evaluate an amount of non-linear noise contributions.