Methods of producing luminescence by application of a time-varying electrical signal to an electroluminescent device are disclosed whereby the entire system remains at open circuit. At least one article, substance or material, the “object”, is employed to alter the electrical signal to the area of the electroluminescent device to a level sufficient to change light emission. Methods are disclosed to relate the light intensity thus produced to a property of the object thereby allowing a measurement of the property. The method may optionally use one or more additional circuit components.

Methods of producing luminescence by application of a time-varying electrical signal to an electroluminescent device are disclosed whereby the entire system remains at open circuit. At least one article, substance or material, the “object”, is employed to alter the electrical signal to the area of the electroluminescent device to a level sufficient to change light emission. Methods are disclosed to relate the light intensity thus produced to a property of the object thereby allowing a measurement of the property. The method may optionally use one or more additional circuit components.

A notch treatment method for flaw simulation including providing the specimen with the notch, the notch having a re-melt material layer; isolating the notch; and selectively etching the notch to provide an etched surface of the notch; wherein at least a portion of the re-melt material layer has been removed from the notch. In one aspect, there is provided a notch treatment method for flaw simulation including providing the specimen with the notch, the notch having a re-melt material layer, the specimen includes steel or an alloy thereof; isolating the notch; and selectively etching the notch with a first etching solution and a second etching solution to provide an etched surface on the notch; wherein at least a portion of the re-melt material layer has been removed from the notch.

A notch treatment method for flaw simulation including providing the specimen with the notch, the notch having a re-melt material layer; isolating the notch; and selectively etching the notch to provide an etched surface of the notch; wherein at least a portion of the re-melt material layer has been removed from the notch. In one aspect, there is provided a notch treatment method for flaw simulation including providing the specimen with the notch, the notch having a re-melt material layer, the specimen includes steel or an alloy thereof; isolating the notch; and selectively etching the notch with a first etching solution and a second etching solution to provide an etched surface on the notch; wherein at least a portion of the re-melt material layer has been removed from the notch.

The invention relates to a device for testing a ceramic socket insert for hip joint implants having a receiving device, a pressure piece and optionally having a plunger, wherein the receiving device has a recess with a positioning region for receiving the socket insert and the recess has a receiving cone in the positioning region. According to the invention, in order for the device to be universally applicable to all socket inserts (monolithic, modular, pre-joined) and therefore replace all current devices, an annular ductile adapter piece having a conical outer surface contacting the receiving cone and an inner surface contacting the socket insert is arranged in the positioning region between the receiving device and the socket insert, wherein the friction between the receiving device and adapter piece is lower than between the adapter piece and socket insert.

The invention relates to a device for testing a ceramic socket insert for hip joint implants having a receiving device, a pressure piece and optionally having a plunger, wherein the receiving device has a recess with a positioning region for receiving the socket insert and the recess has a receiving cone in the positioning region. According to the invention, in order for the device to be universally applicable to all socket inserts (monolithic, modular, pre-joined) and therefore replace all current devices, an annular ductile adapter piece having a conical outer surface contacting the receiving cone and an inner surface contacting the socket insert is arranged in the positioning region between the receiving device and the socket insert, wherein the friction between the receiving device and adapter piece is lower than between the adapter piece and socket insert.

Provided are universal grip systems and method of using universal grip systems to test coupons. According to various examples, a universal grip system includes two grips and two guide posts for supporting the two grips and allowing the two grips to move with respect to each other. Each grip may include one or two wedges. The wedges are used to engage the coupons during testing and provide anti-buckling support and/or anti-rotation support. The wedges are slidably coupled within corresponding grips, which allows the universal grip system to engage and disengage the coupons by moving one grip with respect to another. The grips may be constructed from thermally neutral materials, such as invar 36. The grips may thermally isolated from the guide posts by, for example, a set of spacers disposed between the grips and linear bearing slidably coupled to the guide posts.

Provided are universal grip systems and method of using universal grip systems to test coupons. According to various examples, a universal grip system includes two grips and two guide posts for supporting the two grips and allowing the two grips to move with respect to each other. Each grip may include one or two wedges. The wedges are used to engage the coupons during testing and provide anti-buckling support and/or anti-rotation support. The wedges are slidably coupled within corresponding grips, which allows the universal grip system to engage and disengage the coupons by moving one grip with respect to another. The grips may be constructed from thermally neutral materials, such as invar 36. The grips may thermally isolated from the guide posts by, for example, a set of spacers disposed between the grips and linear bearing slidably coupled to the guide posts.

Disclosed are display module evaluation jigs and methods, The display module evaluation jig includes: a first body defining a plurality of first recessions on a top surface of the first body; a second body disposed on and combined with the first body; and a plurality of insertions on the first recessions and between the first body and the second body. Inner lateral surfaces of the first body are directed toward and spaced apart from lateral surfaces of the insertions. The inner lateral surfaces define the first recessions.

Disclosed are display module evaluation jigs and methods, The display module evaluation jig includes: a first body defining a plurality of first recessions on a top surface of the first body; a second body disposed on and combined with the first body; and a plurality of insertions on the first recessions and between the first body and the second body. Inner lateral surfaces of the first body are directed toward and spaced apart from lateral surfaces of the insertions. The inner lateral surfaces define the first recessions.