The invention relates to a device for carrying out bending tests on panel-shaped or beam-shaped samples (1), in which two rotary drives are arranged at a distance from one another and a flange (3) is fastened to each of the drive shafts of the rotary drives, said drive shafts being oriented parallel to one another. At least two bar-shaped bending elements (2) oriented parallel to the axis of rotation of the drive shafts and arranged at a distance from the axis of rotation and at a distance from one another are provided on each of the flanges (3). A panel-shaped or beam-shaped sample (1) can be introduced between the two bar-shaped bending elements (2) on the two flanges (3). In the event of rotation of the rotary drives in opposite directions of rotation, bending forces are exerted on the sample (1) and each of the two rotary drives can be controlled individually and connected to an electronic open-loop or closed-loop control unit.

The present disclosure relates to a system for verification of the speed of crosshead travel in a materials testing device. A linear displacement device is mounted on the crosshead of the materials testing device. The linear displacement device measures the displacement of the crosshead during the test. A timer interval counter measures the time of travel of the crosshead during the test. This measurements allow for accurate calculation of the speed of the crosshead travel.

The present disclosure relates to a system for verification of the speed of crosshead travel in a materials testing device. A linear displacement device is mounted on the crosshead of the materials testing device. The linear displacement device measures the displacement of the crosshead during the test. A timer interval counter measures the time of travel of the crosshead during the test. This measurements allow for accurate calculation of the speed of the crosshead travel.

A method and apparatus for improving the accuracy and precision of drop impact sensing data utilized for testing the impact-absorbing capacities of surfaces, especially playground surfaces used by children, for compliance with relevant standards. A head form missile is equipped with onboard sets of high-g and low-g accelerometers for timing a period of free-fall of the missile, as well as for measuring acceleration due to impact at the end of the fall. Optimized results are obtained in a preferred embodiment by exploiting at least four accelerometers. Three of the accelerometers are sized for high-g measurements in each axis (X-, Y-, and Z-axes). At least one low-g accelerometer for (measuring in the Z-axis), or three accelerometers sized for low-g measurements in all axis (X-, Y- and Z-axes) are employed. Accelerometer readings obtained during the zero g free-fall period is used to cancel bias drift on all accelerometers.

A method and apparatus for improving the accuracy and precision of drop impact sensing data utilized for testing the impact-absorbing capacities of surfaces, especially playground surfaces used by children, for compliance with relevant standards. A head form missile is equipped with onboard sets of high-g and low-g accelerometers for timing a period of free-fall of the missile, as well as for measuring acceleration due to impact at the end of the fall. Optimized results are obtained in a preferred embodiment by exploiting at least four accelerometers. Three of the accelerometers are sized for high-g measurements in each axis (X-, Y-, and Z-axes). At least one low-g accelerometer for (measuring in the Z-axis), or three accelerometers sized for low-g measurements in all axis (X-, Y- and Z-axes) are employed. Accelerometer readings obtained during the zero g free-fall period is used to cancel bias drift on all accelerometers.

A notch treatment method for flaw simulation including providing the specimen with the notch, the notch having a re-melt material layer; isolating the notch; and selectively etching the notch to provide an etched surface of the notch; wherein at least a portion of the re-melt material layer has been removed from the notch. In one aspect, there is provided a notch treatment method for flaw simulation including providing the specimen with the notch, the notch having a re-melt material layer, the specimen includes steel or an alloy thereof; isolating the notch; and selectively etching the notch with a first etching solution and a second etching solution to provide an etched surface on the notch; wherein at least a portion of the re-melt material layer has been removed from the notch.

A notch treatment method for flaw simulation including providing the specimen with the notch, the notch having a re-melt material layer; isolating the notch; and selectively etching the notch to provide an etched surface of the notch; wherein at least a portion of the re-melt material layer has been removed from the notch. In one aspect, there is provided a notch treatment method for flaw simulation including providing the specimen with the notch, the notch having a re-melt material layer, the specimen includes steel or an alloy thereof; isolating the notch; and selectively etching the notch with a first etching solution and a second etching solution to provide an etched surface on the notch; wherein at least a portion of the re-melt material layer has been removed from the notch.

Once a sensor amplifier side connector of a cable unit for interconnecting a detector and a sensor amplifier is connected to the sensor amplifier, a gain resistor on the cable unit side and an instrumentation amplifier of the sensor amplifier are interconnected and the gain of the instrumentation amplifier is determined. As a result, the gain of the instrumentation amplifier is determined such that the magnitude of a signal that the sensor amplifier receives from the detector becomes a magnitude optimal for an analog circuit in the sensor amplifier.

Once a sensor amplifier side connector of a cable unit for interconnecting a detector and a sensor amplifier is connected to the sensor amplifier, a gain resistor on the cable unit side and an instrumentation amplifier of the sensor amplifier are interconnected and the gain of the instrumentation amplifier is determined. As a result, the gain of the instrumentation amplifier is determined such that the magnitude of a signal that the sensor amplifier receives from the detector becomes a magnitude optimal for an analog circuit in the sensor amplifier.

The present disclosure relates to a device which automatically clears high elongation test samples with long tails after breakage from a materials testing device after the testing has been performed. A robotic arm engages the tested specimen and brings it to a specimen clearing device which includes a slot leading to a nip between an opposed drive wheel and driven wheel. A motor drives the drive wheel to move the tested specimen through the specimen clearing device into a scrap bin or similar repository.