A particle size distribution measuring apparatus includes a light source that emits measurement light to a sample accommodated in a cell including a pair of light transmission plates separated from each other, one or a plurality of detectors that detects the measurement light scattered in the sample, and a particle size distribution calculator that calculates a particle size distribution of a particle group included in the sample based on output signals of the detectors. The particle size distribution measuring apparatus further includes a force applying mechanism that moves at least one of the light transmission plates to apply pressure or a shearing force to the sample in the cell, in which the particle size distribution calculator is configured to calculate the particle size distribution at the time when the pressure or the shearing force applied to the sample has changed from a first state to a second state.

A particle size distribution measuring apparatus includes a light source that emits measurement light to a sample accommodated in a cell including a pair of light transmission plates separated from each other, one or a plurality of detectors that detects the measurement light scattered in the sample, and a particle size distribution calculator that calculates a particle size distribution of a particle group included in the sample based on output signals of the detectors. The particle size distribution measuring apparatus further includes a force applying mechanism that moves at least one of the light transmission plates to apply pressure or a shearing force to the sample in the cell, in which the particle size distribution calculator is configured to calculate the particle size distribution at the time when the pressure or the shearing force applied to the sample has changed from a first state to a second state.

A positioning support (1) for positioning components to be inspected during their inspection by means of an optical control apparatus, comprising a chasing base (3) acting as interface to the optical control apparatus, a sliding base (5) able to slide along an axis “Y” in a plane of the chasing base perpendicular to the optical axis; a plate (7) able to slide along an axis “X” perpendicular to the axis “Y” in a plane parallel to said sliding base; jigs or bars (15) for positioning a plurality of components to be measured on said plate.

A positioning support (1) for positioning components to be inspected during their inspection by means of an optical control apparatus, comprising a chasing base (3) acting as interface to the optical control apparatus, a sliding base (5) able to slide along an axis “Y” in a plane of the chasing base perpendicular to the optical axis; a plate (7) able to slide along an axis “X” perpendicular to the axis “Y” in a plane parallel to said sliding base; jigs or bars (15) for positioning a plurality of components to be measured on said plate.

A label-free optical device for near real time quantification of the multifractal micro-optical properties of a sample includes a source of broadband light; a tunable filter that receives at least a portion of the broadband light and then transmits narrowband light, whereby a specific band of light is selected to avoid unwanted absorption of light by the sample; where the narrowband light is configured to illuminate a selected area of the sample, and in response elastically-scattered light is dispersed from the sample; a light collection device configured to collect at least some of the elastically-scattered light; where at least some of the collected elastically-scattered light is configured to be transmitted to a detector by the light collection device, and the detector is configured to record a light scattering signal; and where the detector is configured to perform light scattering signal measurements at multiple angles or wavelengths to determine a refractive index multifractality of the sample.

Photodetector clamps are provided. Clamps of interest include one or more flexure arms for applying an immobilizing force to one or more photodetectors positioned within a light detection module, and are configured to be positioned on top of a detector block. In embodiments, the bottom of the one or more flexure arms include an opening for contacting the photodetector(s). Light detection modules, systems and methods employing the subject clamps are also provided.

Photodetector clamps are provided. Clamps of interest include one or more flexure arms for applying an immobilizing force to one or more photodetectors positioned within a light detection module, and are configured to be positioned on top of a detector block. In embodiments, the bottom of the one or more flexure arms include an opening for contacting the photodetector(s). Light detection modules, systems and methods employing the subject clamps are also provided.

Aspects relate to mechanisms for mass screening of samples. A portable laboratory device based on spectroscopic analysis of samples containing analytes under test can facilitate the mass screening. The portable laboratory device can include a sample head including a structure configured to facilitate application of the sample to the sample head and an optical measurement device including one or more light sources and a spectrometer. Light from the light source(s) incident on the sample may be directed to the spectrometer to obtain a spectrum of the sample. The optical measurement device can further include a data transfer device configured to provide the spectrum obtained by the spectrometer to a spectrum analyzer to produce a result from the spectrum.

The present invention relates to provide, among other things, the methods, devices, and systems that can simply and quickly collecting and analyzing a tiny amount of vapor condensates (e.g. exhaled breath condensate (EBC)).

The present invention relates to provide, among other things, the methods, devices, and systems that can simply and quickly collecting and analyzing a tiny amount of vapor condensates (e.g. exhaled breath condensate (EBC)).