A method of analyzing a substrate contacting a fluid present in an industrial system is provided. The method comprises creating a series of digital images of the substrate while contacting the fluid present in the industrial system. A region of interest in the series of digital images of the substrate is defined. A corrosion feature in the region of interest in the series of digital images of the substrate is identified. The corrosion feature in the region of interest in the series of digital images of the substrate is analyzed to determine a corrosion trend of the industrial system. In certain embodiments of the method, the fluid is industrial water, and the industrial system is an industrial water system.

A centrifugal reaction microtube, centrifugal reaction device and its centrifugal examination method are provided to achieve easy, quick operation, safety, energy saving, precision, cost effectiveness, and prevention of contamination by controlling a centrifugal force and using a uni-directional valve in the centrifugal reaction microtube.

Devices and methods for determining the cumulative distribution of a polymer property in a reactor without physical separation of reaction subcomponents. The device includes a means of measuring an instantaneous property of the polymers being produced in a reaction vessel a plurality of times during a polymerization reaction as well as a means of determining the corresponding change in polymer concentration in the reaction vessel between measurements of the instantaneous polymer property. The device also includes a means of computing a statistical distribution appropriate to the polymer characteristic and applying the statistical distribution to a recently measured instantaneous value of the polymer property so as to have an instantaneous distribution of the polymer property and a means of adding together the instantaneous distributions of the polymer property in order to obtain the cumulative distribution of the polymer property in the reactor.

Devices and methods for determining the cumulative distribution of a polymer property in a reactor without physical separation of reaction subcomponents. The device includes a means of measuring an instantaneous property of the polymers being produced in a reaction vessel a plurality of times during a polymerization reaction as well as a means of determining the corresponding change in polymer concentration in the reaction vessel between measurements of the instantaneous polymer property. The device also includes a means of computing a statistical distribution appropriate to the polymer characteristic and applying the statistical distribution to a recently measured instantaneous value of the polymer property so as to have an instantaneous distribution of the polymer property and a means of adding together the instantaneous distributions of the polymer property in order to obtain the cumulative distribution of the polymer property in the reactor.

The present invention provides self-contained systems, apparatus and methods for determining a chemical state, the system includes a stationary cartridge for performing the assay therein, the cartridge adapted to house at least one reagent adapted to react with a sample; and at least one reporter functionality adapted to report a reaction of the at least one reagent with the sample to report a result of the assay, a mechanical controller including a first urging means adapted to apply a force externally onto the cartridge to release the at least one reagent; and at least one second urging means adapted to apply a removable force to induce fluidic movement in a first direction in the cartridge and upon removal of the force causing fluidic movement in an opposite direction to the first direction, an optical reader adapted to detect the reaction and a processor adapted to receive data from the optical reader and to process the data to determine said chemical state.

A measurement device includes mechanical support elements (101-104) for supporting a sample well, other mechanical support elements (105-109) for supporting a measurement head (112) suitable for optical measurements, and a control system (111) configured to control the measurement head to carry out at least two optical measurements from at least two different measurement locations inside the sample well, where each measurement location is a center point of a capture range from which radiation is captured in the respective optical measurement. The final measurement result is formed from the results of the at least two optical measurements in accordance with a pre-determined rule. The use of the at least two optical measurements from different measurement locations reduces measurement variation in situations where the sample well (153) contains a piece (158) of sample carrier.

A measurement device includes mechanical support elements (101-104) for supporting a sample well, other mechanical support elements (105-109) for supporting a measurement head (112) suitable for optical measurements, and a control system (111) configured to control the measurement head to carry out at least two optical measurements from at least two different measurement locations inside the sample well, where each measurement location is a center point of a capture range from which radiation is captured in the respective optical measurement. The final measurement result is formed from the results of the at least two optical measurements in accordance with a pre-determined rule. The use of the at least two optical measurements from different measurement locations reduces measurement variation in situations where the sample well (153) contains a piece (158) of sample carrier.

A three-dimensional porous photonic structure, whose internal pore surfaces can be provided with desired surface properties in a spatially selective manner with arbitrary patterns, and methods for making the same are described. When exposed to a fluid (e.g., via immersion or wicking), the fluid can selectively penetrate the regions of the structure with compatible surface properties. Broad applications, for example in security, encryption and document authentication, as well as in areas such as simple microfluidics and diagnostics, are anticipated.

The present document describes a screening composition comprising a marker compound, chosen from at least one of iodine, and fluorescein; eosin Y, erythrosine, ponceau S, calcein, a catalyst, chosen from at least one boron trioxide (B.sub.2O.sub.3), potassium (K), Gallium (III) oxide (Ga.sub.2O.sub.3), Nickel (II) oxide (NiO), Vanadium (V) oxide (V.sub.2O.sub.5), magnesium oxide (MgO), a bismuth oxide chosen from bismuth subcarbonate [Bi.sub.2O.sub.2(CO.sub.3)], bismuth chloride oxide (BiClO), and bismuth oxide (Bi.sub.2O.sub.3), cesium bromide (CsBr), lanthanum (III) oxide (La.sub.2O.sub.3), molybdenum (VI) oxide (MoO.sub.3), neodymium oxide (Nd.sub.2O.sub.3), Nickel (II) carbonate anhydrous (NiCO.sub.3); and a pigment, chosen from at least one of scandium (III) oxide (Sc.sub.2O.sub.3), Lead (IV) oxide (PbO.sub.2), Sulfur (S) powder, and Tungsten (VI) oxide (WO.sub.3), chromium (III) oxide (Cr.sub.2O.sub.3), copper (II) oxide (CuO), copper (I) oxide (Cu.sub.2O), iron (III) oxide (Fe.sub.2O.sub.3), lead (II) oxide (PbO). The document also describes method of using the same.

The present document describes a screening composition comprising a marker compound, chosen from at least one of iodine, and fluorescein; eosin Y, erythrosine, ponceau S, calcein, a catalyst, chosen from at least one boron trioxide (B.sub.2O.sub.3), potassium (K), Gallium (III) oxide (Ga.sub.2O.sub.3), Nickel (II) oxide (NiO), Vanadium (V) oxide (V.sub.2O.sub.5), magnesium oxide (MgO), a bismuth oxide chosen from bismuth subcarbonate [Bi.sub.2O.sub.2(CO.sub.3)], bismuth chloride oxide (BiClO), and bismuth oxide (Bi.sub.2O.sub.3), cesium bromide (CsBr), lanthanum (III) oxide (La.sub.2O.sub.3), molybdenum (VI) oxide (MoO.sub.3), neodymium oxide (Nd.sub.2O.sub.3), Nickel (II) carbonate anhydrous (NiCO.sub.3); and a pigment, chosen from at least one of scandium (III) oxide (Sc.sub.2O.sub.3), Lead (IV) oxide (PbO.sub.2), Sulfur (S) powder, and Tungsten (VI) oxide (WO.sub.3), chromium (III) oxide (Cr.sub.2O.sub.3), copper (II) oxide (CuO), copper (I) oxide (Cu.sub.2O), iron (III) oxide (Fe.sub.2O.sub.3), lead (II) oxide (PbO). The document also describes method of using the same.