Systems and methods for tracking the location of a non-destructive inspection (NDI) scanner using images of a target object acquired by the NDI scanner. The system includes a frame, an NDI scanner supported by the frame, a system configured to enable motorized movement of the frame, and a computer system communicatively coupled to receive sensor data from the NDI scanner and track the location of the NDI scanner. The NDI scanner includes a two-dimensional (2-D) array of sensors. Subsurface depth sensor data is repeatedly (recurrently, continually) acquired by and output from the 2-D sensor array while at different locations on a surface of the target object. The resulting 2-D scan image sequence is fed into an image processing and feature point comparison module that is configured to track the location of the scanner relative to the target object using virtual features visible in the acquired scan images.

The present invention relates to a system (100) for spatially detecting any foreign bodies within a product (135) on the basis of dielectric characteristics of said product (135), said system (100) comprising: conveyor means (150) adapted to convey said product (135) through a scanning region (S) along a crossing direction (L), in a predefined crossing time interval (T) for crossing said scanning region (S); a plurality of antennae (200) arranged transversally to said crossing direction (L), wherein each antenna (210) of said plurality of antennae (200) is adapted to operate in the microwave range, and wherein each antenna (210) is adapted to transmit an electromagnetic scanning signal adapted to propagate in said scanning region (S), so as to diffuse in said product (135); processing means (250) adapted to generate a first set of values indicative of the dielectric characteristics of said product (135) based on at least one diffused electromagnetic signal received by at least one antenna (210) of said plurality of antennae (200), said processing means (250) being adapted to compare said first set of values with a second set of values indicative of the dielectric characteristics of said product (135) in the absence of any foreign bodies, wherein each antenna (210) of said plurality of antennae (200) is adapted to transmit said electromagnetic scanning signal at least once in said crossing time interval (T), according to a predefined transmission frequency.

The present invention relates to a system (100) for spatially detecting any foreign bodies within a product (135) on the basis of dielectric characteristics of said product (135), said system (100) comprising: conveyor means (150) adapted to convey said product (135) through a scanning region (S) along a crossing direction (L), in a predefined crossing time interval (T) for crossing said scanning region (S); a plurality of antennae (200) arranged transversally to said crossing direction (L), wherein each antenna (210) of said plurality of antennae (200) is adapted to operate in the microwave range, and wherein each antenna (210) is adapted to transmit an electromagnetic scanning signal adapted to propagate in said scanning region (S), so as to diffuse in said product (135); processing means (250) adapted to generate a first set of values indicative of the dielectric characteristics of said product (135) based on at least one diffused electromagnetic signal received by at least one antenna (210) of said plurality of antennae (200), said processing means (250) being adapted to compare said first set of values with a second set of values indicative of the dielectric characteristics of said product (135) in the absence of any foreign bodies, wherein each antenna (210) of said plurality of antennae (200) is adapted to transmit said electromagnetic scanning signal at least once in said crossing time interval (T), according to a predefined transmission frequency.

Embodiments described herein utilize Non-Destructive Inspection (NDI) scan data obtained during a process performed on a surface of a structure to update a location of an NDI scanner on the surface. A subsurface feature within the structure is detected based on the NDI scan data, which are correlated with pre-defined position data for the subsurface feature. A measured location of the NDI scanner on the surface is corrected based on the pre-defined position data for the subsurface feature.

Provided are a structure inspection method and a structure inspection system capable of easily detecting an abnormal location and inspecting an internal state of the abnormal location in detail. The structure inspection method includes: a step of capturing a thermal image of a surface of a structure with an infrared camera; a step of detecting a first region estimated to have an internal abnormality, on the basis of the thermal image; and a step of measuring an internal state of the first region in a case where the first region is detected. In the step of measuring the internal state of the first region, the internal state of the first region is measured by capturing an image that visualizes the internal state of the first region using an electromagnetic wave or an ultrasonic wave.

An imaging system includes a visible-light image capturing device that images an object with light including visible light to acquire a visible-light image, a millimeter-wave image capturing device that images the object with an electromagnetic wave in a millimeter-wave band to acquire a millimeter-wave image, a distance measurement device that measures an imaging distance to the object, a memory in which information indicating end points and/or edges of the millimeter-wave image in the visible-light image is stored in correspondence with the imaging distance; and a processor. The processor acquires information in correspondence with the imaging distance by referring to the memory and generates a superimposed image in which the visible-light image and the millimeter-wave image are superimposed based on the acquired information.

An imaging system includes a visible-light image capturing device that images an object with light including visible light to acquire a visible-light image, a millimeter-wave image capturing device that images the object with an electromagnetic wave in a millimeter-wave band to acquire a millimeter-wave image, a distance measurement device that measures an imaging distance to the object, a memory in which information indicating end points and/or edges of the millimeter-wave image in the visible-light image is stored in correspondence with the imaging distance; and a processor. The processor acquires information in correspondence with the imaging distance by referring to the memory and generates a superimposed image in which the visible-light image and the millimeter-wave image are superimposed based on the acquired information.

Disclosed is an apparatus and method for evaluating a status of a refractory material in metallurgical vessels, including furnaces and ladles, wherein an external structure at least partly surrounding the refractory material impairs the propagation of radiofrequency signals. The apparatus and method are operative to identify flaws and determine the erosion profile and thickness of refractory material and the level or rate of penetration of molten material into the refractory material, using radiofrequency signals. The apparatus comprises an antenna embedded in the refractory material or positioned inside the chamber of the vessel designed to collect data associated with the propagation of radiofrequency signals transmitted by the antenna into the refractory material. Moreover, signal processing techniques allow determining the status of the internal wall of the vessel due to operational wear, age, and presence of flaws, cracks, corrosion, and erosion to improve the operational life and maintenance of the vessel.

Disclosed is an apparatus and method for evaluating a status of a refractory material in metallurgical vessels, including furnaces and ladles, wherein an external structure at least partly surrounding the refractory material impairs the propagation of radiofrequency signals. The apparatus and method are operative to identify flaws and determine the erosion profile and thickness of refractory material and the level or rate of penetration of molten material into the refractory material, using radiofrequency signals. The apparatus comprises an antenna embedded in the refractory material or positioned inside the chamber of the vessel designed to collect data associated with the propagation of radiofrequency signals transmitted by the antenna into the refractory material. Moreover, signal processing techniques allow determining the status of the internal wall of the vessel due to operational wear, age, and presence of flaws, cracks, corrosion, and erosion to improve the operational life and maintenance of the vessel.

The present disclosure relates to a system for detecting and analyzing droplets of feedstock material being ejected from an additive manufacturing device. The system makes use of a split ring resonator (SRR) probe including a ring element having a gap, with the gap being positioned adjacent a path of travel of the droplets of feedstock material. An excitation signal source is used for supplying an excitation signal to the SRR probe. An analyzer analyzes signals generated by the SRR probe in response to perturbations in an electric field generated by the SRR probe as the droplets of feedstock material pass the ring element. The signals are indicative of dimensions of the droplets of feedstock material.