Provided is a technique for specifying a medium more simply. A medium sensor device includes an antenna, a storage unit that stores a medium identification table in which a medium corresponding to an antenna impedance has been determined beforehand, and a medium specification unit that specifies the impedance of the antenna and specifies a medium in the vicinity of the antenna by referring to the medium identification table.

Provided is a technique for specifying a medium more simply. A medium sensor device includes an antenna, a storage unit that stores a medium identification table in which a medium corresponding to an antenna impedance has been determined beforehand, and a medium specification unit that specifies the impedance of the antenna and specifies a medium in the vicinity of the antenna by referring to the medium identification table.

An inspection system includes one or more processors and an infrared (IR) camera operably coupled to the one or more processors. The one or more processors control a microwave transmitter to sequentially emit microwaves having different frequencies within a designated frequency range into an object during a first sweep. The IR camera generates thermal image data of the object after the object is heated by each of the different frequencies of microwaves. The one or more processors analyze the thermal image data and determine a selected frequency within the designated frequency range that provides greater heating of the object than one or more other frequencies in the designated frequency range. The one or more processors also analyze select thermal image data of the object, responsive to heating of the object by the selected frequency of microwaves, to detect an element in the object.

An inspection system includes one or more processors and an infrared (IR) camera operably coupled to the one or more processors. The one or more processors control a microwave transmitter to sequentially emit microwaves having different frequencies within a designated frequency range into an object during a first sweep. The IR camera generates thermal image data of the object after the object is heated by each of the different frequencies of microwaves. The one or more processors analyze the thermal image data and determine a selected frequency within the designated frequency range that provides greater heating of the object than one or more other frequencies in the designated frequency range. The one or more processors also analyze select thermal image data of the object, responsive to heating of the object by the selected frequency of microwaves, to detect an element in the object.

Disclosed herein is a system that comprises a deposition head configured to deposit multiple tows in a stacked configuration one layer at a time. Each tow of the multiple tows is a currently-applied tow when the tow is a most-recently deposited tow of the multiple tows and a tow of the multiple tows is a covered tow when the tow is directly covered by the currently-applied tow. The system also comprises a probe head, configured to move along and be spatially offset from the currently-applied tow after deposition of the currently-applied tow. The probe head is further configured to transmit an incident microwave beam into the currently-applied tow as the probe head moves along the currently-applied tow. The incident microwave beam has a frequency low enough to pass entirely through the currently-applied tow and high enough to pass entirely through no more than the currently-applied tow and the covered tow.

Disclosed herein is a system that comprises a deposition head configured to deposit multiple tows in a stacked configuration one layer at a time. Each tow of the multiple tows is a currently-applied tow when the tow is a most-recently deposited tow of the multiple tows and a tow of the multiple tows is a covered tow when the tow is directly covered by the currently-applied tow. The system also comprises a probe head, configured to move along and be spatially offset from the currently-applied tow after deposition of the currently-applied tow. The probe head is further configured to transmit an incident microwave beam into the currently-applied tow as the probe head moves along the currently-applied tow. The incident microwave beam has a frequency low enough to pass entirely through the currently-applied tow and high enough to pass entirely through no more than the currently-applied tow and the covered tow.

A steel deck bridge evaluation device is provided to enable quantitative evaluation of damage to or deterioration within a steel deck bridge.

A steel deck bridge evaluation device includes a processor, the processor is configured to acquire reflected response data relating to a reflected response to an electromagnetic wave irradiated through a surface a deck in a depth direction of the deck, remove a first frequency component obtained by reflection of the electromagnetic wave at a surface of the deck and a second frequency component obtained by reflection of the electromagnetic wave at a steel deck from a reflected response frequency distribution of the reflected response expressing the reflected response data, and evaluate damage to or deterioration of the deck using a peak measurement value that is a peak value of a frequency component level corresponding to a specific frequency or higher, in the reflected response frequency distribution from which the first frequency component and the second frequency component have been removed.

A steel deck bridge evaluation device is provided to enable quantitative evaluation of damage to or deterioration within a steel deck bridge.

A steel deck bridge evaluation device includes a processor, the processor is configured to acquire reflected response data relating to a reflected response to an electromagnetic wave irradiated through a surface a deck in a depth direction of the deck, remove a first frequency component obtained by reflection of the electromagnetic wave at a surface of the deck and a second frequency component obtained by reflection of the electromagnetic wave at a steel deck from a reflected response frequency distribution of the reflected response expressing the reflected response data, and evaluate damage to or deterioration of the deck using a peak measurement value that is a peak value of a frequency component level corresponding to a specific frequency or higher, in the reflected response frequency distribution from which the first frequency component and the second frequency component have been removed.

An automated resonant waveguide cavity system for determining one or complex permittivity measurements of a sample is provided. The automated resonant waveguide cavity system includes a resonant cavity, a waveguide coupled to the resonant cavity, a programmable network analyzer (PNA) coupled to the waveguide, and a computing device. The computing device includes a memory storing processor executable code for a determination engine and a processor executing the processor executable code to cause the determination engine to obtain data from the PNA. The data is respective to the sample within the resonant cavity. The determination engine further integrates a plurality of analytical and modeling functions in determining the complex permittivity values of the sample from the data.

An automated resonant waveguide cavity system for determining one or complex permittivity measurements of a sample is provided. The automated resonant waveguide cavity system includes a resonant cavity, a waveguide coupled to the resonant cavity, a programmable network analyzer (PNA) coupled to the waveguide, and a computing device. The computing device includes a memory storing processor executable code for a determination engine and a processor executing the processor executable code to cause the determination engine to obtain data from the PNA. The data is respective to the sample within the resonant cavity. The determination engine further integrates a plurality of analytical and modeling functions in determining the complex permittivity values of the sample from the data.