G01N23/02

Collimator system

In a general aspect, a collimator system is described. In some aspects, a neutron beam collimation method includes receiving a neutron beam from a neutron source; polarizing the neutron beam using a polarizer, and obtaining a collimated neutron beam from the polarized neutron beam. The neutron beam generated by the neutron source has a first beam divergence and includes a plurality of neutrons. The collimated neutron beam has a second beam divergence that is less than the first beam divergence. Obtaining the collimated neutron beam includes mapping transverse momentum of each respective neutron, of the plurality of neutrons, onto a polarization degree of freedom of the respective neutron by applying a sequence of phase shift gradients to the polarized neutron beam, and after applying the sequence of phase shift gradients, passing the polarized neutron beam through an analyzer.

Advection fog forecasting system and forecasting method

An advection fog forecasting system and a method thereof are based on the recognition that wireless signal communication is subject to weather conditions. The system and the method involve collecting radio signals in a forecasting region that is likely to be shrouded in fog. Radio signals influenced by fog can show fog attenuation, and different levels of attenuation can be represented by different values of a radio signal strength indicator RSSI. With the variation curve of the radio signal strength indicator RSSI and weather variables, such as the humidity, the wind speed and the rainfall in the forecasting region, forecasting advection fog can be achieved.

RADIATION SOURCE FOR NONDESTRUCTIVE INSPECTION, AND METHOD AND APPARATUS FOR MANUFACTURING SAME

An irradiation target is formed into a sphere. The spherical irradiation target can be iridium metal containing natural or enriched iridium. The radiation source can be manufactured by manufacturing a spherical irradiation target, accommodating the spherical irradiation target in a rotating capsule, and rotating an axial flow impeller by a downward flow of a reactor primary coolant, whereby the rotating capsule is rotated. This radiation source provides an improved nondestructive inspection image having a high geometric resolution, and has no radiation source anisotropy and also has high target recyclability.

Method of evaluating level of cleanliness of hollow fiber membrane device, method of washing hollow fiber membrane device, and washing device for hollow fiber membrane device
11351507 · 2022-06-07 · ·

The level of cleanliness of a hollow fiber membrane device is evaluated before it is installed in an ultrapure water production system. A method of evaluating the level of cleanliness of the hollow fiber membrane device includes capturing fine particles in permeating water by means of a first filter membrane, wherein the permeating water is ultrapure water that permeates through the hollow fiber membrane device before the hollow fiber membrane device is installed in an ultrapure water production system; and analyzing the fine particles that are captured by the filter membrane.

SYSTEMS, APPARATUSES, AND METHODS FOR MEASURING SUBMERGED SURFACES
20220136984 · 2022-05-05 ·

The present disclosure provides systems, apparatuses, and methods for measuring submerged surfaces. Embodiments include a measurement apparatus including a main frame, a source positioned outside a pipe and connected to the main frame, and a detector positioned outside the pipe at a location diametrically opposite the source and connected to the main frame. The source may transmit a first amount of radiation. The detector may receive a second amount of radiation, determine a composition of the pipe based on the first and second amounts of radiation, and send at least one measurement signal. A control canister positioned on the main frame or on a remotely operated vehicle (ROV) attached to the apparatus may receive the at least one measurement signal from the detector and convey the at least one measurement signal to software located topside.

SYSTEMS, APPARATUSES, AND METHODS FOR MEASURING SUBMERGED SURFACES
20220136984 · 2022-05-05 ·

The present disclosure provides systems, apparatuses, and methods for measuring submerged surfaces. Embodiments include a measurement apparatus including a main frame, a source positioned outside a pipe and connected to the main frame, and a detector positioned outside the pipe at a location diametrically opposite the source and connected to the main frame. The source may transmit a first amount of radiation. The detector may receive a second amount of radiation, determine a composition of the pipe based on the first and second amounts of radiation, and send at least one measurement signal. A control canister positioned on the main frame or on a remotely operated vehicle (ROV) attached to the apparatus may receive the at least one measurement signal from the detector and convey the at least one measurement signal to software located topside.

METROLOGY METHOD

A method includes placing a wafer on a rotation mechanism of a metrology device; illuminating, by using a light source of the metrology device, the wafer by an X-ray; rotating, by using the rotation mechanism, the wafer while illuminating the wafer by the X-ray; detecting, by using an image sensor of the metrology device, a transmission portion of the X-ray passing through the wafer while rotating the wafer; and obtaining, by using a processor of the metrology device, a top width and a bottom width of a structure over the wafer based on the transmission portion of the X-ray with different rotating angles of the rotation mechanism.

METROLOGY METHOD

A method includes placing a wafer on a rotation mechanism of a metrology device; illuminating, by using a light source of the metrology device, the wafer by an X-ray; rotating, by using the rotation mechanism, the wafer while illuminating the wafer by the X-ray; detecting, by using an image sensor of the metrology device, a transmission portion of the X-ray passing through the wafer while rotating the wafer; and obtaining, by using a processor of the metrology device, a top width and a bottom width of a structure over the wafer based on the transmission portion of the X-ray with different rotating angles of the rotation mechanism.

X-ray collimator and related x-ray inspection apparatus
20220130568 · 2022-04-28 ·

An X-ray collimator (30) that comprises: a collimator body (31) comprising: a collimation conduit (32) provided with an inlet (320), configured to be connected to an X-ray source (20) for the inlet of a beam (B) of X-rays, and an outlet (321), configured to emit a collimated portion (B1) of the X-ray beam (B); and a derivation conduit (33) inclined with respect to the collimation conduit (32), wherein the derivation conduit (33) is provided with an inlet (330), configured to be connected to the X-ray source (20) for the inlet of a peripheral portion (B2) of the same X-ray beam (B) emitted by the source (20), and an outlet (331); a reference detector (40) fixed to the collimator body (31) and provided with an inlet window (41) facing the outlet (331) of the derivation conduit (33).

Methods and systems for measuring the density of material including an electromagnetic moisture property detector

The subject matter described herein includes methods, systems, and computer program products for measuring the density of a material. According to one aspect, a material property gauge includes a nuclear density gauge for measuring the density of a material. A radiation source adapted to emit radiation into a material and a radiation detector operable to produce a signal representing the detected radiation. A first material property calculation function may calculate a value associated with the density of the material based upon the signal produced by the radiation detector. The material property gauge includes an electromagnetic moisture property gauge that determines a moisture property of the material. An electromagnetic field generator may generate an electromagnetic field where the electromagnetic field sweeps through one or more frequencies and penetrates into the material. An electromagnetic sensor may determine a frequency response of the material to the electromagnetic field across the several frequencies.