G01N23/20

LUBRICANT AND LUBRICATION COMPOSITION
20220403277 · 2022-12-22 · ·

The present invention relates to a lubricant containing molybdenum sulfide particles, and the molybdenum sulfide particles contain molybdenum disulfide having a 3R crystal structure. The present invention relates to a lubricating composition containing molybdenum sulfide particles, which are the lubricant, and a base oil which is a mineral oil, a synthetic oil, or a partially synthetic oil.

DEGREE-OF-CRYSTALLINITY MEASUREMENT APPARATUS, DEGREE-OF-CRYSTALLINITY MEASUREMENT METHOD, AND INFORMATION STORAGE MEDIUM
20220390392 · 2022-12-08 ·

A measured pattern acquisition unit acquires a measured X-ray scattering pattern of a sample containing a target substance and another known mixed substance. A known pattern acquisition unit acquires a known X-ray scattering pattern of the other known mixed substance. A crystalline pattern acquisition unit at least partially acquires an X-ray diffraction pattern of a crystalline portion included in the target substance. A crystalline integrated intensity calculation unit calculates an integrated intensity for the acquired X-ray diffraction pattern of the crystalline portion. A target substance integrated intensity calculation unit calculates an integrated intensity for an X-ray scattering pattern of the target substance. A degree-of-crystallinity calculation unit calculates a degree of crystallinity of the target substance based on the integrated intensity for the X-ray diffraction pattern of the crystalline portion and the integrated intensity for the X-ray scattering pattern of the target substance.

DEGREE-OF-CRYSTALLINITY MEASUREMENT APPARATUS, DEGREE-OF-CRYSTALLINITY MEASUREMENT METHOD, AND INFORMATION STORAGE MEDIUM
20220390392 · 2022-12-08 ·

A measured pattern acquisition unit acquires a measured X-ray scattering pattern of a sample containing a target substance and another known mixed substance. A known pattern acquisition unit acquires a known X-ray scattering pattern of the other known mixed substance. A crystalline pattern acquisition unit at least partially acquires an X-ray diffraction pattern of a crystalline portion included in the target substance. A crystalline integrated intensity calculation unit calculates an integrated intensity for the acquired X-ray diffraction pattern of the crystalline portion. A target substance integrated intensity calculation unit calculates an integrated intensity for an X-ray scattering pattern of the target substance. A degree-of-crystallinity calculation unit calculates a degree of crystallinity of the target substance based on the integrated intensity for the X-ray diffraction pattern of the crystalline portion and the integrated intensity for the X-ray scattering pattern of the target substance.

Transmission small-angle X-ray scattering metrology system

Methods and systems for characterizing dimensions and material properties of semiconductor devices by transmission small angle x-ray scatterometry (TSAXS) systems having relatively small tool footprint are described herein. The methods and systems described herein enable Q space resolution adequate for metrology of semiconductor structures with reduced optical path length. In general, the x-ray beam is focused closer to the wafer surface for relatively small targets and closer to the detector for relatively large targets. In some embodiments, a high resolution detector with small point spread function (PSF) is employed to mitigate detector PSF limits on achievable Q resolution. In some embodiments, the detector locates an incident photon with sub-pixel accuracy by determining the centroid of a cloud of electrons stimulated by the photon conversion event. In some embodiments, the detector resolves one or more x-ray photon energies in addition to location of incidence.

A SAMPLE INSPECTION SYSTEM
20220381710 · 2022-12-01 · ·

A sample inspection system contains a source of electromagnetic radiation and an apparatus that includes a beam former, a collimator and an energy resolving detector. The beam former is adapted to receive electromagnetic radiation from the source to provide a polygonal shell beam formed of at least three walls of electromagnetic radiation. The collimator has a plurality of channels adapted to receive diffracted or scattered radiation at an angle. The energy resolving detector is arranged to detect radiation diffracted or scattered by a sample upon incidence of the polygonal shell beam onto the sample and transmitted by the collimator.

A SAMPLE INSPECTION SYSTEM
20220381710 · 2022-12-01 · ·

A sample inspection system contains a source of electromagnetic radiation and an apparatus that includes a beam former, a collimator and an energy resolving detector. The beam former is adapted to receive electromagnetic radiation from the source to provide a polygonal shell beam formed of at least three walls of electromagnetic radiation. The collimator has a plurality of channels adapted to receive diffracted or scattered radiation at an angle. The energy resolving detector is arranged to detect radiation diffracted or scattered by a sample upon incidence of the polygonal shell beam onto the sample and transmitted by the collimator.

CONTROLLING CRYSTALLIZATION AT THE INTERFACE BETWEEN OIL AND BRINE

A method is described for determining the structure of a surfactant complex formed at an immiscible liquid-liquid interface. The surfactant complex forms and crystallizes at the interface between an aqueous phase comprising a divalent metal salt and a non-aqueous phase comprising an anionic surfactant. The non-aqueous phase may be in the form of a droplet surrounded by the aqueous phase. The structure of the surfactant complex is determined by X-ray crystallography.

CONTROLLING CRYSTALLIZATION AT THE INTERFACE BETWEEN OIL AND BRINE

A method is described for determining the structure of a surfactant complex formed at an immiscible liquid-liquid interface. The surfactant complex forms and crystallizes at the interface between an aqueous phase comprising a divalent metal salt and a non-aqueous phase comprising an anionic surfactant. The non-aqueous phase may be in the form of a droplet surrounded by the aqueous phase. The structure of the surfactant complex is determined by X-ray crystallography.

Edge Phase Effects Removal Using Wavelet Correction and Particle Classification Using Combined Absorption and Phase Contrast

An x-ray microscopy method that obtains a classification of different particles by distinguishing between different material phases through a combination of image processing involving morphological edge enhancement and possibly resolved absorption contrast differences between the phases along with optional wavelet filtering.

Edge Phase Effects Removal Using Wavelet Correction and Particle Classification Using Combined Absorption and Phase Contrast

An x-ray microscopy method that obtains a classification of different particles by distinguishing between different material phases through a combination of image processing involving morphological edge enhancement and possibly resolved absorption contrast differences between the phases along with optional wavelet filtering.