Disclosed is an optical system for interrogating a sample, an optical system for measuring the spectrum of a beam of light, an optical system for measuring the spectrum of two beams of light, a compact imaging-based sensor or sensors, and combinations thereof.

Cryogenic analysis systems are provided that can include: at least one sample stage operatively aligned with at least one cooling source; at least one thermal link operationally coupled between the sample stage and the cooling source; and at least one link support between the cooling source and the sample stage, the link support engaging the thermal link. Methods for cooling a sample within a cryogenic analysis system are provided with at least some of the methods including: thermally connecting a cooling source to a sample stage supporting a sample via a thermal link; and supporting the thermal link between the cooling source and the sample stage.

Disclosed are a successive optical analysis system for optically analyzing a flow cell, including: at least one stage on which the flow cell is loaded; at least two optical analyzing units configured to optically analyze the flow cell loaded on the stage; and a conveying unit configured to convey at least one of the stage and the optical analyzing unit and align positions of the stage and the optical analyzing unit, and a successive optical analysis method using the same.

An inspection system is configured for use with a conveyer apparatus including carrier bars. Each carrier bar conveys pellet-shaped articles along a predetermined path. The inspection system includes at least one camera unit for sensing a predetermined characteristic of the pellet-shaped articles, a removal unit, and a controller. The removal unit, downstream from the at least one camera unit, removes selected pellet-shaped article(s) from the carrier bar(s) depending on whether the characteristic is sensed by the at least one camera unit. The controller is in communication with the at least one camera unit and the removal unit. The controller provides a signal to the removal unit in accordance with the sensed characteristic. The removal unit includes a rotatable ejection drum having extended vacuum nozzles along its length, equal to the number of articles conveyed in each carrier bar. Each vacuum nozzle selectively removes article(s) from the carrier bar(s) by suction.

The invention encompasses analyzers and analyzer systems that include a single molecule analyzer, methods of using the analyzer and analyzer systems to analyze samples, either for single molecules or for molecular complexes. The single molecule uses electromagnetic radiation that is translated through the sample to detect the presence or absence of a single molecule. The single molecule analyzer provided herein is useful for diagnostics because the analyzer detects single molecules with zero carryover between samples.

The application provides a diamond testing device. The testing device includes a casing, a movable specimen holder, an illumination unit, a light sensor unit, and a computing processor. In a closed position, the casing encloses the specimen holder, the illumination unit, and the light sensor unit.

Systems and methods for testing a test sample obtain a first image of the test sample via a first input device. The first input device is a primary camera configured to capture the first image while a plurality of light sources illuminate the test sample. The first image is sent from the first input device to a control panel. The control panel is used to label a plurality of layers on the first image. A water cut of the test sample is determined based on labeling of plurality of layers of the first image.

The prism-coupling systems and methods include using a prism-coupling system to collect a 2D digital mode spectrum of an IOX article. The mode line and critical angle positions and orientations are found by performing a weighted fit to mode line and critical angle images and are used to define a compensated mode spectrum. If mode line tilt is found, it is removed from the 2D digital mode spectrum to define the compensated mode spectrum. The compensated mode spectrum is then processed using techniques known in the art to provide a more accurate estimate of stress-related characteristics of the IOX sample versus using the uncompensated mode spectrum. Derivative-based methods of accurately establishing positions of intensity transitions in a mode spectrum of an IOX sample using a derivative spectrum and curve fitting are also disclosed.

An inspection system is configured for use with a conveyer apparatus including carrier bars. Each carrier bar conveys pellet-shaped articles along a predetermined path. The inspection system includes at least one camera unit for sensing a predetermined characteristic of the pellet-shaped articles, a removal unit, and a controller. The removal unit, downstream from the at least one camera unit, removes selected pellet-shaped article(s) from the carrier bar(s) depending on whether the characteristic is sensed by the at least one camera unit. The controller is in communication with the at least one camera unit and the removal unit. The controller provides a signal to the removal unit in accordance with the sensed characteristic. The removal unit includes a rotatable ejection drum having extended vacuum nozzles along its length, equal to the number of articles conveyed in each carrier bar. Each vacuum nozzle selectively removes article(s) from the carrier bar(s) by suction.

The present disclosure provides a sensor substrate that detects an analyte of a low concentration with high sensitivity and high reliability. The sensor substrate according to the present disclosure a first substrate having first microprotrusions provided on the surface thereof and covered by a metal film, an adhesive film disposed on the surface of the first substrate and having a slit, and a second substrate that is transparent, disposed on the adhesive film, and having a first through hole and a second through hole, wherein each of the first through hole and the second through hole is in communication with the slit, and the first microprotrusions overlap the slit in a plan view.