A measurement method for an air kerma conventional true value comprises: building a small-scale reference radiation field, then selecting a proper radiation source (4) and a source intensity for providing incident rays for a shielding box (1), subsequently selecting a plurality of gamma ray dose measurement instruments as experiment samples for building a prediction model to obtain a prediction model of the air kerma conventional true value of a check point, fmally placing a probe of an instrument to be detected on the check point (6), recording a scattering gamma spectrum detected by a gamma-ray spectrometer (9), and importing the prediction model to obtain the air kerma conventional true value. The method relates to the field of radiation protection detection or calibration, and has the beneficial effects that the result is accurate, the reference radiation field used is small in size, and the method is applied to measurement of the air kerma conventional true value. The method solves the problem that site and in-situ detection or calibration is unlikely to be implemented as the existing standard reference radiation field is too large in space and volume to move or is difficult to move.

A collimator assembly for an x-ray optical system having a Soller slit for collimation of x-ray radiation with respect to a direction of an axis (z) of the Soller slit, wherein the Soller slit has a plurality of lamellae spaced apart from one another and having lamella planes parallel to one another, is characterized in that the Soller slit comprises a plurality of segments which are arranged along the axis and are separated from one another. The arrangement also has a collimator frame for enclosing and guiding the plurality of segments, and at least one of the plurality of segments is displaceable with respect to the collimator frame and relative to other segments. A simple but nonetheless accurate adjustment of the spectral resolution of an x-ray spectrometer to a respective different analytical application is thus enabled in a compact and cost-effective manner.

Methods and systems for characterizing dimensions and material properties of semiconductor devices by full beam x-ray scatterometry are described herein. A full beam x-ray scatterometry measurement involves illuminating a sample with an X-ray beam and detecting the intensities of the resulting zero diffraction order and higher diffraction orders simultaneously for one or more angles of incidence relative to the sample. The simultaneous measurement of the direct beam and the scattered orders enables high throughput measurements with improved accuracy. The full beam x-ray scatterometry system includes one or more photon counting detectors with high dynamic range and thick, highly absorptive crystal substrates that absorb the direct beam with minimal parasitic backscattering. In other aspects, model based measurements are performed based on the zero diffraction order beam, and measurement performance of the full beam x-ray scatterometry system is estimated and controlled based on properties of the measured zero order beam.

A device keeps an electrochemical cell under current and at operating temperature during an X-ray beam diffraction analysis of a first electrode, the cell comprising a solid electrolyte interposed between the electrodes. The device comprises: first and second interconnectors having contact faces contacting the electrodes, which allow a gas flow and exchange between the interconnectors and the electrodes. The contact face of the first interconnector allows an X-ray beam to pass to the first electrode. A thermal and atmospheric containment chamber has an inner cavity housing a stack formed from the cell between the interconnectors and a cover closing the cavity, provided with a window allowing X-rays to pass through, the first interconnector being intended to be arranged facing the cover. The contact face of each interconnector is a slotted element; slotted portions of the slotted element are uniformly arranged and form 30% to 80% of the element's surface area.

A component residual stress testing platform based on neutron diffraction and experimental method thereof are provided, the testing platform includes a component support, a rotating mainshaft, a first thrust cylindrical roller bearing, a first cylindrical roller bearing, a bearing spacing sleeve, a second cylindrical roller bearing, a sleeve, and a first fixed baffle. The rotating mainshaft is disposed on the component support. The first thrust cylindrical roller bearing, the first cylindrical roller bearing, the bearing spacing sleeve and the second cylindrical roller bearing are sleeved on the rotating mainshaft, the sleeve is sleeved outside the first cylindrical roller bearing, the bearing spacing sleeve and the second cylindrical roller bearing, a component to be tested is sleeved on the sleeve. The testing platform can support, move, tilt and rotate the component to be tested in a process of a residual stress testing.

A device for examining a sample by X-radiation having a radiation generation system for generating primary radiation, a first goniometer arm on which the radiation generation system is mounted and which is pivotable about a goniometer axis, a detection system configured to detect secondary radiation emanating from the sample, a second goniometer arm on which the detection system is mounted and which is pivotable about the goniometer axis, and an evacuable sample chamber within which the sample is arrangeable in a sample region encompassing a portion of the goniometer axis, the sample chamber being delimited by a sample chamber wall which has a transmission region which is transmissive to the primary radiation and is vacuum-tight, in order to allow the primary radiation to penetrate into the sample chamber and to impinge on the sample region at different angles of incidence.

Methods and systems for selecting mode(s) for inspection of specimens are provided. One method includes statistically predicting if data points in a set correspond to defects or nuisances on a specimen. The data points include attribute(s) determined for discrete locations on the specimen from output generated by two or more modes of an inspection system. Events have been detected at the discrete locations with at least one of the modes. The method also includes determining a quantitative measure for each of two or more different combinations of the modes thereby determining different quantitative measures. The quantitative measure for each of the different combinations is responsive to how well one of the combinations detects the defects and minimizes detection of the nuisances. The method further includes selecting one or more of the modes for inspection of specimens of the same type as the specimen based on the determined quantitative measures.

A collimator assembly for an x-ray optical system having a Soller slit for collimation of x-ray radiation with respect to the direction of an axis (z) of the Soller slit, wherein the Soller slit has a plurality of lamellae spaced apart from one another and having lamella planes parallel to one another, is characterized in that the Soller slit comprises a plurality of segments which are arranged along the axis and are separated from one another. The arrangement also has a collimator frame for enclosing and guiding the segments, and at least one of the segments is displaceable with respect to the frame and relative to other segments. A simple but nonetheless accurate adjustment of the spectral resolution of an x-ray spectrometer to a respective different analytical application is thus enabled in a compact and cost-effective manner.

An apparatus for cosmogenic neutron sensing to detect moisture includes a thermal neutron proportional counter. A housing is formed at least partially from a moderating material, which is positioned around the thermal neutron proportional counter. A proportional counter electronics unit is within the housing and has a preamplifier and a shaping amplifier. The preamplifier and shaping amplifier are directly connected to the thermal neutron proportional counter. At least one photovoltaic panel provides electrical power to the thermal neutron proportional counter. A data logger is positioned vertically above the thermal neutron proportional counter and proportional counter electronics unit. A signal from the thermal neutron proportional counter is transmitted through the proportional counter electronics unit and is received by the data logger. The signal indicates a moisture content within a measurement surface of the thermal neutron proportional counter.

A device keeps an electrochemical cell under current and at operating temperature during an X-ray beam diffraction analysis of a first electrode, the cell comprising a solid electrolyte interposed between the electrodes. The device comprises: first and second interconnectors having contact faces contacting the electrodes, which allow a gas flow and exchange between the interconnectors and the electrodes. The contact face of the first interconnector allows an X-ray beam to pass to the first electrode. A thermal and atmospheric containment chamber has an inner cavity housing a stack formed from the cell between the interconnectors and a cover closing the cavity, provided with a window allowing X-rays to pass through, the first interconnector being intended to be arranged facing the cover. The contact face of each interconnector is a slotted element; slotted portions of the slotted element are uniformly arranged and form 30% to 80% of the element's surface area.