Patent classifications
G01N2223/40
Charged particle beam device
A charged particle beam device according to the present invention changes a signal amount of emitted charged particles by irradiating the sample with light due to irradiation under a plurality of light irradiation conditions, and determines at least any one of a material of the sample or a shape of the sample according to the changed signal amount.
Arrayed X-ray source and X-ray imaging apparatus
An arrayed X-ray source and an X-ray imaging apparatus are described. An example X-ray source includes a housing and X-ray generators located in the housing. The X-ray generators are arranged in an array. The X-ray generators are provided separately from each other and configured to emit X-rays independently of each other.
METHODS AND APPARATUS FOR ELECTRON BACKSCATTER DIFFRACTION SAMPLE CHARACTERISATION
A method of analyzing a sample imaged by electron backscatter diffraction. The method comprises identifying a plurality of Kikuchi bands in an electron backscatter diffraction image of a position on the sample. The method further comprises forming, for each identified Kikuchi band, a respective vector representation of said Kikuchi band based at least in part on an estimate of the position on the sample. A configuration of the sample is determined by identifying a particular set of expected vector representations from a plurality of sets of expected vector representations as matching the vector representations of the plurality of identified Kikuchi bands.
Digital encoding algorithm for pixelated detectors
A detector for imaging and efficiently digitizing a spatial distribution of photon flux includes pixel circuits that compressively encode pixel values generated by integrated analog to digital converters (ADCs). On-pixel digital compression circuits (DCCs) implement compression to increase continuous frame rate by reducing the number of bits per pixel while keeping quantization error below Poisson noise. Several mapping algorithms for photon-counting and charge-integrating detectors and compact digital logic implementations are presented.
BIOLOGICAL IMAGING METHOD USING X-RAY FLUORESCENCE
Disclosed herein is a method comprising: causing emission of characteristic X-rays of a first element attached to a first biological analyte; causing emission of characteristic X-rays of a second element attached to a second biological analyte; detecting a characteristic of the first biological analyte based on the characteristic X-rays of the first element and a characteristic of the second biological analyte based on the characteristic X-rays of the second element; wherein the first element and the second element are different; wherein the first biological analyte and the second biological analyte are in the same solution.
Radiation detector
A radiation detector includes an image generator and a case. The image generator generates a radiograph according to received radiation. The case stores the image generator and includes a first component and a second component screwed to the first component. The second component is movable with respect to the first component in a direction along a seat surface of a screw by a screw hole of the second component being formed such that a diameter is larger than a diameter of a shaft of the screw but smaller than a diameter of a head of the screw. A loosening torque that acts, in a direction to loosen the screw, on the screw when the seat surface receives a frictional force from the second component is smaller than a loosening start torque that is the loosening torque of when the screw starts to loosen.
DETERMINATION OF MATERIAL
In an example, there is disclosed a method for determining a material in a cargo, the cargo including a first object made of a first material and a second object made of a second material. The method includes obtaining image data associated with an inspection image of the cargo, for at least two levels of radiation energy, obtaining equivalence data associated with mass equivalence of at least one of the first material and the second material with respect to a reference material, for the at least two levels of radiation energy, obtaining observation data based on the image data and the equivalence data, and determining at least one of the first material and the second material, based on the obtained observation data.
Fixtures, systems, and methods for configuring an imaging device for capturing images of an object
An example fixture includes a hollow elongate section having a first end and a second end, and the first end has an opening for receiving a lens portion of an imaging device and the second end is structurally configured to brace against a surface of an object being imaged. The hollow elongate section is configured to hold the lens portion of the imaging device at a fixed distance from an object being imaged and to control an amount of incident light on the lens portion. Example methods of configuring an imaging device for capturing images of an object include holding, via a fixture, a lens portion of an imaging device at a fixed distance from an object being imaged, controlling an amount of incident light on the lens portion of the imaging device, and holding a calibration object in a field of view of the imaging device.
Image displaying system, image processing apparatus and x-ray imaging system
An image displaying system according to an embodiment includes an observation target device, a display device and processing circuitry. The display device is configured to display an image. The processing circuitry is configured to: arrange a three-dimensional model relating to the observation target device in a virtual space; acquire data indicating a relative positional relationship between an operator and the observation target device; generate an image of a three-dimensional model included in a blind area when viewed from the operator, based on the data indicating the relative positional relationship and on the three-dimensional model arranged in the virtual space; and display the image on the display device.
Scatter X-ray imaging with adaptive scanning beam intensity
This specification describes an X-ray scanning system that adaptively generates a scatter signal, in the course of a single scan, based on the detected brightness areas of a scanned object. An X-ray source is configured to emit an X-ray beam towards an area over a target object. At least one detector detects radiation scattered from the target object and generates a corresponding scatter radiation signal. The scatter radiation signal is characterized, at least in part, by one or more brightness levels corresponding to one or more scanned areas of the target object. A feedback controller receives the scatter radiation signal from the detector, generates a signal that is a function of the one or more brightness levels and that is based on the received scatter radiation signal, and transmits the signal to the X-ray source. In response, the X-ray source is configured to receive the signal and adjust the X-ray beam intensity based on the signal.