Patent classifications
G01N2223/50
X-ray inspection apparatus, X-ray inspection system, and X-ray inspection method
An X-ray inspection apparatus includes a transport unit configured to transport an article, an electromagnetic wave irradiation unit configured to irradiate the article with a first electromagnetic wave in a first energy band and a second electromagnetic wave in a second energy band, an electromagnetic wave sensor configured to detect the first electromagnetic wave and the second electromagnetic wave, and a control unit to which a detection result is input. The control unit is configured to generate a first transmission image based on a detection result of the first electromagnetic wave and a second transmission image based on a detection result of the second electromagnetic wave, to perform image processing including a subtraction process on the first transmission image and the second transmission image, and to determine whether or not a foreign material is included in the article on the basis of a difference image.
Accelerated higher resolution industrial radiography
Example industrial radiography systems allow for generation of higher resolution 2D radiographs using an accelerated higher resolution radiograph process. The accelerated higher resolution radiograph process uses pixel (e.g., grayscale) values from one or more lower resolution 2D radiographs to set pixel values for a first portion of higher resolution radiograph pixels of a higher resolution 2D radiograph. The remaining portion of the higher resolution radiograph pixels are set based on an analysis of the first portion. The accelerated higher resolution radiograph process is faster than more traditional processes because the accelerated higher resolution radiograph process necessitates fewer lower resolution radiographs be captured, and therefore saves time and/or lower wear and tear on the radiography machine, while still providing quality higher resolution 2D radiographs.
X-ray scanner with blanking
An X-ray scanning system includes: an X-ray source configured to irradiate a target with source X-rays in the course of relative motion between the X-ray source and the target; a feature sensor configured to sense a feature of the target in the course of the relative motion; and a communication interface operatively coupled to the feature sensor and configured to output a blanking signal responsive to the feature sensor sensing the feature of the target.