Patent classifications
G01N2223/50
Method of analyzing an object in two stages using a transmission spectrum then a scattering spectrum
A method for analyzing an object, includes irradiating the object with incident photon radiation, acquiring a spectrum transmitted by the object using a spectrometric transmission detector, determining at least one first property of the object from the transmission spectrum, verifying that at least one doubt criterion relating to the first property of the object is met, and translating the fact that the object contains a material that is potentially dubious for the application under consideration. A second part, carried out only when the doubt criterion is met, includes acquiring an energy spectrum scattered by the object using a spectrometric scattering detector at an angle of 1 to 15, and determining a second property of the object from at least the scatter spectrum and comparing at least the second property of the object with properties of standard materials stored in a database to identify the objects composition material.
METHOD FOR DETERMINING PHYSICAL PROPERTIES OF A SAMPLE
Disclosed is a method for determining physical properties of a test sample using a spectrometric detector with at least three channels, consisting of: performing measurements in each of the channels on the test sample, calculating variables, each formed from a combination of measurements of different channels, and applying a weighting and bias matrix to the variables, enabling the investigated physical properties of the test sample to be determined.
APPARATUS AND METHOD FOR INDUCING HIGH-SPEED VARIABLE-TILT WOBBLE MOTIONS
An apparatus and method for inducing high-speed wobble motions to a sample of interest is provided. After the sample is securely attached to a sample mounting block, the sample is variably tilted by using a hexapod stage and simultaneously rotated at a high speed about a rotation axis that is substantially perpendicular to a planar top surface of the hexapod stage. The position of the sample is continuously adjusted during the wobble motion to align a surface center of the sample with a testing center of an X-ray diffractometer. The simultaneous variable tilting and high-speed rotation of the sample induces wobble motions to the sample for randomizing orientations of a sample material's crystallites relative to the source and detector of an X-ray diffractometer.
Two-step material decomposition calibration method for a full size photon counting computed tomography system
A method and a system for providing calibration for a photon counting detector forward model for material decomposition. The flux independent weighted bin response function is estimated using the expectation maximization method, and then used to estimate the pileup correction terms at each tube voltage setting for each detector pixel.
X-RAY INSPECTION DEVICE
An X-ray inspection apparatus with is configured to suppress the incidence of anomalies in inspection results caused by the X-ray inspection apparatus being used while an unsuitable setting is in effect. The X-ray inspection apparatus is provided with an inspection unit, a setting unit a storage unit, an assessment unit, and a notification unit. The inspection unit inspects an article using detection data obtained by detecting X-rays with which the article has been irradiated. The setting unit sets a setting value used in inspection of the article by the inspection unit. The storage unit stores a detection value based on the detection data. The assessment unit assesses on the basis of the detection value stored in the storage unit, whether or not the setting value set by the setting unit is suitable. When the assessment unit has assessed that the setting value is not suitable, the notification unit issues a notification to indicate that the setting value is not suitable.
X-ray sequential array wavelength dispersive spectrometer
An apparatus is configured to receive x-rays propagating from an x-ray source. The apparatus includes first and second x-ray diffractors, the second x-ray diffractor downstream from the first x-ray diffractor and first and second x-ray detectors. The first x-ray diffractor is configured to receive the x-rays, to diffract a first spectral band of the x-rays to the first x-ray detector, and to transmit at least 2% of the received x-rays to the second x-ray diffractor. The second x-ray diffractor is configured to receive the transmitted x-rays from the first x-ray diffractor and to diffract a second spectral band of the x-rays to the second x-ray detector. The first x-ray detector is configured to measure a first spectrum of the first spectral band of the x-rays and the second x-ray detector is configured to measure a second spectrum of the second spectral band of the x-rays.
Specimen radiography with tomosynthesis in a cabinet with geometric magnification
The aspects of the present disclosure are directed to a method and system for producing tomosynthesis images of a breast specimen with the capability of attaining images with geometric magnification. In one embodiment, an x-ray source delivers x-rays through a specimen of excised tissue and forms an image at a digital x-ray detector with the resultant image enlarging as the specimen is moved closer to the x-ray source. Multiple x-ray images are taken as the x-ray source moves relative to the stationary breast specimen. The source may travel substantially along a path while the detector remains stationary throughout and the source remains substantially equidistant from the specimen platform. The set of x-ray image data taken at the different points are combined to form a tomosynthesis image that can be viewed in different formats, alone or as an adjunct to conventional specimen radiography.
Inspection devices, inspection methods and inspection systems
The present disclosure discloses an inspection device, an inspection method and an inspection system. The device comprises a distributed ray source comprising multiple source points; a light source collimator configured to converge the rays generated by the distributed ray source to form an inverted fan-shaped ray beam; a scatter collimator configured to only allow rays scattered at one or more particular scattering angles which are generated by the rays from the light source collimator interacting with inspected objects to pass; at least one detector each comprising multiple detection units which have an energy resolution capability and are substantially arranged in a cylindrical surface to receive the scattered rays passing through the scatter collimator; and a processing apparatus configured to calculate energy spectrum information of the scattered rays from the inspected objects based on a signal output by the detectors.
Devices and methods for sample characterization
Devices and methods for characterization of analyte mixtures are provided. Some methods described herein include performing enrichment steps on a device before expelling enriched analyte fractions from the device for subsequent analysis. Also included are devices for performing these enrichment steps.
X-ray sidescatter inspection of laminates
Systems and methods are provided for detecting gaps in composite parts. One method includes radiating a beam of x-rays in a firing direction towards surface of a multi-layer Carbon Fiber Reinforced Polymer (CFRP) part, acquiring data indicating intensity of sidescatter radiation received at an x-ray detector that extends along the CFRP part in the firing direction, and examining the acquired data for gaps at the CFRP part based on differences in intensity indicated by the data.