Patent classifications
G01N2223/60
METHOD OF ANALYZING STRUCTURE OF RESIN MATERIAL
A structure analysis method includes impregnating a resin material with a radiosensitizer. The resin material contains thermoplastic resin. The radiosensitizer contains a solvent and a radiosensitizing molecule that contains, as a heavy element, an element with an atomic number equal to or greater than that of fluorine. A relative energy difference (RED.sub.1) represented by R.sub.a1/R.sub.01 is 1.8 or less in a case where R.sub.01 is the interaction radius of the thermoplastic resin in a Hansen space and R.sub.a1 is a distance between the Hansen solubility parameters of the thermoplastic resin and the solvent.
METHOD AND SYSTEM FOR HIGH SPEED DETECTION OF DIAMONDS
THIS INVENTION relates to a method of or system for detecting presence of diamond in an object. The method comprises receiving classification data associated with photons emitted from object as a result of positron annihilation due to irradiation of the object with photons of a predetermined energy at which giant dipole resonance (GDR) occurs due to a nuclear reaction between the photons and carbon. The method then comprises the step of determining whether or not the object is potentially a diamond or diamondiferous by processing the received classification data with a trained machine-based learning classifier. The system typically implements the method described herein.
Method for evaluating quality of SiC single crystal body and method for producing silicon carbide single crystal ingot using the same
A method for evaluating the quality of a SiC single crystal by a non-destructive and simple method; and a method for producing a SiC single crystal ingot with less dislocation and high quality with good reproducibility utilizing the same. The method for evaluating the quality of a SiC single crystal body is based on the graph of a second polynomial equation obtained by differentiating a first polynomial equation, the first polynomial equation approximating the relation between a peak shift value and a position of the measurement point and the peak shift value being obtained by an X-ray rocking curve measurement. The method for producing a SiC single crystal ingot manufactures a SiC single crystal ingot by a sublimation recrystallization method using, as a seed crystal, the SiC single crystal body evaluated by the evaluation method.
CROSSLINKED FLUOROPOLYMER RESIN AND CONTROL METHOD FOR SAME
A crosslinked fluoropolymer resin is configured to include a measuring step of irradiating a surface of the crosslinked fluoropolymer resin with a laser to measure a Raman spectrum, and an acceptance or rejection decision step of determining an acceptance or a rejection of a quality of a measurement region irradiated with the laser, on the basis of an intensity of a fluorescence spectrum relative to an intensity of a Raman scattering peak, which is ascribed to a CF.sub.2 stretching vibration, in the measured Raman spectrum.
Nondestructive inspection method and apparatus comprising a neutron source and a gamma-ray detection device for determining a depth of a target component in an inspection target
A nondestructive inspection apparatus makes a neutron beam incident on an inspection target, detects a specific gamma ray deriving from a target component in the inspection target, among gamma rays generated by the neutron beam, and determines a depth at which the target component exists, based on a result of the detecting. The nondestructive inspection apparatus includes a neutron source that emits a neutron beam to a surface of the inspection target, a gamma ray detection device that detects, as detection intensities, intensities of a plurality of types of specific gamma rays whose energy differs from each other, and a ratio calculation unit that determines a ratio between the detection intensities of a plurality of types of the specific gamma rays.
DEVICE, SYSTEM AND METHOD FOR X-RAY DIFFRACTION ANALYSIS OF AN ELECTRODE OF AN ELECTROCHEMICAL CELL, AT OPERATING TEMPERATURE AND UNDER CURRENT
A device keeps an electrochemical cell under current and at operating temperature during an X-ray beam diffraction analysis of a first electrode, the cell comprising a solid electrolyte interposed between the electrodes. The device comprises: first and second interconnectors having contact faces contacting the electrodes, which allow a gas flow and exchange between the interconnectors and the electrodes. The contact face of the first interconnector allows an X-ray beam to pass to the first electrode. A thermal and atmospheric containment chamber has an inner cavity housing a stack formed from the cell between the interconnectors and a cover closing the cavity, provided with a window allowing X-rays to pass through, the first interconnector being intended to be arranged facing the cover. The contact face of each interconnector is a slotted element; slotted portions of the slotted element are uniformly arranged and form 30% to 80% of the element's surface area.
NON-DESTRUCTIVE INSPECTION METHOD
The non-destructive inspection method includes: a water absorbing or drying step of changing a water-content state of a test piece; a transmission image capturing step of irradiating, with a radiation, the test piece absorbed water or dried for a predetermined time in the water absorbing or drying step and capturing a transmission image created by visualizing the radiation transmitted through the test piece; and an evaluation step of evaluating the test piece on the basis of the water-content state of the test piece determined from the transmission image captured in the transmission image capturing step.
X-ray fluorescence analysis method, X-ray fluorescence analysis program, and X-ray fluorescence spectrometer
An X-ray fluorescence analysis method according to an FP method uses a predefined theoretical intensity formula in a standard sample theoretical intensity calculation step for obtaining a sensitivity constant and in an unknown sample theoretical intensity calculation step during iterative calculation. In the formula, only in an absorption term relating to absorption of X-rays, a mass fraction of each component is normalized so that a sum of the mass fractions of all components becomes 1.
Degree-of-crystallinity measurement apparatus, degree-of-crystallinity measurement method, and information storage medium
A measured pattern acquisition unit acquires a measured X-ray scattering pattern of a sample containing a target substance and another known mixed substance. A known pattern acquisition unit acquires a known X-ray scattering pattern of the other known mixed substance. A crystalline pattern acquisition unit at least partially acquires an X-ray diffraction pattern of a crystalline portion included in the target substance. A crystalline integrated intensity calculation unit calculates an integrated intensity for the acquired X-ray diffraction pattern of the crystalline portion. A target substance integrated intensity calculation unit calculates an integrated intensity for an X-ray scattering pattern of the target substance. A degree-of-crystallinity calculation unit calculates a degree of crystallinity of the target substance based on the integrated intensity for the X-ray diffraction pattern of the crystalline portion and the integrated intensity for the X-ray scattering pattern of the target substance.
NONDESTRUCTIVE INSPECTION METHOD AND APPARATUS
A nondestructive inspection apparatus makes a neutron beam incident on an inspection target, detects a specific gamma ray deriving from a target component in the inspection target, among gamma rays generated by the neutron beam, and determines a depth at which the target component exists, based on a result of the detecting. The nondestructive inspection apparatus includes a neutron source that emits a neutron beam to a surface of the inspection target, a gamma ray detection device that detects, as detection intensities, intensities of a plurality of types of specific gamma rays whose energy differs from each other, and a ratio calculation unit that determines a ratio between the detection intensities of a plurality of types of the specific gamma rays.