The present invention provides deterioration analysis method which allows a detailed analysis of deterioration, especially deterioration of surface conditions, of a polymer material. The present invention relates to a deterioration analysis method, including irradiating a polymer material with high intensity X-rays, and measuring X-ray absorption while varying the energy of the X-rays, to analyze deterioration of the polymer.

A method of quantitatively analyzing a carbon based hybrid negative electrode including the steps of preparing a secondary battery including a carbon based hybrid negative electrode, where the carbon based hybrid negative electrode comprises a carbon based negative electrode active material and a non-carbon based negative electrode active material, measuring a lattice d-spacing of the carbon based negative electrode active material in the carbon based hybrid negative electrode during charging/discharging of the secondary battery using an X-ray diffractometer and then plotting a graph of a change in lattice d-spacing value as a function of charge/discharge capacity, detecting an inflection point of a slope of the graph during discharging; and then, quantifying capacity contribution of the carbon based negative electrode active material and the non-carbon based negative electrode active material in the total discharge capacity of the secondary battery by the inflection point of the slope of the graph.

The present invention provides deterioration analysis method which allows a detailed analysis of deterioration, especially deterioration of surface conditions, of a polymer material. The present invention relates to a deterioration analysis method, including irradiating a polymer material with high intensity X-rays, and measuring X-ray absorption while varying the energy of the X-rays, to analyze deterioration of the polymer.

The present invention provides deterioration analysis method which allows a detailed analysis of deterioration, especially deterioration of surface conditions, of a polymer material. The present invention relates to a deterioration analysis method, including irradiating a polymer material with high intensity X-rays, and measuring X-ray absorption while varying the energy of the X-rays, to analyze deterioration of the polymer.

An average diffraction intensity ratio (y=(h.sub.1, k.sub.1, l.sub.1)/(h.sub.2, k.sub.2, l.sub.2)) for a rotation angle () is obtained from a first diffraction chart and a second diffraction chart, and a surface temperature during deposition is calculated based on this average diffraction intensity ratio. Based on data on the surface temperature of a polycrystalline silicon rod calculated and supplied current and applied voltage during the deposition of the polycrystalline silicon rod, the supplied current and the applied voltage when newly manufacturing a polycrystalline silicon rod is controlled to control a surface temperature during the deposition process. By using such a temperature control method, it is also possible to control the difference T (=T.sub.cT.sub.s) between the center temperature T.sub.c and the surface temperature T.sub.s of a polycrystalline silicon rod during a deposition process to control the value of residual stress in the polycrystalline silicon rod.

A method of manufacturing a component including a metal alloy comprises measuring crystallographic texture of a volume of a component, determining a risk factor of the component for cold dwell fatigue failure, and adjusting metallurgical processing of the component based on the risk factor. Such risk analysis and mitigation may aid in improving the usage and operation of components including materials that are susceptible to cold dwell fatigue failure.

A method for identifying a foil position in a power storage device includes: analyzing the power storage device by X-ray CT analysis to obtain an X-ray absorbed amount at each position; acquiring an on-path X-ray absorbed amount at each on-path position on a specific imaginary line passing through an electrode sheet; and identifying a foil position of an electrode foil through which the specific imaginary line passes, based on the on-path X-ray absorbed amount. The foil position identifying includes fitting to determine an approximate curve that changes to fit a change in the on-path X-ray absorbed amount in a fitting region and generates a single peak in the fitting region, and estimating a foil position of a single electrode foil from the on-path position corresponding to the single peak of the determined approximate curve.

Method for preparing a crystal structure analysis sample for determining an absolute configuration of a chiral compound includes bringing a single crystal of a porous compound into contact with a solvent solution that contains a chiral compound, the single crystal of the porous compound including a three-dimensional framework, and either or both of pores and voids that are defined by the three-dimensional framework, and are three-dimensionally arranged in an ordered manner, the three-dimensional framework being formed by one molecular chain or two or more molecular chains, or formed by one molecular chain or two or more molecular chains, and a framework-forming compound, and comprising a chiral substituent of which the absolute configuration is known, the crystal structure analysis sample having a structure in which molecules of the chiral compound are arranged in either or both of the pores and the voids of the single crystal in an ordered manner.

An X-ray inspection device according to one embodiment of the present disclosure includes: an X-ray output portion irradiating X-rays to a battery including a cathode, a separator, and an anode in a stacking direction of the cathode and the anode; an X-ray detection portion acquiring a plurality of gray values based the X-rays that have transmitted through the battery; a signal processing portion acquiring an X-ray image including the plurality of gray values; and an inspection portion determining whether the battery is defective based on a distance between a first edge of an anode area including gray values representing the anode layer and a second edge of a cathode area including gray values representing the cathode layer in the X-ray image.

Provided is a degree-of-crystallinity measurement apparatus including: an X-ray scattering pattern acquisition module which acquires an X-ray scattering pattern of a sample including a crystalline portion and an amorphous portion of a target substance; a pattern decomposition module which acquires a diffraction pattern of the crystalline portion and a continuous pattern from the X-ray scattering pattern; a target substance intensity calculation module which calculates an integrated intensity of the target substance based on the X-ray scattering pattern and chemical formula information of the target substance; a target substance pattern calculation module which calculates, from the continuous pattern, a scattering pattern of the target substance including the crystalline portion and the amorphous portion; a structural disorder parameter determination module which determines a structural disorder parameter of the crystalline portion based on the diffraction pattern of the crystalline portion and the scattering pattern of the target substance; and a degree-of-crystallinity output module.