Patent classifications
G01Q60/60
SCANNING ELECTROCHEMICAL MICROSCOPY WITH OSCILLATING PROBE TIP
A new scanning electrochemical microscopy tip positioning method that allows topography and surface activity to be resolved independently is presented. A SECM tip is oscillated relative to the surface of interest. Changes in the oscillation amplitude, caused by the intermittent contact of the SECM tip with the surface of interest, are used to detect the surface of interest, and as a feedback signal for various types of imaging.
ULTRA-MICRO ELECTRODE FOR ELECTROCHEMICAL ANALYSIS AND METHOD OF MANUFACTURING THE SAME
An ultra-micro electrode that performs electrochemical analysis and a method of manufacturing the same is provided. The method includes preparing an insulating member having a capillary shape with a hollow region, preparing a conductive wire including a conductive material with an oxidation resistance greater than an oxidation resistance of copper, inserting the conductive wire into the hollow region of the insulating member, manufacturing half-finished products by applying heat and an external force to the insulating member having the conductive wire inserted therein to stretch the insulating member and the conductive wire so that a central portion of the insulating member is thin and the insulating member and the conductive wire are ruptured at central portions thereof, forming a groove by etching the conductive wire located on a ruptured surface of each half-finished product, and forming a filling layer by filling the groove with a conductive material by a plating process.
ULTRA-MICRO ELECTRODE FOR ELECTROCHEMICAL ANALYSIS AND METHOD OF MANUFACTURING THE SAME
An ultra-micro electrode that performs electrochemical analysis and a method of manufacturing the same is provided. The method includes preparing an insulating member having a capillary shape with a hollow region, preparing a conductive wire including a conductive material with an oxidation resistance greater than an oxidation resistance of copper, inserting the conductive wire into the hollow region of the insulating member, manufacturing half-finished products by applying heat and an external force to the insulating member having the conductive wire inserted therein to stretch the insulating member and the conductive wire so that a central portion of the insulating member is thin and the insulating member and the conductive wire are ruptured at central portions thereof, forming a groove by etching the conductive wire located on a ruptured surface of each half-finished product, and forming a filling layer by filling the groove with a conductive material by a plating process.
SCANNING ION CONDUCTANCE MICROSCOPY
A method for interrogating a surface of a sample bathed in electrolyte solution using SICM, comprising: controlling the potential between first and second electrodes bathed in the electrolyte solution to induce an ion current in the electrolyte solution, a submerged portion of the first electrode being contained within a micropipette and the second electrode being external to the micropipette; recording the ion current whilst controlling the micropipette to move with respect to a stage supporting the sample; and determining, from the ion current and calibration data, the surface height profile of the sample. Said potential can be controlled according to a spread spectrum modulated signal. Said micropipette motion can be according to an AC mode pattern having a modulation frequency greater than a resonant frequency of an assembly of the micropipette, first electrode and a first piezoelectric actuator configured to control z-axis motion of said micropipette.
SCANNING ION CONDUCTANCE MICROSCOPY
A method for interrogating a surface of a sample bathed in electrolyte solution using SICM, comprising: controlling the potential between first and second electrodes bathed in the electrolyte solution to induce an ion current in the electrolyte solution, a submerged portion of the first electrode being contained within a micropipette and the second electrode being external to the micropipette; recording the ion current whilst controlling the micropipette to move with respect to a stage supporting the sample; and determining, from the ion current and calibration data, the surface height profile of the sample. Said potential can be controlled according to a spread spectrum modulated signal. Said micropipette motion can be according to an AC mode pattern having a modulation frequency greater than a resonant frequency of an assembly of the micropipette, first electrode and a first piezoelectric actuator configured to control z-axis motion of said micropipette.
Electrochemical force microscopy
A system and method for electrochemical force microscopy are provided. The system and method are based on a multidimensional detection scheme that is sensitive to forces experienced by a biased electrode in a solution. The multidimensional approach allows separation of fast processes, such as double layer charging, and charge relaxation, and slow processes, such as diffusion and faradaic reactions, as well as capturing the bias dependence of the response. The time-resolved and bias measurements can also allow probing both linear (small bias range) and non-linear (large bias range) electrochemical regimes and potentially the de-convolution of charge dynamics and diffusion processes from steric effects and electrochemical reactivity.
Electrochemical force microscopy
A system and method for electrochemical force microscopy are provided. The system and method are based on a multidimensional detection scheme that is sensitive to forces experienced by a biased electrode in a solution. The multidimensional approach allows separation of fast processes, such as double layer charging, and charge relaxation, and slow processes, such as diffusion and faradaic reactions, as well as capturing the bias dependence of the response. The time-resolved and bias measurements can also allow probing both linear (small bias range) and non-linear (large bias range) electrochemical regimes and potentially the de-convolution of charge dynamics and diffusion processes from steric effects and electrochemical reactivity.
Use of scanning electrochemical microscopy as a predictive technique in a salt fog corrosion test
The use of the scanning electrochemical microscopy to predict the corrosion resistance results which would be obtained for a surface S1 having undergone an anticorrosion treatment if the surface S1 was subjected to a salt fog corrosion test, which use comprises an analysis of the surface S1 by scanning electrochemical microscopy.
Use of scanning electrochemical microscopy as a predictive technique in a salt fog corrosion test
The use of the scanning electrochemical microscopy to predict the corrosion resistance results which would be obtained for a surface S1 having undergone an anticorrosion treatment if the surface S1 was subjected to a salt fog corrosion test, which use comprises an analysis of the surface S1 by scanning electrochemical microscopy.
ULTRA-MICRO ELECTRODE USING LOW MELTING POINT METAL AND MANUFACTURING METHOD THEREOF
Poposed is an ultra-micro electrode using a low melting point metal and a method of manufacturing the same. The method includes preparing an insulating member having a hollow portion formed in a longitudinal direction, filling a metal in a liquid state having a melting point of 25 to 400 C. into the hollow portion of the insulating member, cooling to solidify the metal filled in the hollow portion of the insulating member, and manufacturing the ultra-micro electrode by forming a neck in the insulating member and the metal and breaking a portion in which the neck is formed.