A device for microscopically precise positioning and guidance of a measurement or manipulation element in at least two spatial axes, comprising an outer base with side walls defining a base interior, and an xy-stage having side walls and mounting means for at least one measurement or manipulation element, the xy-stage being arranged inside of the base interior and being displaceable in an XY-plane relative to the outer base. The xy-stage is coupled to the outer base with bending elements, and with actuators designed for displacing the xy-stage relative to the outer base. The outer base is provided with at least one stiffening element rigidly connected to the side walls of the outer base, and/or that the xy-stage is provided with at least one stiffening element rigidly connected to the side walls of the xy-stage.

Articles and methods related to scanning probe microscopy probes are generally provided. A scanning probe microscopy probe may comprise a chip, a mechanical resonator attached to the chip, a tip attached to the mechanical resonator, and a handle attached to the chip. The handle may have a length of at least 5 mm and an average thickness of less than or equal to 500 microns. The probe may further comprise an insulating coating covering both the chip and the handle.

Articles and methods related to scanning probe microscopy probes are generally provided. A scanning probe microscopy probe may comprise a chip, a mechanical resonator attached to the chip, a tip attached to the mechanical resonator, and a handle attached to the chip. The handle may have a length of at least 5 mm and an average thickness of less than or equal to 500 microns. The probe may further comprise an insulating coating covering both the chip and the handle.

The invention provides a cantilever attachment fitting that makes it easy to attach a cantilever to a cantilever holder. The cantilever attachment fitting has an attachment platform of which the upper surface is to have a cantilever placed on, a pressing member for pressing the cantilever against the upper surface of the attachment platform, and a lifting mechanism for moving the pressing member upward from the upper surface of the attachment platform. The cantilever attachment fitting is further provided with: a sliding platform having a sliding surface for sliding the cantilever toward the attachment platform; a base for fixing the cantilever holder in the horizontal direction so that the attachment platform is in a predetermined location relative to the sliding platform; and a pressing unit for pressing downward the cantilever holder fixed to the base.

The invention provides a cantilever attachment fitting that makes it easy to attach a cantilever to a cantilever holder. The cantilever attachment fitting has an attachment platform of which the upper surface is to have a cantilever placed on, a pressing member for pressing the cantilever against the upper surface of the attachment platform, and a lifting mechanism for moving the pressing member upward from the upper surface of the attachment platform. The cantilever attachment fitting is further provided with: a sliding platform having a sliding surface for sliding the cantilever toward the attachment platform; a base for fixing the cantilever holder in the horizontal direction so that the attachment platform is in a predetermined location relative to the sliding platform; and a pressing unit for pressing downward the cantilever holder fixed to the base.

A numerically controlled rotary probe switching device based on an environment-controllable atomic force microscope (AFM) includes a cavity upper cover and a probe switching structure. The cavity upper cover is provided with an irregular rectangular boss, an inner groove, a rectangular optical window structure and a sealing flange structure. The irregular rectangular boss is provided with the rectangular optical window structure; a front end of the boss is provided with the sealing flange structure; and a lower portion of the boss is provided with an inner groove for accommodating the probe switching structure and a transition groove for matching with a linear movement of a sample carrier and a rotary switching of probes. The probe switching structure is configured inside the inner groove, and the probe switching structure is provided with at least one probe assembly.

A numerically controlled rotary probe switching device based on an environment-controllable atomic force microscope (AFM) includes a cavity upper cover and a probe switching structure. The cavity upper cover is provided with an irregular rectangular boss, an inner groove, a rectangular optical window structure and a sealing flange structure. The irregular rectangular boss is provided with the rectangular optical window structure; a front end of the boss is provided with the sealing flange structure; and a lower portion of the boss is provided with an inner groove for accommodating the probe switching structure and a transition groove for matching with a linear movement of a sample carrier and a rotary switching of probes. The probe switching structure is configured inside the inner groove, and the probe switching structure is provided with at least one probe assembly.

Aspects of the present disclosure pertain to a probe cassette for holding a probe, e.g. an atomic force microscopy, at a predefined holding position for automated pickup. The probe cassette comprises a main body 3 including a support face 1 for supporting the probe; and one or more physical confinement elements 50 formed or affixed along said support face, said one or more physical confinement elements providing a plurality of engagement faces disposed along a perimeter of the predefined holding position, said engagement faces extending in a direction out of the support face, so as to define a pocket 9 for holding the probe, wherein the pocket is dimensioned to restrict a lateral shift of the probe in any direction along the support face.

Aspects of the present disclosure pertain to a probe cassette for holding a probe, e.g. an atomic force microscopy, at a predefined holding position for automated pickup. The probe cassette comprises a main body 3 including a support face 1 for supporting the probe; and one or more physical confinement elements 50 formed or affixed along said support face, said one or more physical confinement elements providing a plurality of engagement faces disposed along a perimeter of the predefined holding position, said engagement faces extending in a direction out of the support face, so as to define a pocket 9 for holding the probe, wherein the pocket is dimensioned to restrict a lateral shift of the probe in any direction along the support face.

The invention is directed at a method of positioning a carrier on a flat surface using an positioning member, wherein the carrier comprises an upper part and a base which are connected to each other such as to be arranged remote from each other, wherein the positioning member is arranged between the base and the upper part such that the base is located at an opposite side of the positioning member with respect to the upper part of the carrier, the upper part resting on the positioning member prior to placing of the carrier onto the flat surface, wherein the upper part comprises three engagement elements, and wherein the positioning member comprises a support surface for receiving the three engagement elements of the upper part, said support surface including a plurality of sockets forming a kinematic mount for said three engagement elements, wherein the base comprises three landing elements, each landing element being associated with a respective one of the three engagement elements, and the method comprising the steps of: operating the positioning member for moving the carrier relative to the flat surface in a direction parallel thereto such as to position the carrier above a landing position; performing an action of placing the carrier on the flat surface at the landing position, said action of placing comprising: moving the base towards the flat surface until at least one of said landing elements is in contact with the flat surface and an associated engagement element of said engagement elements is released from the kinematic mount; continue said moving of the base relative to the flat surface until all landing elements are in contact with the flat surface; and continue said action of placing the carrier until all engagement elements are released from the kinematic mount.