A measuring device measures an electrical current and contains a light source for generating a polarized primary light signal for feeding into a Faraday sensor unit, and a detector for detecting a secondary light signal provided by the Faraday sensor unit and polarization-altered in relation to the primary light signal. An optical-electrical compensation element, by which the polarization alteration of the secondary light signal can be compensated via an opposite polarization alteration, and a measurement signal, according to the opposite polarization alteration, for the electrical current can be deduced. A method for measuring an electrical current by use of the measuring device is further disclosed.

A measuring device measures an electrical current and contains a light source for generating a polarized primary light signal for feeding into a Faraday sensor unit, and a detector for detecting a secondary light signal provided by the Faraday sensor unit and polarization-altered in relation to the primary light signal. An optical-electrical compensation element, by which the polarization alteration of the secondary light signal can be compensated via an opposite polarization alteration, and a measurement signal, according to the opposite polarization alteration, for the electrical current can be deduced. A method for measuring an electrical current by use of the measuring device is further disclosed.

A shunt resistor capable of reducing an absolute value of a temperature coefficient of resistance is disclosed. The shunt resistor includes: a base structure including a resistance element and a pair of electrodes; a bridge structure configured to bridge the pair of electrodes and made of a conductor; and connections configured to couple the pair of electrodes to the bridge structure. The bridge structure has a higher resistance than a resistance of the base structure at the connections.

A multi-frequency programmable and remotely controllable variable attenuator and phase shifter (MF-VAPS) network utilizes wideband three port circulators, power combiners, high-low pass filters and a calibrated multi-harmonic tuner to control the amplitude and phase of the transmission factor (A21) at up to three user defined frequencies individually. The harmonic signal components are divided in frequency bands and injected into the circulator's port 1 and extracted from port 3, whereas the tuner is connected to port 2 and terminated with Zo. When the tuner is initialized (S11=0) the transmission factor of the network is zero; when the tuner is at maximum reflection at any frequency the transmission factor is also maximum. Changing the reflection phase of the tuner controls the transmission phase <A21 by the same amount, up to 360°.

A multi-frequency programmable and remotely controllable variable attenuator and phase shifter (MF-VAPS) network utilizes wideband three port circulators, power combiners, high-low pass filters and a calibrated multi-harmonic tuner to control the amplitude and phase of the transmission factor (A21) at up to three user defined frequencies individually. The harmonic signal components are divided in frequency bands and injected into the circulator's port 1 and extracted from port 3, whereas the tuner is connected to port 2 and terminated with Zo. When the tuner is initialized (S11=0) the transmission factor of the network is zero; when the tuner is at maximum reflection at any frequency the transmission factor is also maximum. Changing the reflection phase of the tuner controls the transmission phase <A21 by the same amount, up to 360°.

The probe assembly operates with a circuit board test apparatus and includes a main test probe and a secondary test probes. The probe assembly is capable of moving in X, Y and Z directions relative to a circuit board being tested (UUT). The two test probes are movable linearly relative to each other and rotatable together so as to accurately locate the two probes on selected pins on the UUT, for receiving signals from the selected pins, The received signals are transmitted to a display apparatus.

In accordance with an embodiment, an integrated circuit chip includes a first input configured to receive a rectified potential and a second input configured to receive a reference potential; a first circuit configured to maintain the rectified potential at a constant value on the first input; a second circuit having a power supply input coupled to the first node; a first resistor series-connected to the first circuit between the second input and the first node, or connected between the first input and the first node; a third circuit connected across the first resistor and configured to deliver a signal which is an image of a current in the first resistor; and a fourth circuit configured to determine a mains frequency and/or a mains voltage based at least on the signal which is the image of the current in the first resistor.

A test fixture for PCB components is described herein. The test fixture comprises a shim with an aperture configured to direct RF energy from a component of a PCB, via an end of the PCB, and to a top clamp of the test fixture. The end of the PCB may correspond to a cut line of a destructive test. The test fixture also comprises the top clamp with a test port and a taper configured to direct the RF energy from the aperture to the test port. The test fixture also comprises a bottom clamp attached to the top clamp to retain the PCB between the top and bottom clamps for testing. The test fixture allows for quick mounting of the PCB and testing of the component without modifying a design of the PCB or requiring specific drilling of the PCB.

Systems and methods for sense resistors are disclosed. In one aspect, an integrated sense resistor includes a plurality of first metal bumps alternating with a plurality of second metal bumps in at least a first lateral direction and a plurality of thin film resistors each disposed between and electrically connected to a pair of adjacent ones of first and second metal bumps. The integrated sense resistor can be configured for sensing a voltage developed by current flowing across the integrated sense resistor for determining a value of the current.

The invention relates to a current-sensing resistor for measuring an electric current (I), comprising two connection parts, a resistor element, a pair of voltage-sensing contacts for measuring a voltage drop across the resistor element, and at least one incision in at least one of the connection parts the incision surrounding one of the voltage-sensing contacts and preventing current flow across the incision. The invention provides for multiple pairs of voltage sensing contacts to be arranged in series in the direction of current flow.