Provided is an identification method for use in an identification apparatus that identifies types of brushless DC motors. Each brushless DC motor includes a circuit board on which at least one terminal with a pull-up resistance incorporated therein is mounted. The pull-up resistances vary among multiple types of brushless DC motors. A power supply voltage is supplied from the identification apparatus to a brushless DC motor, a pull-up voltage value set by the pull-up resistance and outputted from the at least one terminal of the brushless DC motor is inputted to the identification apparatus, and the identification apparatus identifies the type of the brushless DC motor based on the pull-up voltage value.

A generator waveform is measured using one or more techniques that reduce the computing resources for measuring the generator waveform and the time required for measuring the generator waveform. One example includes a template matching technique that iteratively selects templates to estimate the phase offset of the generator waveform. One example includes a root mean squared value calculated from less than sample time period that is less than one half of a cycle of the generator waveform. A generator controller calculates a command or parameter for the generator based on the estimated phase offset or the root mean squared value.

A generator waveform is measured using one or more techniques that reduce the computing resources for measuring the generator waveform and the time required for measuring the generator waveform. One example includes a template matching technique that iteratively selects templates to estimate the phase offset of the generator waveform. One example includes a root mean squared value calculated from less than sample time period that is less than one half of a cycle of the generator waveform. A generator controller calculates a command or parameter for the generator based on the estimated phase offset or the root mean squared value.

A testing device includes a circuit board, a carrier, a probe pin, a main body, a shaft, a pressing portion and a resilient spiral spring. The carrier is used to hold a device under test (DUT). The probe pin is electrically connected to the circuit board and the DUT. The shaft is movably connected to the main body with a screwing rotation method. The pressing portion is connected to one end surface of the shaft. The resilient spiral spring is retractably coiled on the shaft, and one end of the resilient spiral spring being far away from the shaft extends in a transverse direction intersecting an axial direction of the shaft.

A mechanism is included for receiving a phase modulated optical signal. The phase modulated signal is modulated by a remote electrical test signal at a sensor head. A reference optical signal is also received. A phase difference between the phase modulated optical signal and the reference optical signal is then determined. The phase difference is employed to recover the remote electrical test signal from the sensor head. The phase difference may be determined by employing a phase modulator in a controller that tracks a phase modulator in the sensor head. The phase difference may also be determined by comparison of the signals in the complex signal domain.

A mechanism is included for receiving a phase modulated optical signal. The phase modulated signal is modulated by a remote electrical test signal at a sensor head. A reference optical signal is also received. A phase difference between the phase modulated optical signal and the reference optical signal is then determined. The phase difference is employed to recover the remote electrical test signal from the sensor head. The phase difference may be determined by employing a phase modulator in a controller that tracks a phase modulator in the sensor head. The phase difference may also be determined by comparison of the signals in the complex signal domain.

A generator waveform is measured using one or more techniques that reduce the computing resources for measuring the generator waveform and the time required for measuring the generator waveform. One example includes a template matching technique that iteratively selects templates to estimate the phase offset of the generator waveform. One example includes a root mean squared value calculated from less than sample time period that is less than one half of a cycle of the generator waveform. A generator controller calculates a command or parameter for the generator based on the estimated phase offset or the root mean squared value.

A generator waveform is measured using one or more techniques that reduce the computing resources for measuring the generator waveform and the time required for measuring the generator waveform. One example includes a template matching technique that iteratively selects templates to estimate the phase offset of the generator waveform. One example includes a root mean squared value calculated from less than sample time period that is less than one half of a cycle of the generator waveform. A generator controller calculates a command or parameter for the generator based on the estimated phase offset or the root mean squared value.

A linear voltage regulator is disclosed. The voltage regulator is configured and controlled such that its output current is substantially equal to the input current. A test system for measuring electrical current consumption of a device under test (DUT) is disclosed. The test system comprises a controller coupled to a power capacitor, a voltage regulator, and a switching circuit. The controller may be configured to: control the switching circuit to place the test system into a charging state to charge the power capacitor with the DC voltage source, at a first time point, control the switching circuit to place the test system into a measurement state such that the power capacitor provides the capacitor voltage to the voltage regulator, and at a second time point after the first time point, calculate electrical current provided by the power capacitor.

A linear voltage regulator is disclosed. The voltage regulator is configured and controlled such that its output current is substantially equal to the input current. A test system for measuring electrical current consumption of a device under test (DUT) is disclosed. The test system comprises a controller coupled to a power capacitor, a voltage regulator, and a switching circuit. The controller may be configured to: control the switching circuit to place the test system into a charging state to charge the power capacitor with the DC voltage source, at a first time point, control the switching circuit to place the test system into a measurement state such that the power capacitor provides the capacitor voltage to the voltage regulator, and at a second time point after the first time point, calculate electrical current provided by the power capacitor.