A meter case used with a utility meter is disclosed. The meter shell includes a plurality of snap fit joints assembled on the meter case arranged to engage a module cover to mount the module cover to the meter shell. The module cover further includes wire housing formed along an inner periphery of the module cover that houses a wire having a first end and a second end therein. A metal shield placed behind the meter shell is electrically coupled to a first connector. A terminal electrically connected to the metal shield is arranged to discharge current to ground. An electrical contact electrically coupled to the second end of the wire is arranged to engage the first connector to establish an electrical connection to the metal shield for the discharge to ground of electrostatic currents sensed by wire.

An electronic test equipment apparatus includes a power terminal configured to receive power, an interface for a device under test (DUT), at least one power transistor connected in series between the power terminal and the interface for the DUT, and a protection circuit. The protection circuit is configured to: switch on the at least one power transistor, to electrically connect the power terminal to the DUT through the interface as part of a test routine; and subsequently automatically switch off the at least one power transistor after a predetermined delay, to electrically disconnect the power terminal from the DUT regardless of whether the DUT passes or fails the test routine. A voltage clamp circuit for electronic test equipment and corresponding methods of testing devices using such electronic test equipment are also described.

An electronic test equipment apparatus includes a power terminal configured to receive power, an interface for a device under test (DUT), at least one power transistor connected in series between the power terminal and the interface for the DUT, and a protection circuit. The protection circuit is configured to: switch on the at least one power transistor, to electrically connect the power terminal to the DUT through the interface as part of a test routine; and subsequently automatically switch off the at least one power transistor after a predetermined delay, to electrically disconnect the power terminal from the DUT regardless of whether the DUT passes or fails the test routine. A voltage clamp circuit for electronic test equipment and corresponding methods of testing devices using such electronic test equipment are also described.

A circuit for measuring a battery cell voltage includes: a plurality of battery cells included in a battery stack; a device that measures a battery cell voltage; a protection circuit connected in parallel to each terminal of the device that measures the battery cell voltage; and an external power supply that applies power to the protection circuit.

A testing device and probe elements thereof are provided. The testing device includes a circuit substrate, a plurality of probe elements, a first housing and a second housing. The plurality of probe elements are independent of each other and arranged at fixed intervals. Each probe element comprises a body, a first contact section and a second contact section. The body is provided with a plurality of strip-shaped perforations, and the body includes a first lateral side and a second lateral side opposite to each other. The first contact section is connected to the first lateral side, and the second contact section is connected to the second lateral side. The extension direction of the first contact section relative to the body and the extension direction of the second contact section relative to the body are distinct from each other.

The present disclosure provides a system and method for providing electrostatic discharge protection. A probe card assembly is provided which is electrically connected to a plurality of input/output channels. The probe card assembly can be contacted with a secondary assembly having an interposer electrically connected to one or more wafers each wafer having a device under test. Voltage can be forced on ones of the plural input/output channels of the probe card assembly to slowly dissipate charges resident on the wafer to thereby provide electrostatic discharge protection. A socket assembly adaptable to accept a 3DIC package is also provided, the assembly having a loadboard assembly electrically connected to a plurality of input/output channels. Once the 3DIC package is placed within the socket assembly, voltage is forced on ones of the input/output channels to slowly dissipate charges resident on the 3DIC package to thereby provide electrostatic discharge protection.

The present disclosure provides a system and method for providing electrostatic discharge protection. A probe card assembly is provided which is electrically connected to a plurality of input/output channels. The probe card assembly can be contacted with a secondary assembly having an interposer electrically connected to one or more wafers each wafer having a device under test. Voltage can be forced on ones of the plural input/output channels of the probe card assembly to slowly dissipate charges resident on the wafer to thereby provide electrostatic discharge protection. A socket assembly adaptable to accept a 3DIC package is also provided, the assembly having a loadboard assembly electrically connected to a plurality of input/output channels. Once the 3DIC package is placed within the socket assembly, voltage is forced on ones of the input/output channels to slowly dissipate charges resident on the 3DIC package to thereby provide electrostatic discharge protection.

The present application discloses a method and device suitable to perform the method for operating Voltage Indication system (VIS) and partial discharge module (PD) for medium-voltage or high voltage apparatuses, comprising: monitoring, with the partial discharge-module (PD), provided in low-voltage section, whether partial discharge occurs within a dielectric of the high-voltage or medium-voltage apparatus or system, the partial discharge-module or VIS being electrically connected to a coupler provided in the medium-voltage or high-voltage apparatus; indicating with the Voltage Indication System (VIS), provided in a low-voltage portion, the presence of operating voltages in high-voltage or medium-voltage apparatus or system, Voltage Indication System (VIS) being electrically connected with partial discharge-module (PD) and deactivating by deactivation module connected to Voltage Indication System and partial discharge-module (PD) an optical display in the Voltage Indication System (VIS) during partial discharge measurements.

The present application discloses a method and device suitable to perform the method for operating Voltage Indication system (VIS) and partial discharge module (PD) for medium-voltage or high voltage apparatuses, comprising: monitoring, with the partial discharge-module (PD), provided in low-voltage section, whether partial discharge occurs within a dielectric of the high-voltage or medium-voltage apparatus or system, the partial discharge-module or VIS being electrically connected to a coupler provided in the medium-voltage or high-voltage apparatus; indicating with the Voltage Indication System (VIS), provided in a low-voltage portion, the presence of operating voltages in high-voltage or medium-voltage apparatus or system, Voltage Indication System (VIS) being electrically connected with partial discharge-module (PD) and deactivating by deactivation module connected to Voltage Indication System and partial discharge-module (PD) an optical display in the Voltage Indication System (VIS) during partial discharge measurements.

A detection and protection circuit includes: a comparator, six resistors, and two diodes. A first resistor is connected to a second resistor. The second resistor (30) is grounded. A positive input end, a negative input end, a power supply end, a ground end, and an output end of the comparator are connected to a third resistor, a fourth resistor, a power management device power supply pin, the ground, and a main controller. The other end of the third resistor is connected between the first resistor and the second resistor. The other end of the fourth resistor is connected to the first resistor. A first power supply is connected between the fourth resistor and the first resistor. A fifth resistor is connected to a sixth resistor. The sixth resistor (70) is grounded. The other end of the fifth resistor is connected to the main controller.