An energy supply for a test device includes an energy source configured to provide energy via an inductive element for use by test circuitry; and an energy recovery circuit electrically couplable to the energy source and configured to direct unused energy from the inductive element to the energy source.

An energy supply for a test device includes an energy source configured to provide energy via an inductive element for use by test circuitry; and an energy recovery circuit electrically couplable to the energy source and configured to direct unused energy from the inductive element to the energy source.

An inrush current test device is adapted to receive an alternating current. The inrush current test device includes: a first isolation coupling component, a positive crossing point pulse generation circuit, an output circuit, and a control circuit. The first isolation coupling component includes a primary side and a secondary side, and is responsive to the alternating current on the primary side and conducts the secondary side. When the secondary side transits from an off state to an on state, the positive crossing point pulse generation circuit generates a positive crossing point pulse. When the control circuit is actuated and the positive crossing point pulse is detected, after delaying for a delay time, the control circuit outputs a control pulse for actuating the output circuit for a first operating time. The output circuit is configured to receive the alternating current and output the alternating current when the output circuit is actuated.

An inrush current test device is adapted to receive an alternating current. The inrush current test device includes: a first isolation coupling component, a positive crossing point pulse generation circuit, an output circuit, and a control circuit. The first isolation coupling component includes a primary side and a secondary side, and is responsive to the alternating current on the primary side and conducts the secondary side. When the secondary side transits from an off state to an on state, the positive crossing point pulse generation circuit generates a positive crossing point pulse. When the control circuit is actuated and the positive crossing point pulse is detected, after delaying for a delay time, the control circuit outputs a control pulse for actuating the output circuit for a first operating time. The output circuit is configured to receive the alternating current and output the alternating current when the output circuit is actuated.

A voltage testing system. The voltage testing system includes a pair of probes, each having a housing with a first end and a second end, wherein the pair of probes are electrically connected by a wire affixed to the first end of each of the pair of probes. A prong extends from the second end of the pair of probes, wherein a pin extends therethrough. The pin is electrically conductive, such that the pin is in communication with a fuse and a plurality of lights within the housing. The pin can be spring-biased such that a connection is formed between the fuse and the pin when the force is applied to the pin. The fuse can sever the electrical connection when a set current is transmitted through the fuse, such that a user is protected from excessive currents. The plurality of lights illuminate in response to receiving a preset voltage.

A voltage testing system. The voltage testing system includes a pair of probes, each having a housing with a first end and a second end, wherein the pair of probes are electrically connected by a wire affixed to the first end of each of the pair of probes. A prong extends from the second end of the pair of probes, wherein a pin extends therethrough. The pin is electrically conductive, such that the pin is in communication with a fuse and a plurality of lights within the housing. The pin can be spring-biased such that a connection is formed between the fuse and the pin when the force is applied to the pin. The fuse can sever the electrical connection when a set current is transmitted through the fuse, such that a user is protected from excessive currents. The plurality of lights illuminate in response to receiving a preset voltage.

A system and method of protecting measurement circuits from a potentially energized device under test (DUT). In one embodiment, the DUT is a capacitor that has acquired a charge though some means prior to needing to test it. In this embodiment, a circuit is provided that protects the measurement circuit by both limiting the current to the measurement circuit while simultaneously dissipating the energy stored in the DUT. In a further embodiment, a detection circuit is provided to measure the voltage at the terminal of the DUT. Only when the magnitude of the voltage is lower than a specific threshold will the measurement circuit be switched to and connected with the DUT.

An inrush current test device is adapted to receive an alternating current. The inrush current test device includes: a first isolation coupling component, a positive crossing point pulse generation circuit, an output circuit, and a control circuit. The first isolation coupling component includes a primary side and a secondary side, and is responsive to the alternating current on the primary side and conducts the secondary side. When the secondary side transits from an off state to an on state, the positive crossing point pulse generation circuit generates a positive crossing point pulse. When the control circuit is actuated and the positive crossing point pulse is detected, after delaying for a delay time, the control circuit outputs a control pulse for actuating the output circuit for a first operating time. The output circuit is configured to receive the alternating current and output the alternating current when the output circuit is actuated.

An inrush current test device is adapted to receive an alternating current. The inrush current test device includes: a first isolation coupling component, a positive crossing point pulse generation circuit, an output circuit, and a control circuit. The first isolation coupling component includes a primary side and a secondary side, and is responsive to the alternating current on the primary side and conducts the secondary side. When the secondary side transits from an off state to an on state, the positive crossing point pulse generation circuit generates a positive crossing point pulse. When the control circuit is actuated and the positive crossing point pulse is detected, after delaying for a delay time, the control circuit outputs a control pulse for actuating the output circuit for a first operating time. The output circuit is configured to receive the alternating current and output the alternating current when the output circuit is actuated.

An electronic test equipment apparatus includes a power terminal configured to receive power, an interface for a device under test (DUT), at least one power transistor connected in series between the power terminal and the interface for the DUT, and a protection circuit. The protection circuit is configured to: switch on the at least one power transistor, to electrically connect the power terminal to the DUT through the interface as part of a test routine; and subsequently automatically switch off the at least one power transistor after a predetermined delay, to electrically disconnect the power terminal from the DUT regardless of whether the DUT passes or fails the test routine. A voltage clamp circuit for electronic test equipment and corresponding methods of testing devices using such electronic test equipment are also described.