A probe station includes a base, a adaptor, a probe holder and a probe. The adaptor has a first portion and a second portion away from the first portion towards a first direction by a first length. The first portion connects to the base. A probe holder connects to the second portion and extends towards a second direction opposite to the first direction by a second length. The probe connects to an end of the probe holder away from the second portion and extends towards the second direction by a third length. A product of a thermal coefficient of the adaptor and the first length is equal to a sum of a product of a thermal coefficient of the probe holder and the second length and a product of a thermal coefficient of the probe and the third length.

A probe station includes a base, a adaptor, a probe holder and a probe. The adaptor has a first portion and a second portion away from the first portion towards a first direction by a first length. The first portion connects to the base. A probe holder connects to the second portion and extends towards a second direction opposite to the first direction by a second length. The probe connects to an end of the probe holder away from the second portion and extends towards the second direction by a third length. A product of a thermal coefficient of the adaptor and the first length is equal to a sum of a product of a thermal coefficient of the probe holder and the second length and a product of a thermal coefficient of the probe and the third length.

A device includes a first oscillator, a second oscillator and a frequency comparison block. The first oscillator includes a first LC tank circuit and is designed to generate first sustained oscillations at a first resonant frequency. The second oscillator includes a second LC tank circuit and is designed to generate second sustained oscillations at a second resonant frequency. The frequency comparison block is designed to perform a comparison of the frequencies of the second sustained oscillations and the first sustained oscillations to determine a change in inductance in one of a first inductor of the first LC tank circuit and a second inductor of the second LC tank circuit. One of the oscillators serves as a reference oscillator, and enables determination of the change in inductance to be immune to changes in environmental conditions.

A device includes a first oscillator, a second oscillator and a frequency comparison block. The first oscillator includes a first LC tank circuit and is designed to generate first sustained oscillations at a first resonant frequency. The second oscillator includes a second LC tank circuit and is designed to generate second sustained oscillations at a second resonant frequency. The frequency comparison block is designed to perform a comparison of the frequencies of the second sustained oscillations and the first sustained oscillations to determine a change in inductance in one of a first inductor of the first LC tank circuit and a second inductor of the second LC tank circuit. One of the oscillators serves as a reference oscillator, and enables determination of the change in inductance to be immune to changes in environmental conditions.

An apparatus is provided, comprising: a plurality of terminals for coupling the apparatus to a sensing bridge; a switching circuitry that is coupled to at least one of the plurality of terminals; and a processing circuitry that is configured to: cause the switching circuitry to couple the plurality of terminals to a voltage source, a ground source, and the processing circuitry in accordance with a first connection profile; detect a failure of the sensing bridge or a connection between the sensing bridge and any of the plurality of terminals; select a second connection profile based on a type of the failure; and cause the switching circuitry to couple the plurality of terminals to the voltage source, the ground source, and the processing circuitry in accordance with the second connection profile.

An apparatus is provided, comprising: a plurality of terminals for coupling the apparatus to a sensing bridge; a switching circuitry that is coupled to at least one of the plurality of terminals; and a processing circuitry that is configured to: cause the switching circuitry to couple the plurality of terminals to a voltage source, a ground source, and the processing circuitry in accordance with a first connection profile; detect a failure of the sensing bridge or a connection between the sensing bridge and any of the plurality of terminals; select a second connection profile based on a type of the failure; and cause the switching circuitry to couple the plurality of terminals to the voltage source, the ground source, and the processing circuitry in accordance with the second connection profile.

A current sensor includes a battery terminal portion that is conductive and is fastened to a battery post; a shunt resistor for current detection, which is formed in a plate shape and is electrically connected to the battery terminal portion; and a circuit board that is formed in a plate shape and is electrically connected to the shunt resistor, in which the shunt resistor is erected on a main surface of the circuit board. With this configuration, since the shunt resistor and the circuit board can be arranged so as not to face each other and not confront each other, the influence of heat generated by the shunt resistor can be suppressed.

The invention relates to a current sensor comprising an electric conductor (10), through which a first current (I) can flow parallel to a first direction (R1) and which comprises three regions (21, 22, 23) immediately following on from each other in the first direction (R1). A middle region (22) of the three regions (21, 22, 23) comprises a conductor cross-sectional area that is smaller than a conductor cross-sectional area of each of the two outer regions (21, 23) of the three regions (21, 22, 23). A voltage sensor of the current sensor is designed to measure a first voltage between the two terminals (41, 42) thereof. The first voltage is the same as a voltage applied to a measuring region (22, 25) at least partially coinciding with the middle region (22). An evaluation unit of the current sensor is designed to determine an existing current value of the first current (I) in accordance with an existing voltage value of the first voltage and a pre-defined resistance value of a first resistance of the measuring region (22, 25).

Disclosed is a test and measurement probe including a signal channel having an input series resistor with a series parasitic capacitance. The probe also includes an amplifier coupled to the signal channel. The amplifier includes a shunt parasitic capacitance. A variable shunt resistor is coupled to the signal channel and a ground. The variable shunt resistor can be set to match a resistance capacitance (RC) value associated with the series parasitic capacitance and the shunt. The probe can also include a variable series resistor coupled to the amplifier. The variable series resistor can be set to adjust for attenuation variation associated with the variable shunt resistor. Other embodiments may be described and/or claimed herein.

Disclosed is a test and measurement probe including a signal channel having an input series resistor with a series parasitic capacitance. The probe also includes an amplifier coupled to the signal channel. The amplifier includes a shunt parasitic capacitance. A variable shunt resistor is coupled to the signal channel and a ground. The variable shunt resistor can be set to match a resistance capacitance (RC) value associated with the series parasitic capacitance and the shunt. The probe can also include a variable series resistor coupled to the amplifier. The variable series resistor can be set to adjust for attenuation variation associated with the variable shunt resistor. Other embodiments may be described and/or claimed herein.