An automated test equipment comprises a tester control configured to broadcast and/or specific upload to matching module input data and/or device-specific data including keys and/or credentials and/or IDs and/or configuration information. The automated test equipment further comprises a channel processing unit configured to transform input data using device specific data in order to obtain device-under-test adapted data for testing the device under test. The channel processing unit further configured to process the DUT data using device specific data in order to evaluate the DUT data. A method and a computer program for testing one or more devices under test in an automated test equipment are also disclosed.

An apparatus for providing a test signal from a device under test (DUT) to a measurement instrument is disclosed. The apparatus includes a probe head configured to receive an electrical signal from the DUT. The probe head includes an electro-optic modulator. The apparatus also includes a control box, which includes an optical source. The optical source is configured to provide an input optical signal to the electro-optic modulator, which is configured to provide an output optical signal based on the electrical signal from the DUT. The control box also includes an optical bias control circuit. Only a bias control signal is provided to the electro-optic modulator.

A scheme for noise floor de-embedding by identifying a link or relationship between noise floor from an oscilloscope and phase jitter impact on a toggling signal. The scheme uses phase or electrical spectrum and phase detection for noise floor recognition. The scheme de-embeds the impact from random noise and also removes deterministic noise or jitter from the oscilloscope. The scheme provides accurate jitter analysis for a circuit (e.g., clock data recovery circuit) after de-embedding noise floor for the oscilloscope.

An information processing apparatus includes an extraction unit, a determination unit, a display control unit, and a display unit. The extraction unit is configured to extract, by predetermined pattern matching, candidate peaks in a certain arbitrary period of time from among at least one or more pieces of waveform data. The determination unit is configured to determine, from among the candidate peaks of the waveform data, a single peak based on a score related to the pattern matching. The display control unit is configured to output display information for displaying a position of the peak. The display unit is configured to display the display information.

A non-contact electric potential meter system to determine voltage between an AC conductor and a reference potential without direct electrical contact to the conductor. A housing provides a shielded measurement region that excludes other conductors and holds power supply means; an AC voltage sensing mechanism includes a conductive sense plate and an electrical connection to the reference potential. Waveform-sensing electronic circuitry obtains an AC voltage waveform induced by capacitive coupling between the conductor and the conductive sense plate. Capacitance-determining electronic circuitry obtains a scaling factor based on the coupling capacitance formed between the conductor and the conductive sense plate. Signal processing electronic circuitry uses the AC voltage waveform and the coupling capacitance-based scaling factor to obtain the voltage between the conductor and the reference potential.

A system maps and stores data in digital three-dimensional oscilloscope, wherein an ADC module has four ADC submodules. Four acquired waveform data are sent to an extraction module, and buffered in a FIFO module. When a trigger signal arrives, FIFO module outputs four extracted waveform data to a mapping address calculation module for calculating a mapping address and a RAM serial number for each point data, and the waveform data comparison and control module performs the reading and writing control of the 4×N dual port RAMs. When mapping number reaches a frame number, the RAM array module outputs its waveform probability values to the upper computer module to convert each value into RBG values, and the display module displays the waveforms of input signals of four channels on a screen according the RBG values.

A test and measurement device is described with at least one measurement channel, a measurement input, an analog to digital converter, and an acquisition unit. The test and measurement device has a trigger clock configured to generate repeated trigger clock timings, the trigger clock timings controlling the acquisition unit. In addition, a method for applying a trigger is described.

A waveform capture device (WCD) is a flexible measurement system capable of recording complex digital signals on trillionth-of-a-second (ps) time scales. The WCD may be implemented via modular code on an off-the-shelf field-programmable gate-array (FPGA), and incorporates both time-to-digital converter (TDC) and digital storage oscilloscope (DSO) functionality. The device captures a waveform by taking snapshots of a signal as it propagates down an ultra-fast transmission line known as a carry chain (CC). It may be calibrated via a dynamic phase-shifting (DPS) method that requires substantially less data and resources than conventional techniques.

A waveform capture device (WCD) is a flexible measurement system capable of recording complex digital signals on trillionth-of-a-second (ps) time scales. The WCD may be implemented via modular code on an off-the-shelf field-programmable gate-array (FPGA), and incorporates both time-to-digital converter (TDC) and digital storage oscilloscope (DSO) functionality. The device captures a waveform by taking snapshots of a signal as it propagates down an ultra-fast transmission line known as a carry chain (CC). It may be calibrated via a dynamic phase-shifting (DPS) method that requires substantially less data and resources than conventional techniques.

A method of providing signal level performance information with respect to an electronic component is described. The electronic component includes a signal input. An input signal is received at the signal input or immediately upstream of the signal input. At least one power level parameter is determined, wherein the power level parameter is indicative of a power level of the input signal received. A performance indicator is provided, which includes information on a performance of the electronic component in dependence of the at least one power level parameter. A signal level performance information is determined with respect to the electronic component based on the at least one determined power level parameter and based on the performance indicator. Further, a monitoring system is described.