A test and measurement system is disclosed that includes an input for receiving a digital bus conducting a plurality of digital values, a display, and a memory. The memory stores hit frequencies for the digital values, and stores data indicating the digital values. The test and measurement system also includes at least one processor coupled to the display and the memory. The processor causes the display to depict the digital values and hit frequencies of the digital values by depicting persistence of the digital values over time and by depicting decay of the digital values over time.

Methodologies and systems are described herein whereby performance parameters of a power converter may be tested. In one or more embodiments, a system for testing the performance parameters comprises a multi-channel monitoring device including a first channel for monitoring a switch voltage of a power converter and a second channel for concurrently monitoring an output voltage of the power converter. The system further comprises a set of one or more processors for generating, as a function of the switch voltage and the output voltage, and displaying an inductor current waveform approximating current through an inductor of the power converter. Additionally or alternatively, other waveforms such as output current waveforms and inductor voltage waveforms, may be generated during testing of the power converter. An arbitrary wave generator may inject different signals during testing of the power converter.

An inductor current measurement probe apparatus and system are described herein. In an embodiment, a system comprises a probe interconnect including a first connector that couples to a positive terminal of the inductor and a second connector that couples to a negative terminal of the inductor. The system further comprises an RC filter that is coupled to the probe interconnect and that includes at least one resistor and at least one capacitor in an arrangement that converts a voltage of the inductor to a differential capacitor voltage. The system further comprises a differential active probe input circuitry including a positive terminal and a negative terminal that are coupled to the RC filter and arranged to convert the differential capacitor voltage to a single-ended capacitor voltage. In other embodiments, the RC filter may be coupled directly to the inductor. The system may further convert the capacitor voltage to inductor current.

An inductor current measurement probe apparatus and system are described herein. In an embodiment, a system comprises a probe interconnect including a first connector that couples to a positive terminal of the inductor and a second connector that couples to a negative terminal of the inductor. The system further comprises an RC filter that is coupled to the probe interconnect and that includes at least one resistor and at least one capacitor in an arrangement that converts a voltage of the inductor to a differential capacitor voltage. The system further comprises a differential active probe input circuitry including a positive terminal and a negative terminal that are coupled to the RC filter and arranged to convert the differential capacitor voltage to a single-ended capacitor voltage. In other embodiments, the RC filter may be coupled directly to the inductor. The system may further convert the capacitor voltage to inductor current.

The present invention provides a measuring device (1, 11) for measuring signals (2, 12), the measuring device (1, 11) comprising a data memory (4, 14) configured to store device data (5, 15) for the measuring device (1, 11), and a data interface (6, 16) connected to the data memory (4, 14) and configured to read the device data (5, 15) from the data memory (4, 14) and output at least a part of the read device data (5, 15) to an external memory device (7, 17) in a storage mode and to read device data (5, 15) from the external memory device (7, 17) and store the read device data (5, 15) in the data memory (4, 14) in a recovery mode. The present invention further provides a corresponding method for such a measuring device (1, 11).

A method and apparatus for providing variable analog to digital converter (ADC) resolution is described.

Methodologies and systems are described herein whereby the electrical performance of a device may be tested. In one or more embodiments, a system for testing the electrical performance comprises a monitoring device configured to perform a set of operations including concurrently monitoring at least three different test points of a device under test (DUT) and aggregating test data comprising signal information collected concurrently from at least three different test points of the DUT. In one or more embodiments, the system is configured to monitor at least three channels wherein at least one channel corresponds to a frequency range of less than 300 kHz and the phases of signals on at least three channels are different.

Methodologies and systems are described herein whereby the electrical performance of a device may be tested. In one or more embodiments, a system for testing the electrical performance comprises a monitoring device configured to perform a set of operations including concurrently monitoring at least three different test points of a device under test (DUT) and aggregating test data comprising signal information collected concurrently from at least three different test points of the DUT. In one or more embodiments, the system is configured to monitor at least three channels wherein at least one channel corresponds to a frequency range of less than 300 kHz and the phases of signals on at least three channels are different.

A test lead assembly includes a first test lead having a first cable extending between a distal end and a proximal end, a first test probe attached to the distal end and a first plug attached to the proximal end; a second test lead having a second cable extending between a distal end and a proximal end, a second test probe attached to the distal end, and a second plug attached to the proximal end; and a fastener member for repeatedly releasably engaging at least a portion of the first cable with at least a portion of the second cable along a length of the first and second cables. The test lead assembly and a measurement device incorporating the test lead assembly can avoid or at least reduce knotting of the test leads.

A test lead assembly includes a first test lead having a first cable extending between a distal end and a proximal end, a first test probe attached to the distal end and a first plug attached to the proximal end; a second test lead having a second cable extending between a distal end and a proximal end, a second test probe attached to the distal end, and a second plug attached to the proximal end; and a fastener member for repeatedly releasably engaging at least a portion of the first cable with at least a portion of the second cable along a length of the first and second cables. The test lead assembly and a measurement device incorporating the test lead assembly can avoid or at least reduce knotting of the test leads.