An inspection device improves accuracy characteristics of an (MRAM), the inspection device including a stage on which a MRAM element is fixed, and electromagnets generating a first magnetic field. A magnetic field having a component in a direction perpendicular to the stage is changeable from a first direction to a second direction according to a position on the stage. A second magnetic field in which a direction of a magnetic field component is parallel to the stage changes from a third direction to a fourth direction according to the position on the stage, an optical system illuminating the MRAM element with light including polarized light, and condensing reflected light from reflected illumination light from the MRAM element, and a detector detecting reflected light when the position of the MRAM element is changed, and when the position of the MRAM element in the second magnetic field is changed.

The invention involves a multimeter with automatic range selection capability, comprising a meter probe module and a phasing probe module. The modules establish exclusive communication by exchanging unique radio frequency identifiers via a wired interface, then communicate wirelessly while ignoring transmissions with non-matching identifiers. Each module includes measurement points and a range select module with signal conditioning networks providing different attenuation or gain. Microcontrollers automatically determine if measurements exceed current range thresholds and, when needed, set out-of-range flags, calculate appropriate new ranges, and command range switching. The phasing probe module embeds range metadata in transmitted data, enabling the meter probe module to rescale values to a common base before computing differential measurements. The meter probe module features both direct contact and non-contact proximity measurement capabilities, allowing safe measurement of electrical quantities. This coordinated range adjustment system ensures optimal measurement accuracy across changing conditions.