Patent classifications
G01R15/005
Methods and Apparatus For Frequency Effect Compensation In Magnetic Field Current Sensors
A current sensor is provided with one or more magnetic field sensing elements configured to generate a magnetic field signal indicative of a magnitude of a sensed magnetic field, wherein the sensed magnetic field is related to a magnitude and frequency of a current through a conductor. A signal path is responsive to the magnetic field signal and includes a compensator configured to apply a compensation factor to the magnetic field signal to generate a sensor output signal indicative of the magnitude of the current and substantially independent of a frequency of the current. The sensed magnetic field is related to the magnitude of the current by a coupling factor and the signal path is responsive to a characterization of the coupling factor over a range of frequencies of the current in order to determine the compensation factor to be applied.
Offset addition circuits for sense transistors
In examples, an apparatus for sensing current comprises a power transistor; a sense transistor coupled to the power transistor; and an offset addition circuit coupled to the power transistor and the sense transistor, the offset addition circuit comprising a first pair of transistors and a differential amplifier. The apparatus also comprises a cascode amplifier circuit coupled to the offset addition circuit, the cascode amplifier circuit comprising a second pair of transistors, and a gain trim circuit coupled to the cascode amplifier circuit, the gain trim circuit including another differential amplifier and a third transistor. The apparatus further includes an analog-to-digital converter (ADC) coupled to the gain trim circuit and storage coupled to the ADC.
System and method for current sense resistor compensation
Systems and methods are provided for compensating for parasitics in current measurements utilizing series current sense resistors. In one or more embodiments, the techniques include connecting a probe to a terminal of a circuit and a waveform measuring device. A waveform measuring device then acquires, through the probe, a voltage waveform. A virtual probe netlist is generated, where the netlist is descriptive of a series resistance and associated parasitics. A virtual probe processor converts, based on the virtual probe netlist, the voltage waveform to a current waveform representative of a current in the circuit.
Linearization circuit and method for linearizing a measurement signal
A disclosed linearization circuit includes a reference component, a charging and discharging controller, and a comparator circuit. The reference component has a non-linear dependence on current or voltage. The charging and discharging controller is configured to control alternating charging and discharging of the reference component. A voltage associated with the reference component forms a reference signal. The charging and discharging are controlled such that the reference signal has a periodic time dependence. The reference signal and a measurement signal are received by the comparator circuit. The comparator circuit is configured to generate and output a square-wave signal based on a reference time point during a charge-discharge cycle, and based on a result of a comparison of the reference signal with the measurement signal, such that the square-wave signal represents a linearized output signal. This disclosure further relates to a corresponding method.
RESISTANCE MEASURING DEVICE AND METHOD
A resistance measuring device includes an amplifying unit including an amplifier, a first and a second current supply unit, a voltage detection unit, and a controller. The controller controls the voltage detection unit to detect a first output voltage of an output terminal of the amplifier in a state where the current of the first current source flows in a forward direction to a measurement target resistor by controlling the first current supply unit, controls the voltage detection unit to detect a second output voltage of the output terminal of the amplifier in a state where the current of the second current source flows in a reverse direction to the measurement target resistor by controlling the second current supply unit, and calculates a resistance value of the measurement target resistor based on the detected first output voltage and the detected second output voltage.
CIRCUIT BOARD COMPRISING A RECTIFIER BRIDGE
Circuit board comprising a printed circuit comprising phase conductors, each of which is arranged so as to be connected to one phase of a multiphase line, the circuit board further comprising a rectifier bridge comprising phase diodes that are mounted on one and the same face of the printed circuit, the phase diodes comprising, for each phase conductor, one pair of phase diodes comprising a first phase diode having an anode that is connected to said phase conductor and a second phase diode having a cathode that is connected to said phase conductor, the pairs of phase diodes lying in succession along a positioning axis on the face of the printed circuit, the first phase diode and the second phase diode of each pair of phase diodes being positioned in parallel but inverted with respect to each other.
OFFSET ADDITION CIRCUITS FOR SENSE TRANSISTORS
In examples, an apparatus for sensing current comprises a power transistor; a sense transistor coupled to the power transistor; and an offset addition circuit coupled to the power transistor and the sense transistor, the offset addition circuit comprising a first pair of transistors and a differential amplifier. The apparatus also comprises a cascode amplifier circuit coupled to the offset addition circuit, the cascode amplifier circuit comprising a second pair of transistors, and a gain trim circuit coupled to the cascode amplifier circuit, the gain trim circuit including another differential amplifier and a third transistor. The apparatus further includes an analog-to-digital converter (ADC) coupled to the gain trim circuit and storage coupled to the ADC.
VOLTAGE DETECTION CIRCUIT, SEMICONDUCTOR DEVICE, AND SEMICONDUCTOR DEVICE MANUFACTURING METHOD
A voltage detection circuit includes a resistance dividing circuit containing a coarse adjustment variable resistance circuit and a fine adjustment variable resistance circuit, a coarse adjustment circuit controlling the coarse adjustment variable resistance circuit, a fine adjustment circuit controlling the fine adjustment variable resistance circuit, and a control circuit controlling the coarse adjustment circuit and the fine adjustment circuit based upon a detection signal of a comparator circuit.
LINEARIZATION CIRCUIT AND METHOD FOR LINEARIZING A MEASUREMENT SIGNAL
A disclosed linearization circuit includes a reference component, a charging and discharging controller, and a comparator circuit. The reference component has a non-linear dependence on current or voltage. The charging and discharging controller is configured to control alternating charging and discharging of the reference component. A voltage associated with the reference component forms a reference signal. The charging and discharging are controlled such that the reference signal has a periodic time dependence. The reference signal and a measurement signal are received by the comparator circuit. The comparator circuit is configured to generate and output a square-wave signal based on a reference time point during a charge-discharge cycle, and based on a result of a comparison of the reference signal with the measurement signal, such that the square-wave signal represents a linearized output signal. This disclosure further relates to a corresponding method.
VOLTAGE DETECTION DEVICE
A voltage detection device is provided. The voltage detection device includes a first voltage divider circuit, a comparison circuit, and a second voltage divider circuit. The first voltage divider circuit is configured to receive an input voltage and output a comparison voltage according to the input voltage. The comparison circuit is configured to receive the comparison voltage to compare the comparison voltage with a reference voltage and determine whether to change a trigger signal according to a comparison result. The second voltage divider circuit is configured to receive the input voltage. When the input voltage is greater than or equal to a predetermined voltage value, the second voltage divider circuit and the first voltage dividing circuit form a parallel structure to pull down the comparison voltage.