A method and a photovoltaic inverter determines the system capacitance of a photovoltaic system relative to ground. The voltage required for the measurement can be provided by the intermediate circuit in the form of the intermediate circuit voltage, and the measuring device is designed to actuate an input short-circuit switch for short-circuiting the DC input with the AC disconnector open, as a result of which the intermediate circuit voltage can be applied to the DC input in the reverse direction, and the measuring device is configured to determine the system capacitance from the temporal waveform of the measured voltage after the switch of the voltage divider is closed.

A clamp-type AC voltage probe includes: a clamp portion that clamps a cable to be measured; an electrode disposed to be opposed to the cable clamped by the clamp portion; a parallel circuit in which a capacitor and a resistance are connected in parallel, and one end of which is connected to the electrode; a resistance one end of which is connected to the other end of the parallel circuit and the other end of which is connected to a circuit ground; a capacitor one end of which is connected to the other end of the parallel circuit and the other end of which is connected to the circuit ground; and an amplifier an input terminal of which is connected to the one end or the other end of the parallel circuit, and that amplifies and outputs a signal input into the input terminal.

Feed forward compensation of parasitic capacitance in a device frontend is provided. A feed forward element is positioned along at least a portion of a length of a first input resistance and a distance away from the first input resistance. In some implementations, the feed forward element has a width that is increasing along the at least a portion of the length of the first input resistance. The feed forward element is operative to introduce an element capacitance that offsets a parasitic capacitance in a volume surrounding the first input resistance.

Feed forward compensation of parasitic capacitance in a device frontend is provided. A feed forward element is positioned along at least a portion of a length of a first input resistance and a distance away from the first input resistance. In some implementations, the feed forward element has a width that is increasing along the at least a portion of the length of the first input resistance. The feed forward element is operative to introduce an element capacitance that offsets a parasitic capacitance in a volume surrounding the first input resistance.

An electronic device including a substrate on which an electronic component is mounted according to various embodiments may include: a first electromagnetic interference (EMI) shield configured to shield the electronic component included in a first region of the substrate; and a second EMI shield supported by at least a part of the first EMI shield and configured to shield the electronic component included in a second region of the substrate.

An electronic device including a substrate on which an electronic component is mounted according to various embodiments may include: a first electromagnetic interference (EMI) shield configured to shield the electronic component included in a first region of the substrate; and a second EMI shield supported by at least a part of the first EMI shield and configured to shield the electronic component included in a second region of the substrate.

A combiner lens system includes a lens and a lightguide in stack with the lens. The lightguide carries one or more electrically conductive traces. A detector circuit is electrically coupled to the one or more electrically conductive traces to form an electrical circuit. The detector circuit monitors the electrical circuit for an open circuit or a short circuit and generates an output signal that is indicative of a state of the electrical circuit.

A combiner lens system includes a lens and a lightguide in stack with the lens. The lightguide carries one or more electrically conductive traces. A detector circuit is electrically coupled to the one or more electrically conductive traces to form an electrical circuit. The detector circuit monitors the electrical circuit for an open circuit or a short circuit and generates an output signal that is indicative of a state of the electrical circuit.

The present application provides method and circuit for monitoring a voltage of a power supply, which adopts a divided voltage circuit to obtain a divided voltage from an input voltage of an input power source generated from the power supply, for detecting the input voltage according to the divided voltage by adopting a first detection circuit and a second detection circuit. Also, judging whether the divided voltage is clamped according to a clamp threshold value to determine the first detection circuit or the second detection circuit detecting a detection current and determine another detection circuit detecting the divided voltage. Hereby, the input voltage transmitted from a rectification circuit to the power supply is monitored, and the dependence between the two detection circuits is avoided.

The present application provides method and circuit for monitoring a voltage of a power supply, which adopts a divided voltage circuit to obtain a divided voltage from an input voltage of an input power source generated from the power supply, for detecting the input voltage according to the divided voltage by adopting a first detection circuit and a second detection circuit. Also, judging whether the divided voltage is clamped according to a clamp threshold value to determine the first detection circuit or the second detection circuit detecting a detection current and determine another detection circuit detecting the divided voltage. Hereby, the input voltage transmitted from a rectification circuit to the power supply is monitored, and the dependence between the two detection circuits is avoided.