Systems, methods, and a computer readable medium are provided herein for providing an indication of a connection terminal on a measurement device for use in performing a test of a target device. The system can include a target device and a measurement device. The measurement device can couple to the target device via a plurality of connection terminals to perform a test of the target device. The measurement device can receive an input identifying a test to be performed on the target device by the measurement device. The measurement device can determine, based on the received input, an indication identifying at least one connection terminal of the plurality of connection terminals to connect to the target device to perform the test. The measurement device can provide the indication of the at least one connection terminal via an indication mechanism associated with the at least one connection terminal.

This present invention relates to an electric testing assistance tool in the form a wire nut or electrical connector. The tool is a funnel shaped flame resistant and insulating device and has a top end and a bottom end with curved walls. The top end includes a central hole to receive a testing probe of a tester device. The device has an internal metal spiral thread connected to a metal ball connector. The metal spiral thread twistable about a plurality of wire end leads. The leads extending from the bottom end opening are connected to a target wiring whose electrical parameters and continuity is to be measured using the electric testing assistance tool. The testing probe can be inserted through the central hole to contact the metal ball to measure the electric parameters and continuity of the target wiring.

A testing system for evaluating the performance of an electrical/electronic UUT under dynamic operating conditions. The testing system includes a dynamic testing component (e.g., a centrifuge) for applying a stimulus to the UUT, and an iDAQ system configured to perform in situ data acquisition and real-time data analysis. The iDAQ system may also be subject to the stimulus. The iDAQ system includes a processor (e.g., an SoC) component, a power supply, a CR/I component, an IR component, and a single enclosure. The processor component may control the dynamic testing component, including varying in real-time the stimulus applied to the UUT. The processor component may include multiple input channels, and a high current/voltage subcomponent of the power supply may be configured to supply up to five hundred volts.

A testing system for evaluating the performance of an electrical/electronic UUT under dynamic operating conditions. The testing system includes a dynamic testing component (e.g., a centrifuge) for applying a stimulus to the UUT, and an iDAQ system configured to perform in situ data acquisition and real-time data analysis. The iDAQ system may also be subject to the stimulus. The iDAQ system includes a processor (e.g., an SoC) component, a power supply, a CR/I component, an IR component, and a single enclosure. The processor component may control the dynamic testing component, including varying in real-time the stimulus applied to the UUT. The processor component may include multiple input channels, and a high current/voltage subcomponent of the power supply may be configured to supply up to five hundred volts.

An electrical testing device includes a housing having a base and a cover. The base and the cover define a cavity. The electrical testing device includes an input connector and a plurality of output connectors in electrical communication with the input connector. A fuse is in electrical communication with the input connector and the plurality of output connectors. The input connector and each output connector of the plurality of output connectors is adapted to connect to an interchangeable test lead. The input connector and each output connector of the plurality of output connectors is in electrical communication with an activation mechanism.

A meter apparatus is provided for determining parameters of an AC electric signal in first and second wires, the AC signal including an AC electric current and an AC electric voltage, the apparatus including a measurement section to provide first and second measure signals each one indicative of the AC voltage based on a first capacitive coupling with the first wire and on a second capacitive coupling with the second wire, the first and second measure signals depending on capacitance values of the first and second capacitive couplings, and a control unit to determine said capacitance values of the first and second capacitive couplings according to the first and second measure signals, and determining the amplitude of the AC voltage according to the first or second measure signal, and to the capacitance values of the first and second capacitive couplings.

A meter apparatus is provided for determining parameters of an AC electric signal in first and second wires, the AC signal including an AC electric current and an AC electric voltage, the apparatus including a measurement section to provide first and second measure signals each one indicative of the AC voltage based on a first capacitive coupling with the first wire and on a second capacitive coupling with the second wire, the first and second measure signals depending on capacitance values of the first and second capacitive couplings, and a control unit to determine said capacitance values of the first and second capacitive couplings according to the first and second measure signals, and determining the amplitude of the AC voltage according to the first or second measure signal, and to the capacitance values of the first and second capacitive couplings.

A semiconductor component 150 has a semiconductor layer 1 including a winding wire part 10 and a winding return wire part 50 connected at a terminal end part of the winding wire part 10 and returning from the terminal end part toward a starting end part side, wherein the semiconductor component is disposed so as to surround an object to be measured.

A semiconductor component 150 has a semiconductor layer 1 including a winding wire part 10 and a winding return wire part 50 connected at a terminal end part of the winding wire part 10 and returning from the terminal end part toward a starting end part side, wherein the semiconductor component is disposed so as to surround an object to be measured.

Systems, methods, and a computer readable medium are provided herein for providing an indication of a connection terminal on a measurement device for use in performing a test of a target device. The system can include a target device and a measurement device. The measurement device can couple to the target device via a plurality of connection terminals to perform a test of the target device. The measurement device can receive an input identifying a test to be performed on the target device by the measurement device. The measurement device can determine, based on the received input, an indication identifying at least one connection terminal of the plurality of connection terminals to connect to the target device to perform the test. The measurement device can provide the indication of the at least one connection terminal via an indication mechanism associated with the at least one connection terminal.