G01R17/02

Systems and methods for calibrating a conducted electrical weapon

Systems and methods for calibrating a conducted electrical weapon (“CEW”) to provide a predetermined amount of current for each pulse of the stimulus signal. Providing the predetermined amount of current, close thereto, increases the effectiveness of the stimulus signal in impeding locomotion of a human or animal target. The calibration process enables a CEW to calibrate the amount of charge in a pulse of the stimulus signal in the environmental conditions where the tester operates and also in the field where the environmental conditions may be different from the environmental conditions during calibration.

Systems and methods for calibrating a conducted electrical weapon

Systems and methods for calibrating a conducted electrical weapon (“CEW”) to provide a predetermined amount of current for each pulse of the stimulus signal. Providing the predetermined amount of current, close thereto, increases the effectiveness of the stimulus signal in impeding locomotion of a human or animal target. The calibration process enables a CEW to calibrate the amount of charge in a pulse of the stimulus signal in the environmental conditions where the tester operates and also in the field where the environmental conditions may be different from the environmental conditions during calibration.

METHOD FOR DETECTING A VOLTAGE OFFSET AT LEAST IN A PORTION OF A VOLTAGE LAMBDA CHARACTERISTIC CURVE
20170322115 · 2017-11-09 ·

A method for a two-point lambda sensor includes, changing a composition of an air/fuel mixture supplied to an internal combustion engine from a predefined lambda value to lambda=1, determining a delay time of the voltage value reaching a value corresponding to the lambda=1, again changing the composition of the air/fuel mixture from the predefined lambda value to lambda=1, determining a characteristic of the changing performed in the second regulation based on the delay time, determining an actual value of lambda on an actual voltage-lambda characteristic curve of the two-point lambda sensor that corresponds to the predefined lambda value which is in reference to a reference voltage-lambda characteristic curve based on the determined characteristic, and identifying a voltage offset between the characteristic curves based on a deviation of the actual value from the predefined value.

METHOD FOR DETECTING A VOLTAGE OFFSET AT LEAST IN A PORTION OF A VOLTAGE LAMBDA CHARACTERISTIC CURVE
20170322115 · 2017-11-09 ·

A method for a two-point lambda sensor includes, changing a composition of an air/fuel mixture supplied to an internal combustion engine from a predefined lambda value to lambda=1, determining a delay time of the voltage value reaching a value corresponding to the lambda=1, again changing the composition of the air/fuel mixture from the predefined lambda value to lambda=1, determining a characteristic of the changing performed in the second regulation based on the delay time, determining an actual value of lambda on an actual voltage-lambda characteristic curve of the two-point lambda sensor that corresponds to the predefined lambda value which is in reference to a reference voltage-lambda characteristic curve based on the determined characteristic, and identifying a voltage offset between the characteristic curves based on a deviation of the actual value from the predefined value.

EXTENSION SENSOR AND REDUCTION OF A DRIFT OF A BRIDGE CIRCUIT CAUSED BY AN EXTENSION
20170261306 · 2017-09-14 ·

A circuit comprise a semiconductor substrate of an integrated circuit, comprising at least two resistors arranged in different orientations in, on or at the semiconductor substrate. The resistance value of the respective one of the resistors is substantially independent of an acting magnetic field. An output signal is determinable on the basis of a comparison of the resistance values of the resistors. Moreover, a circuit comprising a bridge circuit is specified, wherein the bridge circuit comprises at least two MR elements arranged on, at or in a substrate, comprising an extension sensor which provides a signal on the basis of a difference in mechanical extensions in two different directions parallel to a plane in which the two MR elements lie, wherein the circuit is configured to combine an output signal of the bridge circuit by means of the signal.

EXTENSION SENSOR AND REDUCTION OF A DRIFT OF A BRIDGE CIRCUIT CAUSED BY AN EXTENSION
20170261306 · 2017-09-14 ·

A circuit comprise a semiconductor substrate of an integrated circuit, comprising at least two resistors arranged in different orientations in, on or at the semiconductor substrate. The resistance value of the respective one of the resistors is substantially independent of an acting magnetic field. An output signal is determinable on the basis of a comparison of the resistance values of the resistors. Moreover, a circuit comprising a bridge circuit is specified, wherein the bridge circuit comprises at least two MR elements arranged on, at or in a substrate, comprising an extension sensor which provides a signal on the basis of a difference in mechanical extensions in two different directions parallel to a plane in which the two MR elements lie, wherein the circuit is configured to combine an output signal of the bridge circuit by means of the signal.

SELF-REFERENCED ON-DIE VOLTAGE DROOP DETECTOR
20170261537 · 2017-09-14 ·

A self-referenced on-die voltage droop detector generates a reference voltage from the supply voltage of an integrated circuit's power distribution network, and compares this reference voltage to the transient supply voltage in order to detect voltage droops. The detector responds to detected occurrences of voltage droop with low latency by virtue of being located on-die. Also, by generating the reference voltage from the integrated circuit's power domain rather than using a separate reference voltage source, the detector does not introduce noise and distortion associated with a separate power domain.

SELF-REFERENCED ON-DIE VOLTAGE DROOP DETECTOR
20170261537 · 2017-09-14 ·

A self-referenced on-die voltage droop detector generates a reference voltage from the supply voltage of an integrated circuit's power distribution network, and compares this reference voltage to the transient supply voltage in order to detect voltage droops. The detector responds to detected occurrences of voltage droop with low latency by virtue of being located on-die. Also, by generating the reference voltage from the integrated circuit's power domain rather than using a separate reference voltage source, the detector does not introduce noise and distortion associated with a separate power domain.

CIRCUIT ARRANGEMENT AND METHOD OF FORMING THE SAME
20220231674 · 2022-07-21 ·

Various embodiments may provide a circuit arrangement. The circuit arrangement may include an adjustable resistor bridge configured to receive a driving signal from an electronic device, and further configured to generate one or more intermediate signals based on the driving signal. The circuit arrangement may also include an amplifier stage configured to generate an amplified signal based on the one or more intermediate signals, and a scaler configured to generate an output signal based on the amplified signal. The adjustable resistor bridge may include at least one resistor of a first resistor type having a first coefficient of resistance with respect to an environmental condition, and at least one resistor of a second resistor type having a second coefficient of resistance with respect to the environmental condition different from the first coefficient. A resistance of the first resistor type may be adjustable by a resistor stage digital control signal.

FEEDBACK SYSTEM MONITORING
20220187423 · 2022-06-16 ·

The disclosure relates to monitoring of feedback systems such as phase lock loops. A system is disclosed, comprising: a feedback circuit (100); and a monitoring module (190). The monitoring module (190) is configured to: i) receive actual values of at least one state variable describing the state of the feedback circuit at a first time; ii) determine a predicted future value of the at least one state variable at a second time from the actual values at the first time using a model of the feedback circuit; iii) receive actual values of the at least one state variable at the second time; iv) compare the predicted future value of the at least one state variable at the second time with the actual value of the at least one state variable at the second time; and v) determine whether the feedback circuit has a fault condition, depending on the results of step iv).