G01R17/02

Droop detection

During normal operation of a processor, voltage droop is likely to occur and there is, therefore, a need for techniques for rapidly and accurately detecting this droop so as to reduce the probability of circuit timing failures. The droop detector described herein uses a tap sampled delay line in which a clock signal is split along two separate paths. Each of the taps in the paths are separated by two inverter delays such that the set of samples produced represent sample values of the clock signal that are each separated by a single inverter delay without inversion of the first clock signal between the samples.

Energy metering for a building
11293955 · 2022-04-05 · ·

A system for energy metering for a building, such as a data center.

Energy metering for a building
11293955 · 2022-04-05 · ·

A system for energy metering for a building, such as a data center.

Voltage sensitive current circuit

Aspects of the invention include a first voltage sensitive circuit including first transistors, the first transistors being coupled together so as to be operatively coupled to a first current source. A second voltage sensitive circuit includes second transistors, the second transistors being coupled together so as to be operatively coupled to a second current source, the first voltage sensitive circuit being coupled to the second voltage sensitive circuit to form a delay chain, the first and second current sources being responsive to changes in voltage of a power supply according to a voltage reference. A voltage sensitive current reference module is coupled to the first and second current sources and configured to supply the voltage reference to the first and second current sources, the voltage sensitive current reference module being responsive to changes in the voltage of the power supply.

Voltage sensitive current circuit

Aspects of the invention include a first voltage sensitive circuit including first transistors, the first transistors being coupled together so as to be operatively coupled to a first current source. A second voltage sensitive circuit includes second transistors, the second transistors being coupled together so as to be operatively coupled to a second current source, the first voltage sensitive circuit being coupled to the second voltage sensitive circuit to form a delay chain, the first and second current sources being responsive to changes in voltage of a power supply according to a voltage reference. A voltage sensitive current reference module is coupled to the first and second current sources and configured to supply the voltage reference to the first and second current sources, the voltage sensitive current reference module being responsive to changes in the voltage of the power supply.

Fast precision droop detector
11157028 · 2021-10-26 · ·

In one embodiment, a droop detector circuit, comprising: a reference oscillator; plural delay lines configured to receive signals from the reference oscillator; and logic configured to detect droop in a voltage regulator based on an output of the voltage regulator and outputs of each of the plural delay lines.

Fast precision droop detector
11157028 · 2021-10-26 · ·

In one embodiment, a droop detector circuit, comprising: a reference oscillator; plural delay lines configured to receive signals from the reference oscillator; and logic configured to detect droop in a voltage regulator based on an output of the voltage regulator and outputs of each of the plural delay lines.

Theft Detection and Prevention in a Power Generation System

A system for generation of electrical power including an inverter connected to a photovoltaic source including a theft prevention and detection feature. A first memory is permanently attached to the photovoltaic source. The first memory is configured to store a first code. A second memory is attached to the inverter. The second memory configured to store a second code. During manufacture or installation of the system, the first code is stored in the first memory attached to the photovoltaic source. The second code based on the first code is stored in the second memory. Prior to operation of the inverter, the first code is compared to the second code and based on the comparison; the generation of the electrical power is enabled or disabled.

Theft Detection and Prevention in a Power Generation System

A system for generation of electrical power including an inverter connected to a photovoltaic source including a theft prevention and detection feature. A first memory is permanently attached to the photovoltaic source. The first memory is configured to store a first code. A second memory is attached to the inverter. The second memory configured to store a second code. During manufacture or installation of the system, the first code is stored in the first memory attached to the photovoltaic source. The second code based on the first code is stored in the second memory. Prior to operation of the inverter, the first code is compared to the second code and based on the comparison; the generation of the electrical power is enabled or disabled.

Evaluating circuit, system, and method for evaluating a capacitive or inductive sensor
11112439 · 2021-09-07 · ·

An evaluation circuit, system, and method for evaluating a capacitive or inductive sensor includes first and second measurement connections to which sensors and/or reference elements are connected, first and second charging and discharging circuits that respectively output first and second charging and discharging signals to the first and second measurement connections. A comparator circuit compares the temporal behavior of the first and second charging and discharging signals. An integrator circuit produces an output voltage that changes as a function of the voltage at the output of the comparator circuit. The output voltage of the integrator circuit is connected to the first or second measurement connection to adjust the respective first or second charging and discharging signal. A measurement signal derived from the output voltage of the integrator circuit is a measure of impedance differences between the sensors or reference elements at the first and second measurement connections.