A method and apparatus to detect breaks in tracks and/or detect the presence of a vehicle, such as a train, in a monitored section of the track or rail. Embodiments of the present invention measure the change in track inductance associated with a track or rail break. Electrical shunts are connected between the rails at spaced-apart intervals (for example a shunt can be placed every mile). At least two different frequencies of alternating current are generated and fed into the segments of rail (for example at or near a mid-point between the shunts). If a rail break occurs, the total inductance of the rail at that segment will change. Using two or more frequencies allows a rail break to be differentiated from environmental rail-to-rail and rail-to-earth leakage.

A semiconductor device having a switch circuit and an integrated circuit. The switch circuit includes serially-connected first and second switching devices respectively on a power supply side and a ground side thereof, and first and second free-wheeling diodes connected respectively in parallel with the first and second switching devices. The integrated circuit performs switching of the second switching device, and including a detection circuit that detects a load current flowing through a load of the switch circuit, and a drive circuit that controls magnitude of a current flowing to the gate terminal of the second switching device, to thereby charge a gate capacitance of the second switching device according to a detection result of the detection circuit, when a received drive signal is at one logic level, and turns off the second switching device when the received drive signal is at another logic level.

An active discharge circuit discharges an X capacitor and includes a sensor circuit that generates a sensor signal indicative of an AC voltage at the X capacitor. A processing unit generates a reset signal as a function of a comparison signal. A comparator circuit generates the comparison signal by comparing the sensor signal with a threshold. A timer circuit sets a discharge enable signal to a first logic level when the timer circuit is reset via a reset signal. The timer circuit determines the time elapsed since the last reset and tests whether the time elapsed exceeds a given timeout value. If the time elapsed exceeds the given timeout value, the timer circuit sets the discharge enable signal to a second logic level. A dynamic threshold generator circuit varies the threshold of the comparator circuit as a function of the sensor signal.

An active discharge circuit discharges an X capacitor and includes a sensor circuit that generates a sensor signal indicative of an AC voltage at the X capacitor. A processing unit generates a reset signal as a function of a comparison signal. A comparator circuit generates the comparison signal by comparing the sensor signal with a threshold. A timer circuit sets a discharge enable signal to a first logic level when the timer circuit is reset via a reset signal. The timer circuit determines the time elapsed since the last reset and tests whether the time elapsed exceeds a given timeout value. If the time elapsed exceeds the given timeout value, the timer circuit sets the discharge enable signal to a second logic level. A dynamic threshold generator circuit varies the threshold of the comparator circuit as a function of the sensor signal.

An electronic envelope detection circuit includes an input signal detecting circuit having at least one MOS transistor configured to receive a radiofrequency input signal and to deliver an internal signal on the basis of the input signal. The biasing point of the at least one transistor is controlled by the input signal and a control signal. A processing circuit that is coupled to the input signal detecting circuit is configured to deliver a low-frequency output signal on the basis of the internal signal and further deliver the control signal on the basis of the output signal. In operation, the value of the control signal decreases when the average power of the input signal increases, and vice versa.

An electronic envelope detection circuit includes an input signal detecting circuit having at least one MOS transistor configured to receive a radiofrequency input signal and to deliver an internal signal on the basis of the input signal. The biasing point of the at least one transistor is controlled by the input signal and a control signal. A processing circuit that is coupled to the input signal detecting circuit is configured to deliver a low-frequency output signal on the basis of the internal signal and further deliver the control signal on the basis of the output signal. In operation, the value of the control signal decreases when the average power of the input signal increases, and vice versa.

A circuit includes a peak detector, a diode, a dynamic clamp circuit, and an offset correction circuit. The peak detector generates a voltage on the peak detector output proportional to a lowest voltage on the peak defector input. The anode of the diode is coupled to the peak detector input. The dynamic clamp circuit is coupled to the peak detector input and is configured to clamp a voltage on the peak detector input responsive to a voltage on the diode's anode being greater than the lowest voltage on the peak detector's input. The offset correction circuit is coupled to the peak detector output and is configured to generate an output signal whose amplitude is offset from an amplitude of the peak detector output.

A circuit includes a peak detector, a diode, a dynamic clamp circuit, and an offset correction circuit. The peak detector generates a voltage on the peak detector output proportional to a lowest voltage on the peak defector input. The anode of the diode is coupled to the peak detector input. The dynamic clamp circuit is coupled to the peak detector input and is configured to clamp a voltage on the peak detector input responsive to a voltage on the diode's anode being greater than the lowest voltage on the peak detector's input. The offset correction circuit is coupled to the peak detector output and is configured to generate an output signal whose amplitude is offset from an amplitude of the peak detector output.

A calibration circuit for calibrating a peak detector configured to detect a signal peak amplitude of an oscillator, including: a calibration oscillator configured to be supplied by at least two different supply voltages to generate respective calibration signals; a calibration peak detector configured to detect a calibration signal peak amplitude of each of the calibration signals; and a logic circuit configured to calibrate the peak detector based on the detected calibration signal peak amplitudes.

A calibration circuit for calibrating a peak detector configured to detect a signal peak amplitude of an oscillator, including: a calibration oscillator configured to be supplied by at least two different supply voltages to generate respective calibration signals; a calibration peak detector configured to detect a calibration signal peak amplitude of each of the calibration signals; and a logic circuit configured to calibrate the peak detector based on the detected calibration signal peak amplitudes.