A measurement circuit and a measurement method for measuring and updating a voltage resolution of an electronic atomizer circuit are provided. In the measurement circuit, a comparison unit is configured to compare a first preset value and a second preset value to obtain a voltage difference, an accumulation and subtraction unit is configured to perform counting according to a comparison result, and a control unit is configured to adjust the voltage difference between two compared voltage input terminals, thereby calculating a voltage resolution of the control unit, avoiding the impact of the actual error of the first constant current source and the unit resistor on the actual voltage resolution, and ensuring the measurement accuracy. In addition, an accurate to-be-measured voltage is calculated, and a measurement value of the to-be-measured voltage is corrected, to ensure the high measurement accuracy of the to-be-measured voltage and the output power.

A measurement circuit and a measurement method for measuring and updating a voltage resolution of an electronic atomizer circuit are provided. In the measurement circuit, a comparison unit is configured to compare a first preset value and a second preset value to obtain a voltage difference, an accumulation and subtraction unit is configured to perform counting according to a comparison result, and a control unit is configured to adjust the voltage difference between two compared voltage input terminals, thereby calculating a voltage resolution of the control unit, avoiding the impact of the actual error of the first constant current source and the unit resistor on the actual voltage resolution, and ensuring the measurement accuracy. In addition, an accurate to-be-measured voltage is calculated, and a measurement value of the to-be-measured voltage is corrected, to ensure the high measurement accuracy of the to-be-measured voltage and the output power.

A method for measuring the hardware and operational state of a dual-circuit solenoid valve including first and second coaxial coils each associated with a circuit is disclosed. The method includes the steps of injecting a sinusoidal current into the first coil; measuring the voltage induced across the terminals of the second coil; and plotting at least one curve of a first magnitude proportional to the measured induced voltage as a function of a second magnitude proportional to the injected sinusoidal current.

A method for measuring the hardware and operational state of a dual-circuit solenoid valve including first and second coaxial coils each associated with a circuit is disclosed. The method includes the steps of injecting a sinusoidal current into the first coil; measuring the voltage induced across the terminals of the second coil; and plotting at least one curve of a first magnitude proportional to the measured induced voltage as a function of a second magnitude proportional to the injected sinusoidal current.

Discussed is a contactor management method and a battery system to perform the method, wherein the battery system includes a contactor connected between a battery pack and an external device; a voltage measurer to measure a first operation voltage supplied to the contactor; and a controller to determine opening or closing of the contactor based on the first operation voltage measured from the voltage measurer, wherein the controller determines the contactor as open in an opened state when the first operation voltage is not supplied to the contactor, determines the contactor as closed in a closed state when the first operation voltage is supplied to the contactor, and counts each openings and closings of the contactor and determines a replacement time of the contactor based on a sum value of the counts exceeding a predetermined reference value.

Discussed is a contactor management method and a battery system to perform the method, wherein the battery system includes a contactor connected between a battery pack and an external device; a voltage measurer to measure a first operation voltage supplied to the contactor; and a controller to determine opening or closing of the contactor based on the first operation voltage measured from the voltage measurer, wherein the controller determines the contactor as open in an opened state when the first operation voltage is not supplied to the contactor, determines the contactor as closed in a closed state when the first operation voltage is supplied to the contactor, and counts each openings and closings of the contactor and determines a replacement time of the contactor based on a sum value of the counts exceeding a predetermined reference value.

In accordance with an embodiment, a controller to operate a temperature sensor comprising a transistor assembly is configured to: cause a generation of a first pair of bias currents comprising a first bias current and a second bias current for the transistor assembly; determine a first diode voltage difference of the transistor assembly corresponding to the first pair of bias currents; cause a generation of a second pair of bias currents comprising a third bias current and a fourth bias current for the transistor assembly; determine a second diode voltage difference for the transistor assembly corresponding to the second pair of bias currents; and compare the first diode voltage difference and the second diode voltage difference to determine at least one of functional information and performance information of the temperature sensor.

In accordance with an embodiment, a controller to operate a temperature sensor comprising a transistor assembly is configured to: cause a generation of a first pair of bias currents comprising a first bias current and a second bias current for the transistor assembly; determine a first diode voltage difference of the transistor assembly corresponding to the first pair of bias currents; cause a generation of a second pair of bias currents comprising a third bias current and a fourth bias current for the transistor assembly; determine a second diode voltage difference for the transistor assembly corresponding to the second pair of bias currents; and compare the first diode voltage difference and the second diode voltage difference to determine at least one of functional information and performance information of the temperature sensor.

Methods and devices are provided for determining whether a phase is faulted or one or more phases are open in capacitor bank system. Detecting open and faulted phases may include determining a neutral current of the capacitor bank system. An open-phase event and a fault event may be distinguished based on a magnitude of a neutral current within a first or a second predetermined range. According to one embodiment, an IED may calculate an aggregate power phasor for the phases of the capacitor bank system with respect to each rotation. According to another detection method, in response to the magnitude of the neutral current being greater than a threshold value, an IED may calculate an individual power phasor for each of the phases of the capacitor bank system with respect to each rotation. Based on the angles of the power phases, the IED may determine which phases may be faulted.

Methods and devices are provided for determining whether a phase is faulted or one or more phases are open in capacitor bank system. Detecting open and faulted phases may include determining a neutral current of the capacitor bank system. An open-phase event and a fault event may be distinguished based on a magnitude of a neutral current within a first or a second predetermined range. According to one embodiment, an IED may calculate an aggregate power phasor for the phases of the capacitor bank system with respect to each rotation. According to another detection method, in response to the magnitude of the neutral current being greater than a threshold value, an IED may calculate an individual power phasor for each of the phases of the capacitor bank system with respect to each rotation. Based on the angles of the power phases, the IED may determine which phases may be faulted.