The present disclosure relates to a current measuring transducer for measuring an electric current in an electrical conductor that can be arranged so as to extend through the current measuring transducer, comprising a housing base portion and a housing mating portion coupled to one another, wherein the electrical conductor can be arranged in a central through opening between the housing base portion and the housing mating portion, wherein the housing base portion comprises a first part of a probe ring and the housing mating portion comprises a second part thereof, and comprises at least two sensors for simultaneously measuring the electric current in the electrical conductor, and further comprises an evaluation device in the current measuring transducer for simultaneously evaluating sensor signals and for outputting a corrected output signal.

Semiconductor device includes an element region in which the semiconductor element is provided, a semiconductor substrate including an outer peripheral region surrounding the element region, a plurality of semiconductor elements provided in an array-like in the element region. The element region includes a main circuit region in which the main circuit of semiconductor device is formed, and a sense circuit region in which a sense circuit for measuring the drain current flowing through the semiconductor element of the main circuit region is formed. Semiconductor element of the sense circuit region is surrounded by other semiconductor elements. Sense circuit region is covered with a main circuit source electrode which is connected to the semiconductor element of the main circuit region.

Semiconductor device includes an element region in which the semiconductor element is provided, a semiconductor substrate including an outer peripheral region surrounding the element region, a plurality of semiconductor elements provided in an array-like in the element region. The element region includes a main circuit region in which the main circuit of semiconductor device is formed, and a sense circuit region in which a sense circuit for measuring the drain current flowing through the semiconductor element of the main circuit region is formed. Semiconductor element of the sense circuit region is surrounded by other semiconductor elements. Sense circuit region is covered with a main circuit source electrode which is connected to the semiconductor element of the main circuit region.

A heat-resistance element includes: a heat-resistant substrate including a ceramic material; one or more power wires embedded in the heat-resistant substrate; and a coil structure that is configured by a coil wire extending between start and end points and includes coil segments. The coil segment includes or corresponds to one winding of the coil wire. The coil segment includes: a first conductor extending along the power wire; a second conductor arranged farther from the one or more power wires than the first conductor, the second conductor extending along the power wire; a first connection wire coupling the first and second conductors in the same coil segment; and a second connection wire coupling first and second conductors of adjacent coil segments in the circumferential direction, all of which are embedded in the heat-resistant substrate, and at least the first conductor and the second conductor are not exposed from the heat-resistant substrate.

A heat-resistance element includes: a heat-resistant substrate including a ceramic material; one or more power wires embedded in the heat-resistant substrate; and a coil structure that is configured by a coil wire extending between start and end points and includes coil segments. The coil segment includes or corresponds to one winding of the coil wire. The coil segment includes: a first conductor extending along the power wire; a second conductor arranged farther from the one or more power wires than the first conductor, the second conductor extending along the power wire; a first connection wire coupling the first and second conductors in the same coil segment; and a second connection wire coupling first and second conductors of adjacent coil segments in the circumferential direction, all of which are embedded in the heat-resistant substrate, and at least the first conductor and the second conductor are not exposed from the heat-resistant substrate.

A passive current sensor includes a pair of electrically conductive busbars, a shunt resistor electrically connecting the busbars, and a carrier having a first pair of voltage drop measuring contacts. At least one of the voltage drop measuring contacts is attached to each of the busbars and forms a direct electrical contact between the at least one voltage drop measuring contact and the busbar.

A passive current sensor includes a pair of electrically conductive busbars, a shunt resistor electrically connecting the busbars, and a carrier having a first pair of voltage drop measuring contacts. At least one of the voltage drop measuring contacts is attached to each of the busbars and forms a direct electrical contact between the at least one voltage drop measuring contact and the busbar.

A current sensing circuit having self-calibration includes two leads, a sensing element having a sensing resistance, and a sensing and calibration circuit. The sensing and calibration circuit senses and calibrates a sensing voltage of the sensing element, and senses a sensing current through the sensing element according to the sensing resistance and the sensing voltage, to generate a current sensing output signal. The sensing and calibration circuit includes two pads, a V2I circuit, a current mirror circuit and an I2V circuit. The sensing element has a first temperature coefficient (TC). The TC and/or the resistance of an adjusting resistor in the V2I circuit and an adjusting resistor in the I2V circuit are determined according to the first TC, such that the TC of the current sensing output signal is equal to 0.

A method for calibrating a plurality of current sensors connected in series. The method include determining a temperature difference between the current sensors; sensing temperature values and current values of the respective current sensors at different temperatures and currents; calculating averaged current values of two current sensors based on the current measured values sensed by the respective current sensors; calculating a current regression area for the respective current sensors through measurement points that are dependent on the temperature of the respective current sensors and the deviation of the current values sensed by the respective current sensors relative to one another; and calculating a TCR regression curve or a TCR regression area for the respective current sensors based on a deviation and an intersection curve of the respective current regression areas relative to one another and/or relative to an averaged current regression area and a temperature difference between the current sensors.

A method for calibrating a plurality of current sensors connected in series. The method include determining a temperature difference between the current sensors; sensing temperature values and current values of the respective current sensors at different temperatures and currents; calculating averaged current values of two current sensors based on the current measured values sensed by the respective current sensors; calculating a current regression area for the respective current sensors through measurement points that are dependent on the temperature of the respective current sensors and the deviation of the current values sensed by the respective current sensors relative to one another; and calculating a TCR regression curve or a TCR regression area for the respective current sensors based on a deviation and an intersection curve of the respective current regression areas relative to one another and/or relative to an averaged current regression area and a temperature difference between the current sensors.