A system and method for adjusting estimated number of customers affected by an electrical power distribution network incident. Incident reports indicating a number of affected customers and an incident definition for incidents occurring over an accumulation time are accumulated, where each incident report. For each incident report, a signature is determined based on characterizing respective incidents and includes respective characteristics of the incidents associated with each incident report. A subject incident report is received subsequent to the accumulation time. A signature is determined for the subject incident report. Similar incident reports that have signatures similar to the subject incident are identified. A composite estimated number of affected customers for the subject incident is determined based on the associated numbers of affected customers for each similar incident report. An initial estimate of customers affected by the subject incident is adjusted based on the composite estimated number of affected customers.

Systems and methods for processing measurement data in an electric power system include acquiring the measurement data by a phasor measurement unit (PMU) coupled to a line of the electric power system, and inputting a plurality of the measurement data within a predetermined time window into a K-nearest neighbor (KNN) for identifying bad data among the plurality of the measurement data, wherein when one of the plurality of measurement data contains a bad datum, the machine learning module sends the bad datum to a denoising autoencoder module for correcting the bad datum, wherein the denoising autoencoder module outputs a corrected part corresponding to the bad datum, and when one of the plurality of measurement data contains no bad datum, the machine learning module bypasses the denoising autoencoder module and outputs the one of the plurality of measurement data as an untouched part.

Systems and methods for processing measurement data in an electric power system include acquiring the measurement data by a phasor measurement unit (PMU) coupled to a line of the electric power system, and inputting a plurality of the measurement data within a predetermined time window into a K-nearest neighbor (KNN) for identifying bad data among the plurality of the measurement data, wherein when one of the plurality of measurement data contains a bad datum, the machine learning module sends the bad datum to a denoising autoencoder module for correcting the bad datum, wherein the denoising autoencoder module outputs a corrected part corresponding to the bad datum, and when one of the plurality of measurement data contains no bad datum, the machine learning module bypasses the denoising autoencoder module and outputs the one of the plurality of measurement data as an untouched part.

A measurement system for determining an energy usage parameter of an electronic device under test is described. The measurement system includes a thermal chamber and an analysis circuit. The thermal chamber includes a housing, a temperature regulator and a thermal control circuit. The housing encloses an interior space of the thermal chamber, wherein the interior space is configured to accommodate the device under test. The thermal control circuit is configured to control the temperature regulator to keep a temperature of the interior space at a predefined reference temperature. The thermal control circuit is configured to determine a power consumption of the temperature regulator, wherein the power consumption is associated with keeping the temperature of the interior space at the predefined reference temperature. The analysis circuit is configured to determine at least one energy usage parameter of the device under test based on the determined power consumption. Further, a method of determining an energy usage parameter of an electronic device under test is described.

A measurement system for determining an energy usage parameter of an electronic device under test is described. The measurement system includes a thermal chamber and an analysis circuit. The thermal chamber includes a housing, a temperature regulator and a thermal control circuit. The housing encloses an interior space of the thermal chamber, wherein the interior space is configured to accommodate the device under test. The thermal control circuit is configured to control the temperature regulator to keep a temperature of the interior space at a predefined reference temperature. The thermal control circuit is configured to determine a power consumption of the temperature regulator, wherein the power consumption is associated with keeping the temperature of the interior space at the predefined reference temperature. The analysis circuit is configured to determine at least one energy usage parameter of the device under test based on the determined power consumption. Further, a method of determining an energy usage parameter of an electronic device under test is described.

A system and method are described herein for estimating power usage of various components of a CPU and controlling voltage regulators based on the estimated power usage. The power estimates may be based on digital power meter readings at each component, on voltage information from a voltage regulator, and on other power information. This power information is transmitted over a mesh interconnect disposed throughout the CPU such that power estimation can be accurately calculated and used to control voltage regulators without being limited by external bus speeds. More of the power management processes and components may be disposed on the CPU and connected to the mesh interconnect. These power management processes include various calibrations, adjustments, and limits so as efficiently manage and use the more rapidly processed power estimations.

A system and method are described herein for estimating power usage of various components of a CPU and controlling voltage regulators based on the estimated power usage. The power estimates may be based on digital power meter readings at each component, on voltage information from a voltage regulator, and on other power information. This power information is transmitted over a mesh interconnect disposed throughout the CPU such that power estimation can be accurately calculated and used to control voltage regulators without being limited by external bus speeds. More of the power management processes and components may be disposed on the CPU and connected to the mesh interconnect. These power management processes include various calibrations, adjustments, and limits so as efficiently manage and use the more rapidly processed power estimations.

According to one embodiment, a semiconductor device 1 includes a temperature sensor module 10 that outputs a non-linear digital value with respect to temperature and a substantially linear sensor voltage value with respect to the temperature, a storage unit 30 that stores the temperature, the digital value, and the sensor voltage value, and a controller 40 that calculates a characteristic formula using the temperature, the digital value, and the sensor voltage value stored in the storage unit 30, in which the temperature, the digital value, and the sensor voltage value stored in the storage unit 30 include absolute temperature under measurement of absolute temperature, the digital value at the absolute temperature, and the sensor voltage value at the absolute temperature.

According to one embodiment, a semiconductor device 1 includes a temperature sensor module 10 that outputs a non-linear digital value with respect to temperature and a substantially linear sensor voltage value with respect to the temperature, a storage unit 30 that stores the temperature, the digital value, and the sensor voltage value, and a controller 40 that calculates a characteristic formula using the temperature, the digital value, and the sensor voltage value stored in the storage unit 30, in which the temperature, the digital value, and the sensor voltage value stored in the storage unit 30 include absolute temperature under measurement of absolute temperature, the digital value at the absolute temperature, and the sensor voltage value at the absolute temperature.

Methods and systems for identifying and correcting abnormal electrical activity about a structure are provided. An electricity monitoring device may monitor electrical activity including transmission of electricity via an electrical distribution board to devices about the structure. Electrical activity may be correlated with respective electrical devices to build an electrical profile indicative of the structure's electricity usage. Based on the electrical profile, abnormal electrical activity may be identified and corrective actions may be taken to mitigate or prevent structural damage.