According to one embodiment, an electronic circuit includes an oscillator and a measuring circuit. The oscillator generates a first signal with a frequency corresponding to a time. The measuring circuit measures a first voltage based on a resonance frequency in a terminal of a semiconductor device where the first signal is supplied.

There is disclosed a probe used with a measurement instrument including a pulse circuit for generating pulses. A coaxial connector is secured to the probe case so that the probe case is electrically connected to the ground shield. A center rod has a top end received in the probe case and to extend into a process liquid. The center rod is electrically connected to the center terminal for conducting the pulses. Ground rods are spaced around the center rod and are secured to the probe case. The probe provides an open configuration less susceptible to build-up between the center rod and the ground rods. One or more of the ground rods may by tubes, connected to a flushing port, with nozzles for cleaning the enter rod. Another ground rod may be tubular for carrying a conductor connected to a bottom of the center rod for bottom-up measurement.

There is disclosed a probe used with a measurement instrument including a pulse circuit for generating pulses. A coaxial connector is secured to the probe case so that the probe case is electrically connected to the ground shield. A center rod has a top end received in the probe case and to extend into a process liquid. The center rod is electrically connected to the center terminal for conducting the pulses. Ground rods are spaced around the center rod and are secured to the probe case. The probe provides an open configuration less susceptible to build-up between the center rod and the ground rods. One or more of the ground rods may by tubes, connected to a flushing port, with nozzles for cleaning the enter rod. Another ground rod may be tubular for carrying a conductor connected to a bottom of the center rod for bottom-up measurement.

A method for measuring a complex impedance of a plurality of battery cells in a battery pack comprises controlling an excitation current through the plurality of battery cells in the battery pack; receiving, in a single common measurement circuit, a plurality of voltage signals corresponding to the plurality of battery cells; measuring the excitation current; and calculating a complex impedance of each of the battery cells in the plurality of battery cells based on the plurality of voltage signals and the measured excitation current in a single measurement cycle using either one analog-to-digital converter (ADC) per battery cell or two matched ADCs per battery cell.

According to an example aspect of the present invention, there is provided a Coulomb blockade thermometer, comprising a Coulomb blockade thermometer sensor element, a radio-frequency generator configured to feed a radio-frequency signal to a first port of the Coulomb blockade thermometer, and a radio-frequency sensor configured to measure a response of the Coulomb blockade thermometer to the radio-frequency signal from a second port of the Coulomb blockade thermometer to perform a conductance measurement of the Coulomb blockade thermometer, and a bias voltage generator configured to sweep through a bias voltage range during the conductance measurement, performed using the radio-frequency generator, of the Coulomb blockade thermometer.

According to an example aspect of the present invention, there is provided a Coulomb blockade thermometer, comprising a Coulomb blockade thermometer sensor element, a radio-frequency generator configured to feed a radio-frequency signal to a first port of the Coulomb blockade thermometer, and a radio-frequency sensor configured to measure a response of the Coulomb blockade thermometer to the radio-frequency signal from a second port of the Coulomb blockade thermometer to perform a conductance measurement of the Coulomb blockade thermometer, and a bias voltage generator configured to sweep through a bias voltage range during the conductance measurement, performed using the radio-frequency generator, of the Coulomb blockade thermometer.

A method and apparatus for measuring an unknown impedance. The apparatus comprises a first input to receive a first signal generated by a first portion of a sensor circuit, the first portion comprising an unknown impedance and a first known resistance, the unknown impedance to vary based upon a phenomenon to be measured by the sensor circuit. The apparatus also comprises a second input to receive a second signal generated by a second portion of the sensor circuit, the second portion of the sensor circuit comprising a known impedance and a second known resistance. And the apparatus comprises control logic to, based on a difference in time at which each of the first input and the second input reach a reference voltage, determine a measurement of the sensor circuit.

A method and apparatus for measuring an unknown impedance. The apparatus comprises a first input to receive a first signal generated by a first portion of a sensor circuit, the first portion comprising an unknown impedance and a first known resistance, the unknown impedance to vary based upon a phenomenon to be measured by the sensor circuit. The apparatus also comprises a second input to receive a second signal generated by a second portion of the sensor circuit, the second portion of the sensor circuit comprising a known impedance and a second known resistance. And the apparatus comprises control logic to, based on a difference in time at which each of the first input and the second input reach a reference voltage, determine a measurement of the sensor circuit.

A fault monitoring device may monitor and detect for faults corresponding to a high-side voltage rail, to low-side voltage rail, or internally within a voltage source connected to the high-side voltage rail and the low-side voltage rail. The fault monitoring device may determine sample voltage levels and/or sample resistance values to detect the faults. Also, in various embodiments, the fault monitoring device may perform one or more fault monitoring processes over multiple stages. The fault monitoring device may determine the sample voltage levels and/or the sample resistance values while switching a secondary resistance circuit in different states over the multiple stages.

A fault monitoring device may monitor and detect for faults corresponding to a high-side voltage rail, to low-side voltage rail, or internally within a voltage source connected to the high-side voltage rail and the low-side voltage rail. The fault monitoring device may determine sample voltage levels and/or sample resistance values to detect the faults. Also, in various embodiments, the fault monitoring device may perform one or more fault monitoring processes over multiple stages. The fault monitoring device may determine the sample voltage levels and/or the sample resistance values while switching a secondary resistance circuit in different states over the multiple stages.