Each of a plurality electronic circuit devices fixed to a structural component of a physical structure can be scanned a first time, using a radio frequency (RF) scanner to receive, from each of the plurality of electronic circuit devices, first data indicating a first measured electrical impedance of a respective conductor connected to the electronic circuit device and an identifier assigned to the electronic circuit device. For each of the plurality of electronic circuit devices, the first data indicating the first measured electrical impedance and the identifier assigned to the electronic circuit device can be stored to a first memory. The first data indicating the first measured electrical impedance and the identifier for each of the electronic devices can form a baseline measurement of the electronic circuit devices.

Disclosed is a calibration apparatus for a network analyzer, including a communication portion configured to communicate with the network analyzer to input or output data necessary for calibration, a signal input portion configured to receive a signal notifying a start of the calibration input, at least one radio frequency (RF) port for being connected to the network analyzer, at least one adaptor configured to connect the RF port with the network analyzer, an impedance circuit portion connected to the RF port and configured to include at least one standard impedance, and a controller portion configured to generate calibration data using adaptor characteristic data corresponding to electrical characteristic of the adaptor, measurement data obtained by connecting each of such standard impedances with the network analyzer, and standard impedance characteristic data corresponding to the standard impedance.

Disclosed is a calibration apparatus for a network analyzer, including a communication portion configured to communicate with the network analyzer to input or output data necessary for calibration, a signal input portion configured to receive a signal notifying a start of the calibration input, at least one radio frequency (RF) port for being connected to the network analyzer, at least one adaptor configured to connect the RF port with the network analyzer, an impedance circuit portion connected to the RF port and configured to include at least one standard impedance, and a controller portion configured to generate calibration data using adaptor characteristic data corresponding to electrical characteristic of the adaptor, measurement data obtained by connecting each of such standard impedances with the network analyzer, and standard impedance characteristic data corresponding to the standard impedance.

A reflectometer for use in measuring scattering (S-)parameters for a device under test (DUT) includes a test port, a radio frequency (RF) output signal source, and a local oscillator (LO) signal. The LO signal is used to downconvert the RF output signal to an incident IF signal. The reflectometer is useable as a first reflectometer with a second reflectometer such that the first and second reflectometers are phase synchronized by a synchronization signal. Phase and magnitude of transmission S-parameters of the DUT are measurable when the first reflectometer is used with the second reflectometer. The roles of the first and second reflectometers are reversible to allow for measurement of forward and reverse parameters. Further, the synchronization signal can be provided by one reflectometer to the other (or both can receive a separately generated synchronization signal) via a wire or fiber optic cable, for example, or via a wireless connection.

A method of calibrating a setup comprises: performing at least one calibration of the setup, thereby obtaining calibration data; setting a quantity representing forward tracking to be equal with a quantity representing reverse tracking; solving a system of equations having at least an unknown quantity representing the forward tracking or the reverse tracking, thereby obtaining at least one equation having the unknown quantity squared; creating based on the calibration data obtained two phase over frequency relationships for the respective quantity; determining two lines having a linear change in phase over frequency for the phase over frequency relationships created; extrapolating the lines determined to a frequency of 0 Hz; and determining the respective quantity by selecting one line of the lines extrapolated that is closer to a phase of zero, 2π or a multiple thereof at the frequency of 0 Hz.

A method of calibrating a setup comprises: performing at least one calibration of the setup, thereby obtaining calibration data; setting a quantity representing forward tracking to be equal with a quantity representing reverse tracking; solving a system of equations having at least an unknown quantity representing the forward tracking or the reverse tracking, thereby obtaining at least one equation having the unknown quantity squared; creating based on the calibration data obtained two phase over frequency relationships for the respective quantity; determining two lines having a linear change in phase over frequency for the phase over frequency relationships created; extrapolating the lines determined to a frequency of 0 Hz; and determining the respective quantity by selecting one line of the lines extrapolated that is closer to a phase of zero, 2π or a multiple thereof at the frequency of 0 Hz.

The disclosure relates to an apparatus and a method for vector scattering parameter (s-parameter) measurements, and more particularly, to an apparatus and a method for providing a simple, low cost solution for tests requiring vector s-parameter measurements. The apparatus includes a source which provides an input signal, a divider which splits the input signal to a reference signal and a testing signal, a phase shifter which shifts the reference signal by a first phase and outputs a phase shifted signal, a device under test (DUT) which shifts the testing signal by a second phase and outputs a DUT shifted signal, a combiner which combines the phase shifted signal and the DUT shifted signal into a combined signal, and a detector which detects a product of the phase shifted signal and the DUT shifted signal.

The disclosure relates to an apparatus and a method for vector scattering parameter (s-parameter) measurements, and more particularly, to an apparatus and a method for providing a simple, low cost solution for tests requiring vector s-parameter measurements. The apparatus includes a source which provides an input signal, a divider which splits the input signal to a reference signal and a testing signal, a phase shifter which shifts the reference signal by a first phase and outputs a phase shifted signal, a device under test (DUT) which shifts the testing signal by a second phase and outputs a DUT shifted signal, a combiner which combines the phase shifted signal and the DUT shifted signal into a combined signal, and a detector which detects a product of the phase shifted signal and the DUT shifted signal.

A digital sine wave may be converted to an analog signal at a digital to analog converter (DAC). The converted analog signal may be supplied to a device and an analog return signal from the device may be passed through a relaxed anti-aliasing filter and converted to digital code words at an analog to digital converter (ADC). An impedance may be calculated from the results of a Fourier analysis of the digital code words. The ADC and DAC clock frequencies may be asynchronous, independently variable, and have a greatest common factor of 1. The clock frequencies of the ADC and/or DAC may be adjusted to change a location of images in the ADC spectrum. By using these different, adjustable clock frequencies for the ADC and the DAC, an analog signal may have increased aliasing without introducing signal errors at a frequency of interest.

A digital sine wave may be converted to an analog signal at a digital to analog converter (DAC). The converted analog signal may be supplied to a device and an analog return signal from the device may be passed through a relaxed anti-aliasing filter and converted to digital code words at an analog to digital converter (ADC). An impedance may be calculated from the results of a Fourier analysis of the digital code words. The ADC and DAC clock frequencies may be asynchronous, independently variable, and have a greatest common factor of 1. The clock frequencies of the ADC and/or DAC may be adjusted to change a location of images in the ADC spectrum. By using these different, adjustable clock frequencies for the ADC and the DAC, an analog signal may have increased aliasing without introducing signal errors at a frequency of interest.