An apparatus has at least substrate having at least two conductive paths, a least two connectors positioned in a first plane, and a movable stage connected to one of the at least one substrate to move the one substrate perpendicular to the first plane form an electrically conductive path between two of the at least two connectors.

An IC includes a plurality of pads at a top surface of a semiconductor wafer, an amplifier configured to receive a first AC signal at an input terminal, and output a second AC signal at an output terminal, a first detection circuit coupled to the input terminal and configured to output a first DC voltage to a first pad of the plurality of pads responsive to the first AC signal, and a second detection circuit coupled to the output terminal and configured to output a second DC voltage to a second pad of the plurality of pads responsive to the second AC signal.

A method and an apparatus for diagnosing an electronic apparatus are provided. The device for diagnosing an electronic device includes a master diagnosis block that generates a control signal when a diagnosis mode is started, a multiplexer that sequentially outputs a diagnosis power through a diagnosis power path based on the control signal, a slave diagnosis block that is sequentially supplied the diagnosis power through the diagnosis power path and generates diagnosis data of a power management circuit of the electronic device by using the diagnosis power, a modulator that transmits the diagnosis data by modulating a power signal of the diagnosis power path, and a demodulator that receives the diagnosis data by demodulating the power signal of the diagnosis power path and provides the diagnosis data to the master diagnosis block.

A method and an apparatus for diagnosing an electronic apparatus are provided. The device for diagnosing an electronic device includes a master diagnosis block that generates a control signal when a diagnosis mode is started, a multiplexer that sequentially outputs a diagnosis power through a diagnosis power path based on the control signal, a slave diagnosis block that is sequentially supplied the diagnosis power through the diagnosis power path and generates diagnosis data of a power management circuit of the electronic device by using the diagnosis power, a modulator that transmits the diagnosis data by modulating a power signal of the diagnosis power path, and a demodulator that receives the diagnosis data by demodulating the power signal of the diagnosis power path and provides the diagnosis data to the master diagnosis block.

A test arrangement for adjusting a setup of testing a device under test (DUT) includes a main device that generates an RF signal and processes an incoming RF signal in a first frequency range; a frontend component generates an RF signal and processes an incoming RF signal in a second frequency range. The frontend component measures a signal level in a sub-range within the first frequency range; a connection cable connects the main device with the frontend component; and an analyzer predicts a behavior of the connection cable in a rest portion of the first frequency range that is different from the sub-range within the first frequency range.

Improved coaxial connectors and methods which have enhanced characteristics, reliability, strength, and durability. This coaxial connector system uses a flange mating system and a single slot male pin center conductor contact. The flanges use precision guiding pins and screws to axially align and secure the mating flanges together. The coaxial center conductors are electrically connected to each other by a resilient, single slotted, formed male pin and a female receptacle as center conductor assemblies. When the two flanges are fastened together, the center conductor assemblies (formed male pin and a female receptacle) mate to form an electrically conducting connection.

Improved coaxial connectors and methods which have enhanced characteristics, reliability, strength, and durability. This coaxial connector system uses a flange mating system and a single slot male pin center conductor contact. The flanges use precision guiding pins and screws to axially align and secure the mating flanges together. The coaxial center conductors are electrically connected to each other by a resilient, single slotted, formed male pin and a female receptacle as center conductor assemblies. When the two flanges are fastened together, the center conductor assemblies (formed male pin and a female receptacle) mate to form an electrically conducting connection.

The present disclosure relates to a method for testing a device under test by using a test system. The method comprises the steps of: generating a wideband modulated signal; forwarding the wideband modulated signal to an input of a device under test; separating an electromagnetic wave reflected at the input by the directional element; forwarding the reflected electromagnetic wave to a test and measurement instrument; processing a reference signal associated with the wideband modulated signal; and determining a channel response by taking the reference signal and at least one scattering parameter of the device under test into account, wherein the scattering parameter depends on the reflected electromagnetic wave. Further, the present disclosure relates to a test system.

The present disclosure relates to a method for testing a device under test by using a test system. The method comprises the steps of: generating a wideband modulated signal; forwarding the wideband modulated signal to an input of a device under test; separating an electromagnetic wave reflected at the input by the directional element; forwarding the reflected electromagnetic wave to a test and measurement instrument; processing a reference signal associated with the wideband modulated signal; and determining a channel response by taking the reference signal and at least one scattering parameter of the device under test into account, wherein the scattering parameter depends on the reflected electromagnetic wave. Further, the present disclosure relates to a test system.

The present exemplary embodiments provide a signal detection circuit and a sensor which improve a quality factor of a resonator by modeling an initial state of the resonator using an attenuator and a phase shifter which are modeling paths and significantly change a transmission coefficient of the resonator even with a small variation of an object to be measured.