An arc detector for a RF power supply system, where the RF power supply incudes a first RF power supply and a second RF power supply. A signal applied to a non-linear load varies in accordance with an output from one of the first RF power supply or the second RF power supply. The signal has a frequency. During an arc or arc condition in the non-linear load, the frequency of the signal changes, and if the frequency is outside of a selected range, an arc or arc condition is indicated. The frequency can be determined by digitizing the signal into a series of pulses and measuring a time or period between pulses.

According to a method for filtering measurement data of a sensor system (2), light pulses (5) reflected in the environment of the sensor system (2) are captured by means of an array (7) of optical detectors (8, 9, 10). A multiplicity of measurement signals (11, 12) are generated by means of the array (7) based on the captured light pulses. A computing unit (3) identifies a first measurement signal (11) whose pulse energy is greater than a specified minimum energy, wherein the first measurement signal (11) was generated by a first detector (8). A second measurement signal (12) is compared with the first measurement signal (11) by means of the computing unit (3), wherein the second measurement signal (12) was generated by a second detector (9), which is at a distance from the first detector (8) that is less than or equal to a specified maximum distance. The computing unit discards at least a part of the second measurement signal depending on a result of the comparison.

A ripple voltage detector circuit comprises a pulse generator, a direct current-to-direct current (DC-DC) converter coupled to the pulse generator, and a first control loop coupled to the pulse generator and the DC-DC converter. The first control loop is configured to measure an output voltage of the DC-DC converter, determine an output ripple voltage of the output voltage, determine a ripple coefficient based on the output ripple voltage, determine a reference peak inductor current based on the ripple coefficient, and determine a peak value of an inductor current during a switching cycle, and transition a switching state of the DC-DC converter based on the reference peak inductor current and the peak value of the inductor current.

The present disclosure describes a method for analyzing signal waveforms produced by integrated circuits. The method includes determining characteristic points of a control signal, and each characteristic point includes a corresponding time value and represents an edge change of the control signal. The method also includes determining sets of data sampling points. Each set of data sampling points is located between adjacent characteristic points of the characteristic points. The method further includes obtaining data values of a signal waveform, and a data value of the signal waveform is obtained at a data sampling point of the sets of data sampling points. The method further includes obtaining data values of a reference waveform, and a data value of the reference waveform is obtained at the data sampling point and determining a difference between the data value of the signal waveform and the data value of the reference waveform.

A method and apparatus are described for compensating input voltage ripples of an interleaved boost converter using cycle times. In an embodiment, a phase compensator receives a first duty cycle measurement of a first converter and a second duty cycle measurement of a second converter, compares the first duty cycle to the second duty cycle and generates a phase compensation in response thereto. A phase combiner combines a phase adjustment output and the phase compensation and produces a phase control output, and a cycle controller is coupled to the first and the second converters to generate a first drive signal to control switching of the first converter and to generate a second drive signal to control switching of the second converter, wherein a time of the second drive signal is adjusted using the phase control output.

A MEMS device may output a signal during operation that may include an in-phase component and a quadrature component. An external signal having a phase that corresponds to the quadrature component may be applied to the MEMS device, such that the MEMS device outputs a signal having a modified in-phase component and a modified quadrature component. A phase error for the MEMS device may be determined based on the modified in-phase component and the modified quadrature component.

A MEMS device may output a signal during operation that may include an in-phase component and a quadrature component. An external signal having a phase that corresponds to the quadrature component may be applied to the MEMS device, such that the MEMS device outputs a signal having a modified in-phase component and a modified quadrature component. A phase error for the MEMS device may be determined based on the modified in-phase component and the modified quadrature component.

The application discloses a RF vector measurement system including: a first port for generating a RF pulse, a pulse splitter for splitting the pulse into a first pulse send to a device-under-test DUT, and a second pulse send as a reference to a first quantum sensor of the system. The system is arranged to supply a third pulse, which is produced by reflecting or transmitting the first by the DUT, to at least one second quantum sensor phase-correlated with said first quantum sensor by entanglement. A computing unit is arranged to perform a measurement of the DUT by: reading out the state of the population of the first and the second quantum sensor, wherein the state of the second quantum sensor is based on the relative phase and relative amplitude of the second pulse and the third pulse, and determining the relative phase and relative amplitude of the second pulse and the third pulse as the closest match when applying a quantum sensor model for the second quantum sensor, the model being designed to model the dependencies between the relative phase and amplitude and the resulting population state.

The application discloses a RF vector measurement system including: a first port for generating a RF pulse, a pulse splitter for splitting the pulse into a first pulse send to a device-under-test DUT, and a second pulse send as a reference to a first quantum sensor of the system. The system is arranged to supply a third pulse, which is produced by reflecting or transmitting the first by the DUT, to at least one second quantum sensor phase-correlated with said first quantum sensor by entanglement. A computing unit is arranged to perform a measurement of the DUT by: reading out the state of the population of the first and the second quantum sensor, wherein the state of the second quantum sensor is based on the relative phase and relative amplitude of the second pulse and the third pulse, and determining the relative phase and relative amplitude of the second pulse and the third pulse as the closest match when applying a quantum sensor model for the second quantum sensor, the model being designed to model the dependencies between the relative phase and amplitude and the resulting population state.

The invention relates to a detection apparatus (12) for detecting photons. The detection apparatus comprises a pile-up determining unit (15) for determining whether detection signal pulses being indicative of detected photons are caused by a pile-up event or by a non-pile-up event, wherein a detection values generating unit (16) generates detection values depending on the detection signal pulses and depending on the determination whether the respective detection signal pulse is caused by a pile-up event or by a non-pile-up event. In particular, the detection values generating unit can be adapted to reject the detection signal pulses caused by pile-up events while generating the detection values. This allows for an improved quality of the generated detection values.