A mobile transformer test device (10) for testing a power transformer (40) has connectors (12) for the detachable connection of the transformer test device (10) to the power transformer (40). The transformer test device (10) has a source (5) for generating a test signal. The mobile transformer test device (10) has an evaluation circuit (6) for determining, based on the test signal and a test response of the power transformer (40), information regarding a B-H curve (50, 60) of the power transformer (40).

A system and method for tuning a transformer is provided. A transformer fixture may connect a switching network to a plurality of inductors of a transformer. At least one computing device may calculate a target number of turns for a primary coil and a secondary coil of the transformer based on a frequency response of the transformer. The switching network may connect the inductors of the transformer together in a pattern that results in the primary coil and secondary coil having the target number of turns.

A system and method for tuning a transformer is provided. A transformer fixture may connect a switching network to a plurality of inductors of a transformer. At least one computing device may calculate a target number of turns for a primary coil and a secondary coil of the transformer based on a frequency response of the transformer. The switching network may connect the inductors of the transformer together in a pattern that results in the primary coil and secondary coil having the target number of turns.

A system and method for tuning a transformer is provided. A transformer fixture may connect a switching network to a plurality of inductors of a transformer. At least one computing device may calculate a target number of turns for a primary coil and a secondary coil of the transformer based on a frequency response of the transformer. The switching network may connect the inductors of the transformer together in a pattern that results in the primary coil and secondary coil having the target number of turns.

A system and method for tuning a transformer is provided. A transformer fixture may connect a switching network to a plurality of inductors of a transformer. At least one computing device may calculate a target number of turns for a primary coil and a secondary coil of the transformer based on a frequency response of the transformer. The switching network may connect the inductors of the transformer together in a pattern that results in the primary coil and secondary coil having the target number of turns.

A system and method for tuning a transformer is provided. A transformer fixture may connect a switching network to a plurality of inductors of a transformer. At least one computing device may calculate a target number of turns for a primary coil and a secondary coil of the transformer based on a frequency response of the transformer. The switching network may connect the inductors of the transformer together in a pattern that results in the primary coil and secondary coil having the target number of turns.

A system and method for tuning a transformer is provided. A transformer fixture may connect a switching network to a plurality of inductors of a transformer. At least one computing device may calculate a target number of turns for a primary coil and a secondary coil of the transformer based on a frequency response of the transformer. The switching network may connect the inductors of the transformer together in a pattern that results in the primary coil and secondary coil having the target number of turns.

To ascertain a parameter of a transformer (40) that has a high voltage side (41) and a low voltage side (43), a test signal generated by a source (13) is impressed on the low voltage side (43). A test response of the transformer (40) is recorded. A leakage reactance and/or a leakage inductance of the transformer (40) is determined by an evaluation device (18) of an apparatus (10) on the basis of the test response of the transformer (40).

Provided is a circuit capable of accurately testing the number of coil turns even with a transformer having a high turns ratio.

A transformer turns number testing circuit (1) is configured to be able to connect primary-side coils (Np1 and Np2) and secondary-side coils (Ns1 and Ns2) of a reference transformer (CT1) and a to-be-tested transformer (CT2) in phase and in series, and includes: a reference-side resistance element (R1) included in a reference-side loop circuit (Lp1) formed between both ends of the secondary-side coil of the reference transformer; a to-be-tested-side resistance element (R2) included in a to-be-tested-side loop circuit (Lp2) formed between both ends of the secondary-side coil of the to-be-tested transformer; and a voltage detector (Rd) provided in a common line of the reference-side loop circuit and the to-be-tested-side loop circuit, the common line connecting a midpoint between the secondary-side coils of the reference transformer and the to-be-tested transformer and a midpoint between the reference-side resistance element and the to-be-tested-side resistance element.

Provided is a circuit capable of accurately testing the number of coil turns even with a transformer having a high turns ratio.

A transformer turns number testing circuit (1) is configured to be able to connect primary-side coils (Np1 and Np2) and secondary-side coils (Ns1 and Ns2) of a reference transformer (CT1) and a to-be-tested transformer (CT2) in phase and in series, and includes: a reference-side resistance element (R1) included in a reference-side loop circuit (Lp1) formed between both ends of the secondary-side coil of the reference transformer; a to-be-tested-side resistance element (R2) included in a to-be-tested-side loop circuit (Lp2) formed between both ends of the secondary-side coil of the to-be-tested transformer; and a voltage detector (Rd) provided in a common line of the reference-side loop circuit and the to-be-tested-side loop circuit, the common line connecting a midpoint between the secondary-side coils of the reference transformer and the to-be-tested transformer and a midpoint between the reference-side resistance element and the to-be-tested-side resistance element.