This invention relates to a pipeline-inspecting device. More specifically, the invention relates to a pipeline-inspecting device capable of at least (i) detecting defects in the lining of the pipeline; (ii) visually marking each of the defects in the pipeline; and (iii) recording the location of each of the defects along such pipeline in a single pass. The pipeline-inspecting device includes a primary body (20) being operably movable along a pipeline, fitted with a plurality of primary contacts (40) extending radially from the primary body (20) for operably riding in contact with an internal surface of the pipeline, the contacts (40) being spaced circumferentially relative to one another through 360 degrees about the primary body (20). The device further includes one or more secondary contacts (116) for operably connecting the device to the pipeline and a plurality of marking members (66) associated with each of the respective contacts (40) for visually marking the internal surface of the pipeline in the vicinity of defects detected therein, wherein the defects are operably detected by monitoring an electrical condition change between the primary (40) and secondary contacts (116). In use, and in the event of an electrical condition change arising between one of the primary contacts (40) and the secondary contact (116), the marking member associated with that respective primary contact (40) marks the internal surface of the pipeline in the vicinity of the defect detected by such primary contact (40).

Activity of piezoelectric material dimension and electrical properties can be changed with an applied stress. These variations are translated to a change in capacitance of the structure. Use of capacitance-voltage measurements for the extraction of double piezoelectric thin film material deposited at the two faces of a flexible steel sheet is described. Piezoelectric thin film materials are deposited using RF sputtering techniques. Gamry analyzer references 3000 is used to collect the capacitance-voltage measurements from both layers. A developed algorithm extracts directly the piezoelectric coefficients knowing film thickness, applied voltage, and capacitance ratio. The capacitance ratio is the ratio between the capacitances of the film when the applied field in antiparallel and parallel to the poling field direction, respectively. Piezoelectric bulk ceramic is used for calibration and validation by comparing the result with the reported values from literature. Extracted values using the current approach match well values extracted by existing methods.

A method for monitoring polarization quality of a piezoelectric film is described. In this method, a detection step is performed on a piezoelectric film by using a detection device with a non-contact method during a polarization process of the piezoelectric film, to obtain a static electricity information or a transmittance information. A determination step is performed by using the static electricity information or the transmittance information to determine a polarization degree of the piezoelectric film.

A method for monitoring polarization quality of a piezoelectric film is described. In this method, a detection step is performed on a piezoelectric film by using a detection device with a non-contact method during a polarization process of the piezoelectric film, to obtain a static electricity information or a transmittance information. A determination step is performed by using the static electricity information or the transmittance information to determine a polarization degree of the piezoelectric film.

The present invention relates to a method for determining at least one physical characteristic value of an electromechanical oscillatory system, which comprises a piezoelectric element and at least one additional element coupled, with respect to oscillation, to the piezoelectric element, the piezoelectric element having an electrode and a counter electrode. The method comprises the following steps: (a) applying an electrical alternating voltage between the electrode and the counter electrode for the duration of an excitation interval in order to induce mechanical oscillation of the oscillatory system or of a sub-system of the oscillatory system, so that after the excitation interval has expired, the oscillatory system or the sub-system performs a free oscillation without excitation, (b) after the end of the excitation and during the free oscillation of the oscillatory system or of the sub-system without excitation: (i) measuring a time curve of a voltage U between the electrode and the counter electrode, or (ii) short-circuiting the electrode and the counter electrode with a line and measuring a time curve of a current I through the line, and (c) determining the at least one physical characteristic value of the electromechanical oscillatory system from the time curve of the voltage U, which time curve was measured in step b) i), or the time curve of the current I, which time curve was measured in step b) ii).

A method for improving the accuracy of a final inspection (FI) test of an acoustic wave device includes gating the feedthrough/cross-coupling (e.g., electromagnetic (EM) path) signal of the FI test data response for the tested acoustic wave device and adding a feedthrough/cross-coupling signal (e.g., EM path signal) from an engineering (EVB) test data (e.g., for a similar or identical surface acoustic device). This results in FI test data with time domain recovery of EM path signal from an EVB test, which can be compared against EVB test data (e.g. for a similar or identical surface acoustic device) to determine if the tested acoustic wave device passes inspection.

A method for detecting an open circuit state failure in a piezoelectric element connection includes exciting a piezoelectric element with an excitation signal and monitoring and evaluating an electrical output signal generated by the piezoelectric element in response to the excitation signal. The excitation signal is a pulse train. A frequency of the pulse train is chosen such that the piezoelectric element acts as a low pass filter.

A method for performing diagnostics on a target transformer includes applying a voltage output of a voltage generator to a winding or phase of the target transformer; controlling the voltage generator to output an AC voltage at a first frequency and then a second frequency and measuring first and second excitation currents flowing into the target transformer associated with the first frequency and second frequency, respectively. The method further includes determining an actual excitation current of the target transformer as a function of both the first and second excitation currents, and comparing the actual excitation current of the target transformer to excitation currents associated with one or more benchmark transformers having known electrical characteristics. And when the actual excitation current of the target transformer matches an excitation current of one of benchmark transformers, determining the electrical characteristics of the target transformer to match electrical characteristics of the one benchmark transformer.

Provided is a piezoelectric property measuring apparatus for a liquid or viscous material. The piezoelectric property measuring apparatus includes a fixing jig having an inner space and an opened space; an operating jig configured to close the opened region of the inner space; a first electrode and a second electrode; a driving module moving the operating jig according to a driving signal; a motion information measuring module measuring motion information of the operating jig; a charge amount measuring module measuring the charge amount through the first electrode and the second electrode; and a control module generating the driving signal for the driving module, supplying the driving signal to the driving module, receiving the motion information, receiving charge amount information of the closed space, and measuring a piezoelectric property of the sample by using the motion information and the charge amount information.

Provided is a piezoelectric property measuring apparatus for a liquid or viscous material. The piezoelectric property measuring apparatus includes a fixing jig having an inner space and an opened space; an operating jig configured to close the opened region of the inner space; a first electrode and a second electrode; a driving module moving the operating jig according to a driving signal; a motion information measuring module measuring motion information of the operating jig; a charge amount measuring module measuring the charge amount through the first electrode and the second electrode; and a control module generating the driving signal for the driving module, supplying the driving signal to the driving module, receiving the motion information, receiving charge amount information of the closed space, and measuring a piezoelectric property of the sample by using the motion information and the charge amount information.