Patent classifications
G
PHYSICS
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G01
MEASURING; TESTING
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G01R
MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
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31/00
Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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G01R31/001
Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing
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