A method for determining the remaining service life of a capacitor is disclosed, wherein the capacitor may be formed by an electrolytic capacitor. The method includes the stages of: measuring a voltage change across the capacitor during a discharging time, determining a discharging current during the discharging time, determining an actual capacitance of the capacitor on the basis of the voltage change, the discharging current and the discharging time, determining a corrected capacitance of the capacitor from the actual capacitance based on an error correction, wherein influences of the temperature on the capacitance of the capacitor are corrected during the error correction, and determining the remaining service life on the basis of a difference between the corrected capacitance and an initial capacitance of the capacitor. A system including an assessment device, configured to perform this method, and a circuit having at least one capacitor to be assessed are also disclosed.

A fault circuit indicator (FCI) detection system for electrical equipment disposed in an enclosure or vault having an above-ground vent pipe exhaust outlet comprises one or more sensors disposed in the enclosure or vault to sense a condition of at least one unit of the electrical equipment. A sensored analytics unit (SAU) is coupled to the sensors to receive sensor data and analyze the sensor data, the SAU generating a corresponding analyzed data signal that provides information related to a condition of the at least one unit of electrical equipment. A transceiver is disposed inside at least a portion of the vent pipe to receive the analyzed data signal, wherein the transceiver is configured to communicate the analyzed data signal. A visual indicator is disposed on or within the vent pipe comprising one or more visual indicators, such as LEDs, driven by a driving circuit board to provide a visual signal corresponding to the condition of the at least one unit of electrical equipment.

An apparatus is described for burn-in and/or functional testing of microelectronic circuits of unsingulated wafers. A large number of power, ground, and signal connections can be made to a large number of contacts on a wafer. The apparatus has a cartridge that allows for fanning-in of electric paths. A distribution board has a plurality of interfaces that are strategically positioned to provide a dense configuration. The interfaces are connected through flexible attachments to an array of first connector modules. Each one of the first connector modules can be independently connected to a respective one of a plurality of second connector modules, thereby reducing stresses on a frame of the apparatus. Further features include for example a piston that allows for tight control of forces exerted by terminals onto contacts of a wafer.

Disclosed is a multi-dimensional analysis method for a tripping risk of a whole transmission line due to a lightning shielding failure. A quantity of thunderstorm days, a tower size, a terrain proportion, an altitude, and insulation configuration data are collected for a transmission line for which a tripping risk due to a lightning shielding failure needs to be analyzed, and a striking distance, an exposure distance, a lightning resisting level of the line after altitude factor correction, and a lightning shielding failure risk of a single-base tower are calculated in turn. Characteristics of a lightning shielding failure under different nominal heights, quantities of thunderstorm days, and terrains are studied. Representative combination conditions are selected to calculate a tripping risk of a typical tower due to the lightning shielding failure. A weight coefficient is extracted, to calculate a tripping risk of the whole line due to the lightning shielding failure.

An environmental testing apparatus includes: a plurality of blower fans that circulate air-conditioned air between an air conditioning chamber and a test chamber; a plurality of temperature sensors that measure temperature at a plurality of locations in the test chamber and output temperature data; and a control unit that can individually set rotation speed of each blower fan. The control unit executes setting processing for setting the rotation speed of each blower fan in a testing period in a setting period before the testing period. In the setting processing, the control unit changes the rotation speed of the plurality of blower fans a plurality of times, and acquires a plurality of temperature data after each change from the plurality of temperature sensors.

A high-pressure burn-in test apparatus comprises a burn-in furnace including a high-pressure burn-in furnace cavity equipped with a driving motor, at least one intake manifold, at least one extension manifold equipped with a nozzle, a communicating tube connected to the intake manifold, and a fan. A processing chamber having a test board is formed inside the high-pressure burn-in furnace cavity. The periphery of at least one of the intake manifold is connected to the at least one extension manifold. At least one component to be tested is placed on the test board. High-pressure gas is ejected through the nozzle to disturb the gas around the component to be tested. The fan is installed in the processing chamber. The driving motor drives the fan to rotate, so that the gas in the processing chamber generates convection, to improve the uniformity of gas temperature distribution.

An optical module with detachable optical port includes a module body and an optical port plastic part. The optical port of the module body is provided with a groove for inserting the optical port plastic part, and the optical port plastic part and the groove are detachably connected. A test method for an AOC optical module is provided, where the AOC optical module is the above-mentioned optical module with detachable optical port. According to the optical module with a detachable optical port, the detachable optical port plastic part can be disassembled and replaced independently without disassembling the module body, which can make this optical module scheme more convenient to change into the AOC module by replacing the plastic part of the optical port, and there is no need to re-do the performance test, which effectively improves the flexibility of the product scheme.

Methods are provided that performs continuous semiconductor testing during long soak time testing using a chamberless single insertion model (SIM) handler and also using a chamberless asynchronous insertion model (AIM) handler having two manipulators. The methods include dividing a group of semiconductors having an ambient temperature into a first subgroup having a plurality of portions and a second subgroup having a plurality of portions, the second subgroup being identical to the first subgroup. The methods also include using thermal chucks to change the temperature of the first portion of the first subgroup and the first portion of a second subgroup prior to testing from ambient temperature to a stabilized designated temperature during a soak time. The methods also include testing all of the portions of the first subgroup and the second subgroup using predetermined protocols that include Soak Time, Test Time, Index Time, and sometimes Wait Time.

A burn-in resilient integrated circuit is provided. The burn-in resilient integrated circuit includes an inverter chain and a plurality of inverter circuits on the inverter chain. The burn-in resilient integrated circuit also includes a loop providing an electrical connection from an output of the inverter chain to an input of the inverter chain. The loop is selectable in accordance with a burn-in operation.

The temperature test apparatus includes a test antenna for measuring transmission and reception characteristics of a DUT, an anechoic box formed by a metal housing having an internal space, a heat insulating housing, a temperature control device that controls the temperature of a spatial region, and a measurement device that measures the transmission and reception characteristics of the DUT. The temperature control device and the heat insulating housing are connected to each other by a pipe 31 through which a gas for controlling the temperature of the spatial region passes and that goes through the metal housing. A portion 31A of the pipe from the metal housing to a predetermined position of the internal space is made of metal. A metal net portion 33 that blocks a pipeline 31Ae of a portion of the pipe 31 is provided.