Disclosed are a reliability test fixture and an online test device for a flexible display component. The fixture comprises a support and a rotating shaft rotatably mounted on the support. An engagement recess for fixing a flexible display component is provided in an axial direction on the surface of the rotating shaft. A test module used to detect an electrical parameter of an internal circuit of the flexible display component is disposed inside the rotating shaft. The test module has a test contact for electrically connecting to the flexible display component. During a test, the flexible display component is fixed in the engagement recess and is electrically connected to the test module.

A system and method for determining the lifetime of a capacitor element, specifically a capacitor element comprising a solid electrolyte that undergoes oxidation, is provided. The system and method utilize a capacitor element comprising an anode body, a dielectric, and a solid electrolyte, and may also comprise other stages of the production of a capacitor. The system and method provide an estimation of the life of the capacitor while considering the oxidation of the solid electrolyte.

An Uninterruptible Power Supply (UPS) system is provided which includes an input configured to receive input power, an output configured to provide output power to a load, power conversion circuitry coupled to the input and the output, a capacitor coupled to the power conversion circuitry, and a controller coupled to the power conversion circuitry. The controller is configured to determine a first value indicative of an equivalent series resistance of the capacitor, determine, based on the first value, if the capacitor satisfies at least one criterion, and execute, responsive to determining that the relative value satisfies the at least one criterion, one or more actions to address degradation of the capacitor.

A method for calibrating an isolator product includes generating a differential pair of signals on a differential pair of nodes at an input of a demodulator circuit of a receiver signal path of a first integrated circuit die of the isolator product based on a received differential pair of signals. The method includes generating a diagnostic output signal having a level corresponding to an average amplitude of the differential pair of signals. The method includes driving the diagnostic output signal to an output terminal of the isolator product. The method may include transmitting a diagnostic signal using a carrier signal having a frequency by a second integrated circuit die via an isolation channel. The method may include, during the transmitting, sweeping the frequency of the carrier signal across a frequency band. The method may include, during the sweeping, capturing the diagnostic output signal via the output terminal.

The invention relates to an over-the-air (OTA) test system for measuring a performance of a device under test (DUT). The test system comprises an over-the-air (OTA) measurement chamber provided with at least one feedthrough for at least a first air hose and a second air hose. The test system further includes a thermally isolated hollow body inside the OTA measurement chamber, in which the DUT is positioned having at least two openings for connecting a first end of each of the first and the second air hose, and at least one sensor having a connection wire, located within the thermally isolated hollow body. Advantageously, the sensor connection wire is fed through one of the two openings into the thermally isolated hollow body.

An automatic test method for reliability and functionality of electronic device is provided to deploy a robotic arm to perform reliability test on a tested component. In the meantime, the test host can directly access the generic log files generated by the tested electronic device without the need of using a third-party test utility on the tested electronic device. Analysis is carried out by the test host using the log files to determine whether each test round generates functional result to the tested component so that data of the functionality can be collected.

The present disclosure provides a test method and a test device for an adapter. The method includes: detecting temperatures of elements in the adapter; determining whether the adapter is in a temperature balance state according to the temperatures of the elements in the adapter; increasing an ambient temperature of an environment where the adapter is located in response to the temperature balance state; detecting an output power of the adapter, and determining whether the adapter performs a power reduction operation before the temperatures of the elements reach a first preset temperature threshold; and determining that a test for the adapter fails when the power reduction operation does not occur.

A method for calibrating an isolator product includes generating a differential pair of signals on a differential pair of nodes at an input of a demodulator circuit of a receiver signal path of a first integrated circuit die of the isolator product based on a received differential pair of signals. The method includes generating a diagnostic output signal having a level corresponding to an average amplitude of the differential pair of signals. The method includes driving the diagnostic output signal to an output terminal of the isolator product. The method may include transmitting a diagnostic signal using a carrier signal having a frequency by a second integrated circuit die via an isolation channel. The method may include, during the transmitting, sweeping the frequency of the carrier signal across a frequency band. The method may include, during the sweeping, capturing the diagnostic output signal via the output terminal.

An apparatus is described for burn-in and/or functional testing of microelectronic circuits of unsingulated wafers. A large number of power, ground, and signal connections can be made to a large number of contacts on a wafer. The apparatus has a cartridge that allows for fanning-in of electric paths. A distribution board has a plurality of interfaces that are strategically positioned to provide a dense configuration. The interfaces are connected through flexible attachments to an array of first connector modules. Each one of the first connector modules can be independently connected to a respective one of a plurality of second connector modules, thereby reducing stresses on a frame of the apparatus. Further features include for example a piston that allows for tight control of forces exerted by terminals onto contacts of a wafer.

An apparatus is described for burn-in and/or functional testing of microelectronic circuits of unsingulated wafers. A large number of power, ground, and signal connections can be made to a large number of contacts on a wafer. The apparatus has a cartridge that allows for fanning-in of electric paths. A distribution board has a plurality of interfaces that are strategically positioned to provide a dense configuration. The interfaces are connected through flexible attachments to an array of first connector modules. Each one of the first connector modules can be independently connected to a respective one of a plurality of second connector modules, thereby reducing stresses on a frame of the apparatus. Further features include for example a piston that allows for tight control of forces exerted by terminals onto contacts of a wafer.