Various embodiments include methods and apparatuses to test production tools and related electrical components therefor including individual printed-circuit boards (PCBs). In one example, a test-plug hardware-platform includes at least one input/output (I/O) connector, and a configurable control system to provide command and operational signals through the I/O connector and collect data through the I/O connector from at least one PCB under test. A wireless-mesh network within the test-plug hardware-platform can interface wirelessly with at least the PCB under test. The at least one PCB operating within a production tool or other piece of equipment. Other methods and systems are disclosed.

An examination method of the present invention is characterized by including a step of bringing conductor probes into contact with surfaces of an examination target to measure voltage or electric resistance at a plurality of points on the surfaces of the examination target, the examination target being a resin current collector, an electrode sheet having an active material layer laminated on the resin current collector, a separator-attached electrode sheet in which a separator is combined with the electrode sheet, or a unit cell including one set of a positive electrode resin current collector, a positive electrode active material layer, a separator, a negative electrode active material layer, and a negative electrode resin current collector, which are laminated in order, and a step of determining whether or not a point at which the voltage or the electric resistance is out of an allowable range is present in the examination target.

An examination method of the present invention is characterized by including a step of bringing conductor probes into contact with surfaces of an examination target to measure voltage or electric resistance at a plurality of points on the surfaces of the examination target, the examination target being a resin current collector, an electrode sheet having an active material layer laminated on the resin current collector, a separator-attached electrode sheet in which a separator is combined with the electrode sheet, or a unit cell including one set of a positive electrode resin current collector, a positive electrode active material layer, a separator, a negative electrode active material layer, and a negative electrode resin current collector, which are laminated in order, and a step of determining whether or not a point at which the voltage or the electric resistance is out of an allowable range is present in the examination target.

A vehicle electricity storage device includes a capacitor unit for supplying stored electric power to an electronically controlled system, and a microcomputer including a memory. The memory stores a plurality of thresholds (internal resistance limit values) different from each other. Each of the plurality of thresholds is to be compared with an electrical characteristic value (internal resistance value) related to the capacitor unit for determining a deterioration state of the capacitor unit. The each of the plurality of thresholds is stored in association with an identification ID for identifying the electronically controlled system. The microcomputer acquires the identification ID from the electronically controlled system. And the microcomputer selects, from the plurality of thresholds, a threshold associated with the identification ID acquired. Then the microcomputer determines the deterioration state of the capacitor unit by using the electrical characteristic value and the threshold selected.

An electrical measurement contacting system for use with a component testing system operable to convey devices includes: a first module including a test contact module having a test contact adapted to electrically contact devices conveyed by the component testing system, and a second module including circuitry electrically coupled to the test contact module and operative to perform an electrical measurement on devices conveyed to the test contact. The circuitry is connected, within the second module, to a first conductive path and a second conductive path. The first conductive path and the second conductive path extend into the first module. The first conductive path and the second conductive path are electrically connected to each other and to the test contact module in the first module.

An electrical measurement contacting system for use with a component testing system operable to convey devices includes: a first module including a test contact module having a test contact adapted to electrically contact devices conveyed by the component testing system, and a second module including circuitry electrically coupled to the test contact module and operative to perform an electrical measurement on devices conveyed to the test contact. The circuitry is connected, within the second module, to a first conductive path and a second conductive path. The first conductive path and the second conductive path extend into the first module. The first conductive path and the second conductive path are electrically connected to each other and to the test contact module in the first module.

A capacitor testing device includes a carrier with a plurality of clamping holes which are configured to carry capacitors to be tested; a conveying means being configured to convey the carrier; an image collection assembly, including an upper image collection assembly disposed above the conveying means and a lower image collection assembly disposed below the conveying means, the upper image collection assembly and the lower image collection assembly being configured to perform defect testing on outer surfaces of the capacitors to be tested; and a performance testing means, including a performance testing circuit board and a lifting assembly being configured to drive the performance testing circuit board to ascend or descend, and the performance testing means being configured to test electrical performances of the capacitors to be tested.

A method for identifying outlier devices during testing, includes: establishing binning limits for a device being tested based on one or more rules generated from external test results data of tests involving similar devices; receiving test results data in real time for the device being tested while the device is on a device tester; applying the one or more rules to the test results data for the device in real time; determining in real time, based on results of applying the one or more rules to the test results data, whether the device is an outlier with respect to the binning limits; and in response to determining that the device is an outlier, binning the outlier device separately from tested devices having test results data falling within the binning limits.

A method for identifying outlier devices during testing, includes: establishing binning limits for a device being tested based on one or more rules generated from external test results data of tests involving similar devices; receiving test results data in real time for the device being tested while the device is on a device tester; applying the one or more rules to the test results data for the device in real time; determining in real time, based on results of applying the one or more rules to the test results data, whether the device is an outlier with respect to the binning limits; and in response to determining that the device is an outlier, binning the outlier device separately from tested devices having test results data falling within the binning limits.

A method of screening a lot of capacitors is provided. The method includes measuring a first leakage current of each individual capacitor in a first set of capacitors and calculating a first mean leakage current; removing each of the individual capacitors having a measured first leakage current equal to or above a first predetermined value, forming a second set of capacitors; subjecting the second set of capacitors to a burn in treatment; measuring a second leakage current for each of the individual capacitors in the second set and calculating a second mean leakage current; comparing the second leakage current for each of the individual capacitors to the first leakage current for each of the individual capacitors; and removing each of the individual capacitors having a second leakage current equal to or above a second predetermined value and/or having a second leakage current that does not change by a specified amount compared to the first leakage current for each of the individual capacitors.