An example system includes a receptacle to house a device under test (DUT); an antenna for exchanging signals with the DUT, where at least some of the signals are for use in performing radiated testing of the DUT; and a cap configured to mate to the receptacle to form a housing to enclose the DUT. The housing is for isolating the DUT at least one of physically or electromagnetically.

A method for inspecting light-emitting diodes (LEDs) including following steps is provided. A plurality of LEDs are provided. A charge distribution, an electrical field distribution, or a voltage distribution on the LEDs that are irradiated by an illumination beam at the same time are inspected by a sensing probe, so as to determine electro-optical characteristics of the LEDs. Besides, an inspection apparatus is also provided.

A method for inspecting light-emitting diodes (LEDs) including following steps is provided. A plurality of LEDs are provided. A charge distribution, an electrical field distribution, or a voltage distribution on the LEDs that are irradiated by an illumination beam at the same time are inspected by a sensing probe, so as to determine electro-optical characteristics of the LEDs. Besides, an inspection apparatus is also provided.

Systems and methods for multiple device diagnostics are disclosed herein. Exemplary embodiments provide for a multiple device diagnostic system having a plurality of electronic devices selected for diagnosis based on at least one selection criterion, a diagnosis engine in data communication with a failure database, and a diagnosis results database in data communication with the diagnosis engine. Embodiments further provide that the failure database contains grouped failure data from at least one previously diagnosed electronic device, that the wherein the processor diagnoses defects in one or more of the plurality of electronic devices using the grouped failure data, and that the processor outputs the diagnosis results to the diagnosis results database.

An apparatus, a method and a computer program product for defect detection in work pieces is disclosed. At least one light source is provided and the light source generates an illumination light of a wavelength range at which the work piece is transparent. A camera images the light from at least one face of the work piece on a detector of the camera by means of a lens. A stage is used for moving the work piece and for imaging the at least one face of the semiconductor device completely with the camera. The computer program product is disposed on a non-transitory, computer readable medium for defect detection in work pieces. A computer is used to execute the various process steps and to control the various means of the apparatus.

An apparatus, a method and a computer program product for defect detection in work pieces is disclosed. At least one light source is provided and the light source generates an illumination light of a wavelength range at which the work piece is transparent. A camera images the light from at least one face of the work piece on a detector of the camera by means of a lens. A stage is used for moving the work piece and for imaging the at least one face of the semiconductor device completely with the camera. The computer program product is disposed on a non-transitory, computer readable medium for defect detection in work pieces. A computer is used to execute the various process steps and to control the various means of the apparatus.

An apparatus for testing vaporizers of electronic cigarettes is disclosed. Each vaporizer comprises a heating element, and electric terminals for electrically powering the heating element. The testing apparatus comprises a holding construction part with multiple movable vaporizer holding units. A contact construction part is provided with multiple electric contact members each associated with a respective holding unit, and electrically contacting at least one electric terminal of a vaporizer in the associated holding unit. A supply construction part conducts electric power to each contact member. A measuring part measures at least one electric quantity representative of an electric resistance and/or inductance of the heating element, compares the measured quantity with a pre determined range and, if the measured quantity is outside the range, outputs a rejection signal.

An apparatus for testing vaporizers of electronic cigarettes is disclosed. Each vaporizer comprises a heating element, and electric terminals for electrically powering the heating element. The testing apparatus comprises a holding construction part with multiple movable vaporizer holding units. A contact construction part is provided with multiple electric contact members each associated with a respective holding unit, and electrically contacting at least one electric terminal of a vaporizer in the associated holding unit. A supply construction part conducts electric power to each contact member. A measuring part measures at least one electric quantity representative of an electric resistance and/or inductance of the heating element, compares the measured quantity with a pre determined range and, if the measured quantity is outside the range, outputs a rejection signal.

An apparatus, a method and a computer program product for defect detection in work pieces is disclosed. At least one light source is provided and the light source generates an illumination light of a wavelength range at which the work piece is transparent. A camera images the light from at least one face of the work piece on a detector of the camera by means of a lens. A stage is used for moving the work piece and for imaging the at least one face of the semiconductor device completely with the camera. The computer program product is disposed on a non-transitory, computer readable medium for defect detection in work pieces. A computer is used to execute the various process steps and to control the various means of the apparatus.

An apparatus, a method and a computer program product for defect detection in work pieces is disclosed. At least one light source is provided and the light source generates an illumination light of a wavelength range at which the work piece is transparent. A camera images the light from at least one face of the work piece on a detector of the camera by means of a lens. A stage is used for moving the work piece and for imaging the at least one face of the semiconductor device completely with the camera. The computer program product is disposed on a non-transitory, computer readable medium for defect detection in work pieces. A computer is used to execute the various process steps and to control the various means of the apparatus.