An assembly for interfacing an existing harness connector of an installed wiring harness to a test module. The assembly comprises: a harness-specific connector which is connectable to the existing harness connector, a test box connector module connected to the harness-specific connector, for connecting to a test module, and a unique identifier which is readable on the assembly and which is unique to the test box connector module; wherein the unique identifier is used to identify the test box connector module and to determine a configuration that corresponds to the identifier of the assembly, and to determine the correspondence between contacts of the test module to contacts of the existing harness connector.

An assembly for interfacing an existing harness connector of an installed wiring harness to a test module. The assembly comprises: a harness-specific connector which is connectable to the existing harness connector, a test box connector module connected to the harness-specific connector, for connecting to a test module, and a unique identifier which is readable on the assembly and which is unique to the test box connector module; wherein the unique identifier is used to identify the test box connector module and to determine a configuration that corresponds to the identifier of the assembly, and to determine the correspondence between contacts of the test module to contacts of the existing harness connector.

A control module for a lighting fixture may include an input circuit (e.g., a wireless communication circuit) that may be susceptible to noise generating by a noise-generating source (e.g., a lighting control device in the lighting fixture). The control circuit may execute a self-test procedure to determine if the magnitude of the noise is acceptable or unacceptable for normal operation of the control module. During the self-test procedure, the control circuit may measure a noise level at a connection of the input circuit and determine if the noise level causes the self-test procedure to fail. The control circuit may control the lighting load to multiple intensities, measure noise levels of the output signal at each intensity, and process the noise levels to determine if the test has passed or failed. The control circuit may illuminate a visual indicator to provide an indication that the self-test procedure has failed.

A control module for a lighting fixture may include an input circuit (e.g., a wireless communication circuit) that may be susceptible to noise generating by a noise-generating source (e.g., a lighting control device in the lighting fixture). The control circuit may execute a self-test procedure to determine if the magnitude of the noise is acceptable or unacceptable for normal operation of the control module. During the self-test procedure, the control circuit may measure a noise level at a connection of the input circuit and determine if the noise level causes the self-test procedure to fail. The control circuit may control the lighting load to multiple intensities, measure noise levels of the output signal at each intensity, and process the noise levels to determine if the test has passed or failed. The control circuit may illuminate a visual indicator to provide an indication that the self-test procedure has failed.

A testing device may include a stage associated with holding an emitter wafer during testing of an emitter. The stage may be arranged such that light emitted by the emitter passes through the stage. The testing device may include a heat sink arranged such that the light emitted by the emitter during the testing is emitted in a direction away from the heat sink, and such that a first surface of the heat sink is near a surface of the emitter wafer during the testing but does not contact the surface of the emitter wafer. The testing device may include a probe card, associated with performing the testing of the emitter, that is arranged over a second surface of the heat sink such that, during the testing of the emitter, a probe of the probe card contacts a probe pad for the emitter through an opening in the heat sink.

A testing device may include a stage associated with holding an emitter wafer during testing of an emitter. The stage may be arranged such that light emitted by the emitter passes through the stage. The testing device may include a heat sink arranged such that the light emitted by the emitter during the testing is emitted in a direction away from the heat sink, and such that a first surface of the heat sink is near a surface of the emitter wafer during the testing but does not contact the surface of the emitter wafer. The testing device may include a probe card, associated with performing the testing of the emitter, that is arranged over a second surface of the heat sink such that, during the testing of the emitter, a probe of the probe card contacts a probe pad for the emitter through an opening in the heat sink.

The present disclosure relates generally to measuring and testing circuits of towed vehicles. Testing circuits of towed vehicles for proper function is required for safe use of the vehicle. Instruments that currently exist are expensive, the instruments are large in size, use outdated technology to perform the test and do not provide a means to reliably and effectively test braking systems.

A light emitting device includes: a base comprising a first wiring, a second wiring, and a third wiring; a first semiconductor laser element electrically connected to the first wiring and the second wiring, at an upper surface side of the base; a second semiconductor laser element electrically connected to the second wiring and the third wiring, at the upper surface side of the base; and a base cap fixed to the base such that the first semiconductor laser element and the second semiconductor laser element are enclosed in a space defined by the base and the base cap. The first semiconductor laser element and the second semiconductor laser element are connected in series. A portion of each of the first, second, and third wirings is exposed at the upper surface of the base at locations outside of the space defined by the base and the base cap.

A light emitting device includes: a base comprising a first wiring, a second wiring, and a third wiring; a first semiconductor laser element electrically connected to the first wiring and the second wiring, at an upper surface side of the base; a second semiconductor laser element electrically connected to the second wiring and the third wiring, at the upper surface side of the base; and a base cap fixed to the base such that the first semiconductor laser element and the second semiconductor laser element are enclosed in a space defined by the base and the base cap. The first semiconductor laser element and the second semiconductor laser element are connected in series. A portion of each of the first, second, and third wirings is exposed at the upper surface of the base at locations outside of the space defined by the base and the base cap.

One embodiment of the present disclose describes systems and methods responsible for reducing errors in a battery model used in the operation of a battery control system. The battery control system may operate based on a modeled response of the battery derived from the battery model. If the battery model is not calibrated/validated, errors in the battery model may propagate through the modeled response of the battery to the operation of the battery control system. A calibration current pulse may result in a different measured response of the battery than the modeled response of the battery to the same calibration current pulse. A validation technique, which uses a difference between the modeled response and the measured response of the battery to the calibration current pulse as a method to calibrate the battery model, may protect the battery control system from the contribution of errors from an uncalibrated battery model.